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| Brand | ASML |
|---|---|
| Origin | Netherlands |
| Model | TWINSCAN NXT:1980Di |
| Numerical Aperture (NA) | 1.35 |
| Minimum Achievable Resolution | ≤38 nm |
| Throughput | 275 wafers/hour (300 mm) |
| Process Node Support | 14 nm to 45 nm (with multi-patterning extending capability to ~7 nm) |
| Age | 3 years operational use |
| Condition | Fully refurbished and factory-recertified |
| Brand | TA Instruments |
|---|---|
| Origin | USA |
| Model | DSC-25 |
| Temperature Range | –180 °C to 725 °C |
| Baseline Flatness (–50 °C to 300 °C) | ≤100 µW |
| Baseline Repeatability (–50 °C to 300 °C) | <40 µW |
| Temperature Accuracy | ±0.1 °C |
| Temperature Precision | ±0.01 °C |
| Enthalpy Accuracy | ±0.1% |
| Operational Age | 2 years |
| Condition | Fully Functional |
| Brand | Hitachi High-Technologies |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Category | Imported Instrument |
| Model | HITACHI SU-3500 |
| Price | USD 62,500 (FOB Yokohama) |
| Operational Age | 5 years |
| Secondary Electron Resolution | 3 nm @ 30 kV, 7.0 nm @ 3 kV |
| Backscattered Electron Resolution | 4.0 nm @ 30 kV, 10.0 nm @ 5 kV |
| Magnification Range | 5× to 300,000× (typical working range: 20×–50,000× for standard bulk samples) |
| Accelerating Voltage | 0.3–30 kV |
| Detector Configuration | In-lens SE detector, Everhart-Thornley SE detector, solid-state BSE detector |
| Brand | Skalar |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | SAN++ |
| Price | USD 70,000 (FOB Rotterdam) |
| Operational Age | 6 years |
| Throughput | Up to 800 samples/day |
| Simultaneous Parameters | Up to 16 per sample |
| Compliance | ASTM, ISO, EPA, CEN, DIN, ASBC, EBC, CORESTA, USP, FDA 21 CFR Part 11 |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | GEMINI SUPRA 40 VP |
| Resolution | 1.3 nm @ 15 kV, 2.1 nm @ 1 kV, 5.0 nm @ 0.1 kV (Standard Mode) |
| Magnification Range | 12× – 900,000× |
| Accelerating Voltage | 0.02 – 30 kV |
| Beam Current | 4 pA – 10 nA (optional up to 20 nA) |
| Electron Source | Thermal Field Emission Gun (TFEG) |
| Detector Configuration | In-lens SE, ETSE, VPSE, STEM-in-SEM, and integrated Energy Dispersive X-ray Spectrometer (EDS) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT200 |
| Instrument Age | 2 years |
| Configuration | Standard SEM + EDS (Energy Dispersive X-ray Spectroscopy) |
| Vacuum Mode | High Vacuum & Low Vacuum (LA) compatible |
| Sample Stage | Motorized Tilt/Rotation/XYZ |
| CCD Navigation Camera | 5 MP, 6 × 4.5 cm FOV, Digital Zoom up to ×20 |
| Software Platform | SMILE VIEW™ Lab |
| Compliance | Fully serviceable per JEOL OEM maintenance protocols |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-7610FPLUS |
| Year of Manufacture | 2017 |
| Operational Age | 5 years |
| Vacuum System | Turbo-molecular + Ion Pump |
| Max Magnification | 1,000,000× |
| Resolution (SE) | 0.8 nm @ 15 kV, 1.0 nm @ 1 kV |
| Acceleration Voltage | 100 V – 30 kV |
| Electron Source | Schottky Thermal Field-Emission Gun |
| Beam Current | Up to 200 nA |
| Working Distance | 8 mm |
| Stage | 5-axis Motorized, ±5° to +70° tilt, 360° rotation |
| EDS Detector Area | ≥20 mm², Be–Am detection range, Mn-Kα resolution ≤127 eV |
| EBSD Compatibility | Yes |
| Compliance | ASTM E1558, ISO 16700, IEC 61000-4-5 (EMC), GLP-ready data logging |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | SUPRA 1540 |
| Operational Age | 10 Years |
| Resolution | 2 nm @ 15 kV, 3 nm @ 1 kV |
| Magnification Range | 12× to 2,000,000× |
| Accelerating Voltage | 20 V – 30 kV (continuously adjustable) |
| Probe Current | 5 pA – 20 nA (optional extended range: 12 pA – 100 nA) |
| Chamber Dimensions | Ø330 mm × 270 mm (H) |
| Stage Motion | 5-axis motorized eucentric stage (X = 130 mm, Y = 130 mm, Z = 50 mm, Tilt = –3° to +70°, Rotation = 360° continuous) |
| Control System | SmartSEM software suite on Windows 7 platform, compatible with mouse, keyboard, and dedicated hardware control panel |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Configuration | SUPRA 40VP + Oxford X-MaxN EDS + Symmetry EBSD |
| Operating Hours | ~6 years |
| Resolution | 1.0 nm @ 20 kV (SE), 2.0 nm @ 30 kV (VP mode) |
| Acceleration Voltage | 0.1–30 kV |
| Vacuum Mode Range | 2–133 Pa (variable pressure, 1 Pa step) |
| Probe Current | 4 pA–10 nA (up to 20 nA optional) |
| Chamber Dimensions | Ø330 mm × H270 mm |
| Stage Motion | 5-axis motorized (X/Y ±130 mm, Z 0–50 mm, Tilt −3° to +70°) |
| Magnification | 12×–900,000× |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT100 |
| Vacuum Modes | High Vacuum & Low Vacuum (10–300 Pa) |
| Resolution | 3 nm @ 30 kV (HV), 4 nm @ 30 kV (LV) |
| Acceleration Voltage | 0.5–30 kV (optional extension to 30 kV) |
| Magnification | ×5 to ×300,000 |
| Stage Travel | X 80 mm, Y 40 mm, Z 5–48 mm, Tilt −10° to +90°, Rotation 360° |
| Max Sample Diameter | 150 mm |
| EDS Functions | Point analysis, elemental mapping, line scan, real-time filtering |
| Detector Options | Dry SD (10/30/60/100 mm² active area) |
| Software | InTouchScope™ GUI with integrated SEM/EDS workflow |
| Power Requirement | 100 V AC, no cooling water required |
| Footprint | ~30% smaller than prior JEOL benchtop SEMs |
| Operational Age | 2 years |
| Compliance | Designed per JEOL’s internal quality system aligned with ISO 9001 |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-7001F |
| Vacuum Mode | High Vacuum / Low Vacuum (up to 50 Pa) |
| Resolution | 3.0 nm @ 30 kV (Backscattered Electron Imaging) |
| Sample Chamber Diameter | Up to 200 mm |
| Stage | Motorized 5-axis (X, Y, Z, Tilt, Rotation) |
| Detector Compatibility | EDS, WDS, EBSD, CL, SE, BEI |
| Operating System | Windows XP (original factory configuration) |
| Gun Chamber Pressure | ≤5 × 10⁻⁷ Pa |
| Recommended Gas for LV Mode | Dry Nitrogen |
| Instrument Age | ~10 years |
| Condition | Refurbished & Functionally Verified |
| Brand | Hitachi High-Technologies |
|---|---|
| Origin | Japan |
| Model | S-3400N |
| Operating Age | ~10 years |
| Vacuum System | Turbo-molecular pump |
| SE Resolution | 3.0 nm @ 30 kV (high vacuum), 10 nm @ 3 kV (high vacuum) |
| BSE Resolution | 4.0 nm @ 30 kV (low vacuum) |
| Accelerating Voltage | 0.3–30 kV |
| Magnification | ×5 to ×300,000 |
| Max Sample Diameter | 200 mm |
| Stage Types | Manual (Type I) and Motorized 5-Axis (Type II) |
| Stage Travel (Type II) | X 0–100 mm, Y 0–50 mm, Z 5–65 mm, R 360°, T –20° to +90° |
| Max Sample Height | 80 mm (WD = 10 mm) |
| Detector Configuration | High-sensitivity semiconductor BSE detector (5-segment), Everhart-Thornley SE detector |
| Analytical Compatibility | Simultaneous EDX, WDX, and EBSD integration supported |
| Beam Control | Auto filament saturation, auto gun alignment, auto stigmation, auto focus, auto brightness/contrast, manual & automatic beam current adjustment, fixed-ratio & manual & auto 4-quadrant biasing |
| Aperture | Movable 4-position objective aperture |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Quanta 250 |
| Instrument Age | 5 Years |
| Vacuum Modes | High Vacuum, Low Vacuum, Environmental SEM (ESEM) Mode |
| Max Chamber Pressure | 2600 Pa |
| Accelerating Voltage Range | 200 V – 30 kV (continuously adjustable) |
| Stage Travel (Quanta 250) | X = Y = 50 mm |
| SE Resolution | 3.0 nm @ 30 kV (HV), 8 nm @ 3 kV (HV), 7 nm @ 3 kV (HV deceleration mode, optional), 3.0 nm @ 30 kV (LV), 10 nm @ 3 kV (LV), 3.0 nm @ 30 kV (ESEM) |
| BSE Resolution | 4.0 nm @ 30 kV |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Xplore 30 |
| Detector Type | Tilting (Side-Entry) |
| Energy Resolution | 129 eV at Mn Kα |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 1,000,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 300 mm² |
| Window Type | Beryllium Window |
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