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| Brand | ESI |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Model | CS995 |
| Measurement Principle | Non-Dispersive Infrared (NDIR) Absorption |
| Heating System | 20 MHz High-Frequency Induction Furnace |
| Power Output | 2200 W |
| Carbon Range | 0.00006–6.0000 wt% (extendable to 99.999%) |
| Sulfur Range | 0.00006–0.5000 wt% (extendable to 99.999%) |
| Sensitivity | 0.001 ppm for both C and S |
| Precision | RSD < 0.5% |
| Compliant with GB/T 20123–2006 and ISO 15350 | 2000 |
| Analysis Time | 20–100 s (typical: 35 s) |
| Sample Mass (steel standard) | 0.5 g nominal |
| Dust Filter Pore Size | 0.4 µm metallic sintered filter |
| Optical Path | Gold-plated CO₂/SO₂ absorption cells |
| IR Source | Platinum-based thermal emitter (800 °C operating temperature) |
| Detection Wavelengths | CO₂ at 4.26 µm, SO₂ at 7.4 µm |
| Modulation Frequency | 64 Hz |
| Data Acquisition | 24-bit ADS1224 ADC, 20 Hz real-time sampling |
| Communication | USB 2.0 host interface + Agilent 1521/2521 optical fiber link between furnace and detector |
| Software Platform | Windows-based Delphi application with ACCESS database backend |
| Brand | ESI |
|---|---|
| Model | EDX9000A |
| Element Range | Na (11) – U (92) |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99 wt% |
| Excitation Source | 50 W Rh-target X-ray tube, 0–50 kV |
| Detector | AmpTek high-resolution silicon drift detector (SDD) |
| DPP Analyzer | 4096-channel digital pulse processor |
| Sample Chamber Dimensions | 460 × 310 × 95 mm |
| Vacuum Chamber | Φ150 mm × 75 mm |
| Instrument Dimensions | 560 × 380 × 410 mm |
| Weight | 45 kg |
| Operating Environment | −10 °C to 35 °C |
| Power Supply | 220 V AC, 50/60 Hz |
| Brand | ESI |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | EDX9000B PLUS |
| Configuration | Benchtop/Floor-standing |
| Industry-Specific Application | Non-Ferrous Metals |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability (RSD) | ≤0.05% |
| Detector | Peltier-Cooled Fast Silicon Drift Detector (FSDD) |
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