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| Brand | AcuiTik |
|---|---|
| Origin | China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | NS-Touch |
| Wavelength Range | 190–1700 nm |
| Thickness Measurement Range | 0.02 µm – 250 µm |
| Thickness Accuracy | ±0.01 µm or ±0.2% (whichever is greater) |
| Brand | AcuiTik |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | NS-OEM |
| Wavelength Range | 190–1100 nm |
| Thickness Measurement Range | 1 nm – 1 mm |
| Accuracy | ±2 nm or ±0.2% |
| Static Repeatability | ±0.02 nm |
| Spot Size | 1.5 mm |
| Measurement Speed | <1 s per acquisition |
| Light Source | Tungsten-Halogen Lamp (with optional Deuterium lamp) |
| Probe-to-Host Interface | Fiber Optic (standard length 1.3 m, up to 20 m configurable) |
| Probe Dimensions | Ø19 mm × 86 mm |
| Power Supply | 90–264 VAC, 47–63 Hz |
| Brand | AcuiTik |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Product Line | NS-Micro Series |
| Wavelength Range | 190–1000 nm |
| Thickness Measurement Range | 1–100 µm |
| Measurement Accuracy | ±1 nm or ±0.2% (whichever is greater) |
| Measurement Precision | 0.02 nm (1σ, 100 measurements on 500 nm SiO₂ reference) |
| Stability | 0.05 nm (2σ mean drift over 20 operational days) |
| Measurement Speed | <1 s per static point |
| Objective Options | 5×, 10×, 15×, 20×, 50×, 100× |
| Spot Size Range | 1–100 µm |
| Sample Diameter Capacity | 1 mm to ≥300 mm |
| Light Source | Deuterium + Tungsten-Halogen Lamp |
| Brand | AcuiTik |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | NS-30 |
| Wavelength Range | 190–1700 nm (configurable UV/VIS/NIR variants) |
| Thickness Measurement Range | 1 nm – 250 µm |
| Accuracy | ±1 nm or ±0.2% (UV variant) |
| Precision | 0.02 nm (UV/VIS), 0.1 nm (NIR) |
| Stability | ≤0.05 nm (UV/VIS), ≤0.12 nm (NIR) |
| Spot Size | 1.5 mm |
| Single-Measurement Time | <1 s |
| Sample Diameter Capacity | 1 mm – 300+ mm |
| Automated Stage Travel | Up to 450 mm × 450 mm |
| Stress & Bow Measurement | Yes |
| Brand | AcuiTik |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | NS-20 Pro |
| Price | Upon Request |
| Wavelength Range | 400–700 nm (non-UV, non-actinic) |
| Measurement Range | 15 nm – 1.5 mm |
| Measurement Precision | < 0.02 nm (static repeatability) |
| Spot Size | Standard 0.2 mm (optional micro-spot configuration available) |
| Configuration Options | Benchtop, Portable, and In-Line Integration Capable |
| Brand | AcuiTik |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | NS-20 |
| Price Range | USD 7,000 – 35,000 |
| Wavelength Range | 190–1700 nm (configurable UV/VIS/NIR variants) |
| Thickness Measurement Range | 1 nm – 250 µm (dependent on optical configuration) |
| Accuracy | ±1 nm or ±0.2% (UV variant) |
| Precision (repeatability) | 0.02 nm (UV/VIS), 0.1 nm (NIR) |
| Stability (8-hour drift) | ≤0.05 nm (UV/VIS), ≤0.12 nm (NIR) |
| Spot Size | 1.5 mm diameter |
| Measurement Speed | <1 s per single-point acquisition |
| Light Source | Tungsten-halogen + Deuterium lamp (UV), Tungsten-halogen only (VIS/NIR) |
| Sample Diameter Compatibility | 1 mm – 300 mm (custom larger stages available) |
| Brand | AcuiTik |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Domestic (China) |
| Model | NS-Vista |
| Wavelength Range | 190–1700 nm |
| Thickness Measurement Range | 1 nm – 250 µm |
| Accuracy | ±1 nm or ±0.2% (UV configuration) |
| Precision | 0.02 nm (UV/Vis), 0.1 nm (NIR) |
| Stability | 0.05 nm (UV/Vis), 0.12 nm (NIR) |
| Spot Size | Adjustable from 0.2 mm to 1.5 mm |
| Measurement Speed | <1 s per acquisition |
| Light Source | Tungsten-halogen + Deuterium lamp (UV), Tungsten-halogen (Vis/NIR) |
| Sample Diameter Compatibility | 1 mm – 300 mm (or larger) |
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