Thickness Gauge
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| Brand | A&D |
|---|---|
| Origin | Japan |
| Model | AD-3253 / AD-3253B |
| Measurement Principle | Ultrasonic Pulse-Echo |
| Thickness Range (AD-3253) | 2.0–200.0 mm |
| Thickness Range (AD-3253B) | 0.8–100.0 mm |
| Accuracy | ±0.1 mm ±1.0% (AD-3253, 2–100 mm) / ±0.1 mm ±0.5% (AD-3253B, 0.8–40 mm) |
| Resolution | 0.1 mm |
| Display | LCD |
| Units | mm / inch |
| Sound Velocity Adjustment | Yes |
| Sampling Rate | 4 Hz |
| Operating Temperature | 0°C to 50°C |
| Power | 2 × AA alkaline batteries |
| Battery Life | ~30 hours |
| Weight | 180 g |
| Dimensions | 68 × 120 × 27 mm |
| Brand | AcuiTik |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Product Line | NS-Micro Series |
| Wavelength Range | 190–1000 nm |
| Thickness Measurement Range | 1–100 µm |
| Measurement Accuracy | ±1 nm or ±0.2% (whichever is greater) |
| Measurement Precision | 0.02 nm (1σ, 100 measurements on 500 nm SiO₂ reference) |
| Stability | 0.05 nm (2σ mean drift over 20 operational days) |
| Measurement Speed | <1 s per static point |
| Objective Options | 5×, 10×, 15×, 20×, 50×, 100× |
| Spot Size Range | 1–100 µm |
| Sample Diameter Capacity | 1 mm to ≥300 mm |
| Light Source | Deuterium + Tungsten-Halogen Lamp |
| Brand | AcuiTik |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | NS-20 |
| Price Range | USD 7,000 – 35,000 |
| Wavelength Range | 190–1700 nm (configurable UV/VIS/NIR variants) |
| Thickness Measurement Range | 1 nm – 250 µm (dependent on optical configuration) |
| Accuracy | ±1 nm or ±0.2% (UV variant) |
| Precision (repeatability) | 0.02 nm (UV/VIS), 0.1 nm (NIR) |
| Stability (8-hour drift) | ≤0.05 nm (UV/VIS), ≤0.12 nm (NIR) |
| Spot Size | 1.5 mm diameter |
| Measurement Speed | <1 s per single-point acquisition |
| Light Source | Tungsten-halogen + Deuterium lamp (UV), Tungsten-halogen only (VIS/NIR) |
| Sample Diameter Compatibility | 1 mm – 300 mm (custom larger stages available) |
| Brand | AcuiTik |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | NS-20 Pro |
| Price | Upon Request |
| Wavelength Range | 400–700 nm (non-UV, non-actinic) |
| Measurement Range | 15 nm – 1.5 mm |
| Measurement Precision | < 0.02 nm (static repeatability) |
| Spot Size | Standard 0.2 mm (optional micro-spot configuration available) |
| Configuration Options | Benchtop, Portable, and In-Line Integration Capable |
| Brand | AcuiTik |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | NS-30 |
| Wavelength Range | 190–1700 nm (configurable UV/VIS/NIR variants) |
| Thickness Measurement Range | 1 nm – 250 µm |
| Accuracy | ±1 nm or ±0.2% (UV variant) |
| Precision | 0.02 nm (UV/VIS), 0.1 nm (NIR) |
| Stability | ≤0.05 nm (UV/VIS), ≤0.12 nm (NIR) |
| Spot Size | 1.5 mm |
| Single-Measurement Time | <1 s |
| Sample Diameter Capacity | 1 mm – 300+ mm |
| Automated Stage Travel | Up to 450 mm × 450 mm |
| Stress & Bow Measurement | Yes |
| Brand | AcuiTik |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | NS-OEM |
| Wavelength Range | 190–1100 nm |
| Thickness Measurement Range | 1 nm – 1 mm |
| Accuracy | ±2 nm or ±0.2% |
| Static Repeatability | ±0.02 nm |
| Spot Size | 1.5 mm |
| Measurement Speed | <1 s per acquisition |
| Light Source | Tungsten-Halogen Lamp (with optional Deuterium lamp) |
| Probe-to-Host Interface | Fiber Optic (standard length 1.3 m, up to 20 m configurable) |
| Probe Dimensions | Ø19 mm × 86 mm |
| Power Supply | 90–264 VAC, 47–63 Hz |
| Brand | AcuiTik |
|---|---|
| Origin | China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | NS-Touch |
| Wavelength Range | 190–1700 nm |
| Thickness Measurement Range | 0.02 µm – 250 µm |
| Thickness Accuracy | ±0.01 µm or ±0.2% (whichever is greater) |
| Brand | AcuiTik |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Domestic (China) |
| Model | NS-Vista |
| Wavelength Range | 190–1700 nm |
| Thickness Measurement Range | 1 nm – 250 µm |
| Accuracy | ±1 nm or ±0.2% (UV configuration) |
| Precision | 0.02 nm (UV/Vis), 0.1 nm (NIR) |
| Stability | 0.05 nm (UV/Vis), 0.12 nm (NIR) |
| Spot Size | Adjustable from 0.2 mm to 1.5 mm |
| Measurement Speed | <1 s per acquisition |
| Light Source | Tungsten-halogen + Deuterium lamp (UV), Tungsten-halogen (Vis/NIR) |
| Sample Diameter Compatibility | 1 mm – 300 mm (or larger) |
| Brand | Aist ST |
|---|---|
| Origin | Shanghai, China |
| Model | DM6100 |
| Measurement Principle | X-ray transmission attenuation (dual-energy correction capable) |
| Measuring Range | 0.1–4.0 mm (steel), 0.01–10.0 mm (aluminum) |
| Accuracy | ±0.2% |
| Resolution | 0.001 mm |
| Response Time | 100 ms (63% to 5% thickness step) |
| Sampling Interval | 200/400/600/800 ms selectable |
| Repeatability | 0.2% |
| Long-term Drift | <±0.24% per 8 h |
| Preheat Time | 1 h |
| Auto-calibration Time | ≤20 min |
| Operating Temp. | 0–40 °C |
| Humidity | ≤95% RH at 30 °C |
| Power Supply | 220 V ±20 V, 50 Hz |
| Power Consumption | ≤250 W |
| Dimensions (Operator Console) | 470 × 365 × 160 mm, 15 kg |
| C-frame Dimensions | 673 × 579 × 189 mm, 35 kg |
| Radiation Safety | Fully shielded |
| Regulatory Certification | CMC (Shanghai) No. 沪制02280027 |
| Brand | Applied Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | TranSpec Lite MC-UVNIR-H |
| Wavelength Range | 190–1020 nm |
| Measurement Range | 0.8–100 µm |
| Accuracy | ±0.005 µm |
| Repeatability | ±0.002 µm (per standard WEG test) |
| Brand | Applytest |
|---|---|
| Model | NMM-1020 |
| Measurement Principle | Eddy Current |
| Power Supply | Rechargeable Lithium Battery (20 h runtime) |
| Minimum Sample Size | 150 × 150 mm (flat) |
| Active Measurement Area | Ø40 mm |
| Measurement Mode | Contact or Non-Contact (non-contact requires optional probe holder) |
| Supported Substrates | Plastic, Glass, Polymer Films, Semiconductor Wafers |
| Bluetooth Data Transfer | Optional |
| Compliance | ISO/IEC 17025-compatible operation environment, supports GLP audit trails |
| Brand | Applytest |
|---|---|
| Model | NMM-1020 |
| Measurement Principle | Eddy Current |
| Power Supply | Rechargeable Lithium Battery (20 h runtime) |
| Minimum Sample Size | 150 × 150 mm (flat) |
| Active Measurement Area | Ø40 mm |
| Surface Compatibility | Flat and Curved Substrates (custom calibration profiles supported) |
| Measurement Modes | Contact and Non-Contact (non-contact requires optional probe holder) |
| Connectivity | Bluetooth (optional) |
| Display | Integrated Touchscreen Interface |
| Compliance | Designed for ISO 2360, ASTM B244, and IEC 61000-4-3 compliant operation |
| Software | On-device measurement management with export to CSV/Excel |
| Key Measurables | Al (5–540 nm), In (24–2700 nm), Cr (24–2600 nm), Ti (102–11080 nm), Cu (3–340 nm), Ag (3–310 nm), Sn (21–2300 nm), Ni (12–1280 nm) |
| Brand | Astroda |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | CB11 |
| Quotation | Upon Request |
| Throat Depth | 530 mm |
| Thickness Measurement Range | 0–25 mm |
| Stroke | 25 mm |
| Tabletop Dimensions | 900 × 870 mm |
| Accuracy | ±0.003 mm |
| Display | LCD (mm/inch switchable) |
| Zeroing Function | Arbitrary Position |
| Tabletop Material | Phenolic Resin (Electrical Insulating Board) |
| Power Supply | 220 V AC, 50 Hz / 100 W |
| Net Weight | 120 kg |
| Brand | Atometrics |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | AF Mapping Series X010 |
| Pricing | Upon Request |
| Brand | Atometrics |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | AF T010 |
| Pricing | Upon Request |
| Brand | Atometrics |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Regional Classification | Domestic (China) |
| Model | AF-3000 Series T001 |
| Pricing | Upon Request |
| Brand | Atometrics |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Domestic (China) |
| Model | AF-3000 Series T010 |
| Pricing | Available Upon Request |
| Brand | BAQ |
|---|---|
| Origin | Germany |
| Model | KaloMAS II S |
| Ball Diameter | 15–40 mm |
| Planar Sample Clamp Range | 50 mm (customizable) |
| Cylindrical Sample Clamp Range | 3–30 mm (customizable) |
| Cross-Stage Travel | 25 × 25 mm |
| Display | 480 × 640 px color LCD |
| Rotational Speed | 50–1000 rpm |
| Grinding Time | Programmable |
| Dimensions (W×D×H) | 300 × 295 × 270 mm |
| Power Supply | 85–264 VAC, 47–63 Hz |
| Weight | ~8 kg |
| Measurable Coating Thickness | 0.3–50 µm |
| Ball Cap Diameter | 0.1–3 mm |
| Thickness Measurement Accuracy | 1–5% (surface roughness dependent) |
| Brand | BAQ |
|---|---|
| Origin | Germany |
| Model | kaloMAX II |
| Measuring Principle | Ball cratering (geometric depth determination via spherical indentation) |
| Thickness Range | 0.3 – 30 µm |
| Ball Diameter | 15 – 30 mm |
| Planar Sample Clamp Range | 50 mm |
| Circular Sample Clamp Range | 3 – 30 mm (customizable) |
| Cross-Stage Travel | 25 × 25 mm |
| Tilt Angle | 60° |
| Drive Shaft Speed | 100–1200 rpm (12 preset values) |
| Cycle Time | 5–180 s (20 preset values) |
| Display | 4-digit speed, 4-digit timer, 1-digit program ID |
| Input Voltage | 85–264 VAC |
| Input Frequency | 47–63 Hz |
| Dimensions (W×D×H) | 300 × 295 × 235 mm |
| Weight | ~8 kg |
| Accuracy | ±1–5% (surface roughness dependent) |
| Optional | Removable clamp base, graded abrasive slurries, high-resolution microscope camera system, kaloSOFT evaluation software, integrated automation-ready configuration |
| Brand | Betacontrol |
|---|---|
| Origin | Germany |
| Model | Indicon One |
| Sensor Technology Options | Beta-ray transmission/backscatter, Infrared, Ultrasonic, Laser, X-ray, Microwave, White-light Interferometry |
| Application Scope | Polymer films, metal foils, nonwovens, paperboard, coated substrates, rubber layers, foam materials, laminates, and electroplated surfaces |
| Compliance Context | Designed for integration into industrial automation systems compliant with ISO 9001 process control requirements and suitable for GLP/GMP-aligned production environments |
| Pricing | Available upon technical consultation |
| Brand | Biuged |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | BGD 545 |
| Price | Upon Request |
| Measurement Principle | Dual-mode electromagnetic (magnetic induction for Fe substrates |
| Measurement Range | 0.0–5000 µm |
| Resolution | 0.1 µm (<100 µm), 1 µm (100–999 µm), 10 µm (>1000 µm) |
| Accuracy | ≤ ±(3% reading + 2 µm) |
| Minimum Substrate Thickness | 0.2 mm (Fe), 0.05 mm (NFe) |
| Minimum Curvature Radius | Convex 5 mm / Concave 25 mm |
| Minimum Measuring Area | 6 mm² |
| Probe Type | Integrated digital probe with sapphire tip |
| Display | 128 × 48 dot-matrix LCD |
| Power Supply | 2 × 1.5 V AAA alkaline batteries |
| Dimensions & Weight | 101 × 62 × 28 mm / 79 g (including batteries) |
| Units | µm and mil selectable |
| Measurement Modes | Fe, NFe, Auto (Fe/NFe) |
| Compliance | GB/T 4956–2003, GB/T 4957–2003, DIN EN ISO 2808, JJG 818–2005 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | Domestic (China) |
| Model | INSIGHT |
| Price | Upon Request |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | W1 |
| Measurement Volume | 140 × 100 × 100 mm |
| Optical Configuration | White LED Illumination, 1024 × 1024 Imaging Sensor, Standard 10× Interference Objective (Optional: 2.5×, 5×, 20×, 50×, 100×), Standard 0.5× Optical Zoom (Optional: 0.375×, 0.75×, 1×), 3-Position Manual Objective Turret (Optional: 5-Position Motorized), XY Stage Travel: 140 × 100 mm (320 × 200 mm Platform), Z-Scan Range: 10 mm, Max. Sample Load: 10 kg, Host Dimensions: 700 × 606 × 920 mm |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Model | W293 |
| Measurement Area | 140 × 100 mm |
| Type | Non-contact Optical 3D Surface Metrology System |
| Compliance | ISO 25178-2, ISO 25178-601, VDI/VDE 2634 Part 3 |
| Software Certification | FDA 21 CFR Part 11–compliant audit trail & electronic signature support (optional module) |
| Vertical Resolution | Sub-nanometer (≤0.1 nm typical) |
| Lateral Resolution | ≤0.5 µm (dependent on objective lens) |
| Z-Scan Range | Up to 10 mm (configurable with high-precision PZT or motorized stage) |
| Automation | Auto-focus, auto-fringe search, auto-brightness adjustment, multi-region stitching, programmable stage navigation |
| Origin | Hubei, China |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Domestic |
| Model | CMI830 |
| Pricing | Upon Request |
| Origin | Guangdong, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (PRC) |
| Model | CMI830 |
| Pricing | Upon Request |
| Brand | Coatmaster |
|---|---|
| Origin | Switzerland |
| Model | Coatmaster EX Inline |
| Type | Non-contact, Photothermal (ATO) Wet-Film & Dry-Film Thickness Gauge |
| Compliance | ATEX/IECEx Zone 1/21 Certified for Hazardous Areas |
| Measurement Principle | Pulsed Optical Heating + High-Speed Infrared Thermography + Dynamic Thermal Decay Analysis |
| Brand | Coatmaster |
|---|---|
| Origin | Switzerland |
| Model | Coatmaster Inline, Coatmaster Flex |
| Measurement Principle | Thermal-Optical (Patented) |
| Application | Non-destructive, real-time thickness measurement of wet/dry/powder coatings on carbon fiber composites and other non-metallic substrates |
| Compliance | Designed for GLP/GMP environments |
| IP Rating | IP20 (Flex), IP65-rated enclosure options available for Inline |
| Measurement Distance Range | 2–15 cm (Flex), 10–120 cm (Inline) |
| Tilt Tolerance | ±45° (substrate-dependent) |
| Repeatability | <1% RSD (Flex), <2% RSD (Inline, Al substrate, 60 µm uncured powder) |
| Throughput | Up to 120 m/min (Inline) |
| Coating Types | All colors including white |
| Output | Real-time dry-film equivalent (DFE) thickness from wet or uncured layers |
| Data Access | Browser-based cloud dashboard + ERP integration |
| Measurement Speed | 0.3 s (Flex), 0.5 s (Inline) |
| Brand | Coatmaster |
|---|---|
| Origin | Switzerland |
| Model | Coatmaster Inline |
| Compliance | ISO 2808, ASTM D7091, ISO 2360 (eddy current & thermal principles adapted), CE, RoHS |
| Measurement Principle | Advanced Thermal Optics (ATO) with Digital Signal Processing (DSP) |
| Substrate Compatibility | Ferrous metals (steel, galvanized steel), aluminum alloys |
| Coating Types | Liquid paints (e-coat, primer, basecoat, clearcoat), powder coatings, UV-curable coatings |
| Operating Environment | Industrial paint shop (temperature: 15–40 °C |
| humidity | 30–80% RH non-condensing) |
| Measurement Speed | Up to 3 m/s conveyor speed |
| Spot Size | Ø3–5 mm (adjustable via optical configuration) |
| Repeatability | ≤ ±0.5 µm (on stable steel substrates with uniform coating) |
| Data Output | Real-time thickness values (wet & predicted dry film thickness), statistical summaries (X̄, R, Cpk), alarm triggers (configurable thresholds), CSV/Excel export |
| Software Interface | Coatmaster Control Suite v5.x with audit trail, user role management, and 21 CFR Part 11–compliant electronic signatures (optional module) |
| Brand | AIM Systems (Germany) |
|---|---|
| Origin | Germany |
| Model | CoatPro |
| Measurement Principle | Optical Interferometry & Spectral Reflectance Analysis |
| Measurement Type | Simultaneous Wet-Film and Dry-Film Thickness |
| Substrate Compatibility | Metallic, Polymeric, Glass, Rubber, Composite |
| Surface Geometry Support | Curved, Rough, Internal Walls, Complex Geometries |
| Environmental Rating | ATEX Zone 1 & Zone 2 Certified |
| Cooling Requirement | Passive Air-Cooled (No Water Cooling Required) |
| Data Output | Real-Time Streaming via EtherNet/IP, PROFINET, Modbus TCP |
| Reporting | Automated PDF/CSV Report Generation with Statistical Process Control (SPC) Metrics |
| Compliance | ISO 2808, ASTM D7091, EN ISO 19840, IEC 60079-0/-11, FDA 21 CFR Part 11 (Audit Trail Enabled) |