Transient Absorption Spectrometer
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| Brand | Edinburgh Instruments |
|---|---|
| Origin | United Kingdom |
| Model | FLS1000 |
| Spectral Range | 185 nm – 5500 nm |
| Lifetime Range | 10 ps – 10 s |
| Sensitivity (RMS) | >35,000:1 |
| Monochromator Focal Length | 325 mm |
| Grating Configuration | Interchangeable triple-grating turret (single- or dual-monochromator options) |
| Software | FluOracle® v4.x (supports ASTM E275, ISO 11698, USP <1031>, GLP-compliant audit trail & 21 CFR Part 11 optional modules) |
| Brand | PhysTech |
|---|---|
| Origin | Germany |
| Model | FT1030 |
| Instrument Type | Deep-Level Transient Spectroscopy System |
| Operating Modes | C-DLTS, CC-DLTS, I-DLTS, DD-DLTS, Zerbst-DLTS, O-DLTS, FET-Analysis, MOS-Analysis, ITS, PITS, TSC/TSCAP, DLOS, C/V(T), I/V(T), Richardson Plot, Capture Cross-Section Analysis |
| Key Software Features | 28 simultaneous correlation functions per temperature scan, Fourier-DLTS (F-DLTS), Laplace-DLTS, multi-exponential transient fitting, isothermal transient spectroscopy (ITS), signal overlap deconvolution (temperature-scan & isothermal), automatic contact check, real-time capacitance compensation, three-terminal FET current transient acquisition |
| Cooling Compatibility | Liquid nitrogen, closed-cycle cryocoolers, and programmable temperature controllers (4 K – 500 K typical range) |
| Compliance | Designed for GLP/GMP-aligned semiconductor defect characterization workflows |
| Brand | AML |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SEMETROL HERA-DLTS |
| Price Range | USD 120,000 – 280,000 |
| Instrument Class | Semiconductor Defect Characterization System |
| Brand | AML |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SEMETROL HERA-DLTS |
| Price Range | USD 120,000 – 280,000 |
| Instrument Class | Semiconductor Defect Characterization System |
| Brand | SEMERSUN |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SEMETROL HERA-DLTS |
| Price Range | USD $105,000 – $210,000 |
| Instrument Class | Semiconductor Defect Characterization System |
| Brand | TIME-TECH SPECTRA |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Category | Femtosecond Pump-Probe Spectroscopy System |
| Model | Femto-TA100 Series |
| Spectral Range | 320–1650 nm (configurable sub-ranges: UV-Vis 320–1000 nm, NIR 900–1650 nm) |
| Spectral Resolution | 1024-pixel CCD array detector |
| Temporal Resolution | ≤8 ns (extendable to millisecond range via delay line reconfiguration) |
| Data Acquisition Rate | Up to 8 kHz full-spectrum acquisition |
| Optical Delay Line Speed | 400 mm/s, positional accuracy ±0.1 µm |
| Instrument Response Function (IRF) | ≤1.5 × laser pulse duration |
| Pre-zero Signal-to-Noise Ratio | ≤0.1 mOD |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | DSR800 |
| Instrument Class | Laser Flash Photolysis System |
| Spectral Range | Configurable (300–1700 nm with optional extensions) |
| Spectral Resolution | Dependent on monochromator & detector selection |
| Temporal Resolution | Down to 400 ps (selectable: 4 ns / 2 ns / 1.14 ns / 800 ps / 400 ps) |
| Light Sources | Nanosecond pulsed lasers (375–1310 nm), semiconductor lasers (266–2200 nm), high-stability programmable LED (flash response ≤100 ns |
| Microscopy Module | Four objective mounting ports |
| Sample Stage | Motorized XYZ translation stage |
| Data Acquisition | 2 or 4 channels |
| input impedance | 1 MΩ / 50 Ω |
| Measurement Modes | Steady-state I–V, transient photovoltage (TPV), transient photocurrent (TPC), open-circuit voltage decay (OCVD), time-resolved charge extraction (TRCE), electrically modulated TPV/TPC, user-defined protocols |
| IPCE Extension | 300–1100 nm standard |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Laser Flash Photolysis Instrument |
| Spectral Range | Application-Dependent (UV–NIR, configurable via OPA) |
| Spectral Resolution | <5 nm (typical, OPA-tunable) |
| Temporal Resolution | 500 fs (with 100-fs pump pulse) |
| Spatial Resolution | 500 nm |
| Carrier Localization Accuracy | 30 nm |
| Optical Delay Range | 0–4 ns / 0–8 ns (motorized precision delay line) |
| Detection | sCMOS camera with >95% quantum efficiency at 500–900 nm |
| Microscopy Platform | Inverted microscope with open-top design for cryostat, electrical biasing, magnetic field, and probe station integration |
| Operating Modes | Point Pump / Wide-Field Probe |
| Sample Illumination | Reflectance & Scattering Configurations Supported |
| Compliance | GLP-compliant data acquisition architecture |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Category | Domestic (China) |
| Quotation | Upon Request |