X-ray Absorption Fine Structure Spectrometer
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| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | hiXAS |
| X-ray Energy Range | 5–12 keV |
| Minimum Detectable Element Concentration | Low to several wt% |
| XAFS Acquisition Time | 3–8 min (depending on sample concentration and normalization requirements) |
| Spectral Resolution (E/ΔE) | Constant 4000 across full energy range |
| Detector | Photon-counting pixelated X-ray detector |
| Monochromator | HAPG-based von Hamos geometry spectrometer |
| Footprint | 2.0 m × 1.0 m |
| Sample Handling | Motorized sample wheel with multi-position mounting |
| Brand | National Innovation Scientific Instruments |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (PRC) |
| Model | SuperXAFS M9000 |
| Price Range | USD 560,000 – 1,400,000 |
| Energy Range | 4.5–20 keV (upgradable to 25 keV) |
| Photon Flux at Sample | ≥4×10⁶ photons/s @ 7–9 keV |
| Energy Resolution | 0.5–1.5 eV @ 7–9 keV |
| Energy Reproducibility | ≤30 meV over 24 h |
| Minimum Energy Step Size | 0.1 eV |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic Laboratory X-ray Spectrometer |
| Model | NatureXAS 1500 |
| Pricing | Upon Request |
| Brand | RapidXAFS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Model | RapidXAFS 1M |
| Price Range | USD 420,000 – 700,000 |
| X-ray Source Power | 1.6 kW & 3.0 kW |
| Monochromatic X-ray Photon Flux | 1,000,000 photons/s/eV |
| Minimum Detectable Elemental Concentration | 1 wt% |
| Tunable X-ray Absorption Energy Range | 4.5 keV – 15 keV (extendable) |
| Brand | RapidXAFS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | RapidXAFS 2M |
| Price Range | USD 700,000 – 1,400,000 |
| X-ray Source Power | 1.6 kW & 3.0 kW |
| Monochromatic X-ray Photon Flux | > 2,000,000 photons/s/eV at 8 keV |
| Minimum Detectable Elemental Concentration | 0.5 wt% (on CN-supported matrix) |
| Tunable X-ray Absorption Energy Range | 4.5 keV – 20 keV |
| Brand | RapidXAFS (Anhui Absorption Spectrometer) |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic |
| Model | RapidXAFS In Situ Cell |
| Price Range | USD 280,000–420,000 |
| X-ray Source Power | ≤100 W |
| Minimum Detectable Elemental Concentration | 1 wt% |
| X-ray Absorption Energy Range | 2.5–5 keV |
| XAFS Spectrum Acquisition Speed | 1 spectrum/s |
| Brand | RapidXAFS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | RapidXAFS Emission Spectrometer |
| Price Range | USD 390,000 – 490,000 |
| X-ray Source Power | ≤100 W |
| Minimum Detectable Elemental Content | ≤1 wt% |
| Tunable X-ray Absorption Energy Range | 2.5–5 keV |
| Fluorescence Detection Energy Range | 5–15 keV |
| Detectable Edges | 3d transition metal K-edges, 5d transition metal L-edges, actinide L-edges |
| Energy Resolution | ≤1.5 eV @ Cu Kα |
| Detector Efficiency | ≥1×10¹¹ counts per photon |
| Spectral Reproducibility | Energy drift <50 meV across repeated scans |
| Ambient Control | Helium-purged measurement chamber |
| Monochromator | High-purity Si or Ge single-crystal analyzer |
| In Situ Capability | Modular reaction cells for high/low temperature, multiphase catalysis, electrocatalysis, and operando studies |
| Data Acquisition | Real-time XES spectral output during acquisition |
| Brand | Haoyuan |
|---|---|
| Origin | Jilin, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | XAFS2300+ |
| X-ray Source Power (XAFS mode) | 3 kW |
| X-ray Source Power (XES mode) | 50 W |
| Monochromatic Photon Flux | > 2 × 10⁶ photons/sec (at 7–9 keV) |
| Minimum Detectable Elemental Concentration | ≥ 1 wt% |
| Tunable X-ray Absorption Energy Range | 4.5–25 keV |
| Energy Resolution | 0.5–3 eV |
| Energy Scale Drift Reproducibility | < 50 meV per measurement session |
| Monochromator Architecture | Spherical-bent crystal on high-precision Rowland-circle geometry |
| Detector | High-resolution silicon drift detector (SDD) |
| Brand | SPECREATION |
|---|---|
| Origin | Anhui, China |
| Model | TableXAFS-3000 |
| X-ray Source Power | 2.0 kW Mo anode with high-performance power supply (optional foreign source upgrade) |
| Monochromatic X-ray Photon Flux | 2.5 × 10⁶ photons/s |
| Minimum Detectable Elemental Concentration | < 0.5 wt% |
| Tunable X-ray Absorption Energy Range | 4.5–20 keV |
| Brand | SPECREATION |
|---|---|
| Model | TableXAFS-500 |
| Origin | Anhui, China |
| X-ray Source Power | 1.2 kW |
| Monochromatic Photon Flux | 500,000–1,000,000 photons/sec @ 9 keV |
| Detectable Elemental Concentration Limit | ≥1 wt% |
| Tunable X-ray Energy Range | 5–20 keV |
| XAFS Scan Speed | 20 eV/min |
| Energy Resolution | 0.5–1.5 eV (near-edge, 7–9 keV) |
| Monochromator Crystal | 100 mm diameter, R = 500 mm spherical Si or Ge bent crystal |
| Detector | Silicon Drift Detector (SDD) |
| Sample Carousel Capacity | 7–16 positions |
| Single-Scan Energy Coverage | >600 eV @ 7–9 keV |
| Brand | SPECREATION |
|---|---|
| Model | TableXES-V2k |
| Origin | Anhui, China |
| Instrument Type | Benchtop XES/XAFS Spectrometer |
| X-ray Source | 1.2 kW Sealed-Tube X-ray Tube (Customizable Anode Material) |
| Energy Range | 4.5–20 keV (Single-scan range >600 eV at 7–9 keV) |
| Energy Resolution | 0.5–1.5 eV (at 7–9 keV, XANES region) |
| Monochromator | Spherical bent crystal (Si or Ge), 100 mm aperture, 500 mm radius |
| Photon Flux | 5×10⁵–1×10⁶ photons/sec @ 9 keV |
| Detector | Silicon Drift Detector (SDD) |
| Sample Carousel | 7–16-position motorized sample wheel |
| Scan Mechanism | High-precision goniometric stage with thermal drift compensation |
| Safety | Interlocked radiation shielding compliant with IEC 61010-1 and GBZ 117-2020 |
| Optional Modes | Fluorescence-detected XAFS (FD-XAFS), Resonant Inelastic X-ray Scattering (RIXS)-compatible XES, In Situ/Operando cell integration |