Keithley 2400 SourceMeter Instrument

Overview

The Keithley 2400 SourceMeter Instrument is a precision, single-channel, 4-quadrant source-measure unit (SMU) engineered for high-accuracy voltage sourcing, current sourcing, voltage measurement, and current measurement—simultaneously and synchronously. Unlike conventional power supplies or multimeters, the 2400 integrates source and measurement circuitry into a single instrument with guarded architecture and low-noise design, enabling true sub-picoampere current measurements and microvolt-level voltage resolution. Its core operation follows the principle of feedback-controlled force-and-measure methodology: the instrument forces a precise voltage or current while concurrently measuring the complementary parameter with calibrated, ratiometric A/D conversion—ensuring traceable accuracy across decades of dynamic range. Designed for laboratory-grade device characterization and production test environments, it supports both DC and pulsed I-V sweeps, making it indispensable for semiconductor parametric testing, material resistivity analysis, LED/Laser diode validation, and nanomaterial conductivity profiling.

Key Features

• True 4-quadrant operation: sources and sinks power in all combinations (±V, ±I), essential for testing diodes, batteries, and active devices under forward/reverse bias.
• 6½-digit resolution with 0.012% basic accuracy on voltage and current measurements—validated per NIST-traceable calibration procedures.
• Ultra-low current measurement capability down to 10 pA (with optional low-current preamplifier mode), supported by triax shielding and guarded inputs to minimize leakage and noise.
• Programmable pulse generation up to 1000 W peak power (80 V_p-p, ±800 mA), with 5 ns timing resolution and 200 MSa/s sampling for transient response capture.
• Flexible remote sensing: configurable 2-wire, 4-wire (Kelvin), or 6-wire topology to eliminate lead resistance errors in high-precision applications.
• Standard SCPI command set over GPIB, RS-232, and proprietary Trigger Link interface—enabling seamless integration into automated probe station and handler-based test systems.
• Onboard programmable DIO lines for hardware-triggered sequencing, interlock control, and probe card actuation without external controllers.

Sample Compatibility & Compliance

The 2400 is routinely deployed in wafer-level and packaged-device test workflows compliant with JEDEC JESD22-A114 (ESD), JEDEC JESD22-A118 (latch-up), and ASTM F1957 (semiconductor parametric testing). Its measurement integrity meets requirements for ISO/IEC 17025-accredited laboratories when operated with documented calibration intervals and environmental controls (e.g., temperature-stabilized enclosures). For regulated industries—including medical electronics and automotive ECUs—the instrument supports GLP and GMP documentation practices via compatible software platforms that enforce electronic signatures, audit trails, and 21 CFR Part 11–compliant data archiving.

Software & Data Management

Keithley’s TestScript Studio and KickStart Instrument Control Software provide intuitive graphical interfaces for configuring sweep sequences, real-time plotting, statistical pass/fail evaluation, and export to CSV, MATLAB (.mat), or HDF5 formats. All measurements include timestamped metadata (source settings, compliance limits, trigger conditions), ensuring full experimental reproducibility. The 2400’s memory buffer stores up to 2,500 readings locally, and its GPIB interface supports data streaming at up to 1,700 readings/sec (4½-digit mode)—critical for high-throughput binning in manufacturing test cells.

Applications

• Semiconductor device characterization: I-V curve tracing of MOSFETs, HEMTs, and GaN transistors; threshold voltage extraction; subthreshold swing analysis.
• Photovoltaic and OLED R&D: series/shunt resistance mapping, fill factor optimization, and degradation kinetics under controlled illumination and bias stress.
• Resistive memory (ReRAM, PCM) and memristor testing: conductance switching dynamics, endurance cycling, and retention profiling.
• Electrochemical impedance spectroscopy (EIS) pre-characterization: DC polarization curves prior to AC signal injection.
• Quality assurance in power supply design: load regulation, line regulation, and short-circuit protection verification under programmable fault conditions.

FAQ

Is the Keithley 2400 compatible with modern probe stations and wafer handlers?
Yes—it supports TTL-triggered synchronization and programmable DIO handshaking, enabling direct integration with Cascade Microtech, FormFactor, and MPI probe systems.
Does the 2400 support automated calibration verification?
It includes built-in self-test routines and supports external reference standards (e.g., Fluke 732B) via its 4-wire ohms mode for periodic metrological verification.
Can the 2400 perform pulsed I-V measurements on power devices?
Yes—its 1000 W pulsed mode with adjustable pulse width (100 ns–10 s), duty cycle, and slew rate enables safe, non-destructive characterization of SiC and GaN power modules.
What is the maximum sampling rate for continuous waveform capture?
At 4½-digit resolution, the instrument achieves 1700 readings/sec over GPIB; buffered acquisition allows burst-mode capture at up to 50 kS/s (limited by internal memory depth).
Is firmware upgrade support available for legacy units?
All 2400 Series instruments (including original 1990s models) are supported by Keithley’s current firmware releases via free download from Tektronix’s official support portal.