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SUNS Planar Metrology Laser Distance Sensor System

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Brand SUNS
Origin Shenzhen, China
Manufacturer Type Direct Manufacturer
Origin Category Domestic (China)
Model Planar Metrology Laser Distance Sensor System
Quotation Available Upon Request
Measurement Accuracy 0.001 mm

Overview

The SUNS Planar Metrology Laser Distance Sensor System is a high-precision, non-contact metrological instrument engineered for quantitative geometric evaluation of flatness and parallelism in industrial manufacturing and additive manufacturing environments. It operates on the principle of triangulation-based laser displacement sensing, where a collimated visible or near-infrared laser beam is projected onto a target surface, and the reflected light is captured by a high-resolution CMOS position-sensitive detector (PSD) or linear image sensor. The system calculates vertical displacement with sub-micron resolution by analyzing the spatial shift of the reflected spot—enabling deterministic, traceable measurement of surface topography across defined XY scan fields. Designed specifically for integration into 3D printing build platforms, CNC worktables, and precision assembly jigs, this system delivers repeatable, temperature-stable dimensional feedback essential for closed-loop process control and first-article inspection.

Key Features

  • Sub-micron axial resolution: Capable of resolving height variations down to 0.001 mm (1 µm) under controlled environmental conditions (20 ± 1 °C, <40% RH, vibration-isolated mounting).
  • Dual-axis planar assessment: Simultaneously evaluates flatness (ISO 1101:2017) and parallelism (ASME Y14.5–2018) via coordinated multi-point scanning routines across user-defined grid patterns.
  • Modular optical head design: Compact, IP54-rated sensor head with adjustable focus lens and integrated thermal drift compensation algorithm for long-duration stability.
  • Real-time analog output + digital interface: Supports 0–10 V analog output for PLC integration and RS-422/USB-C digital communication for host PC synchronization and data streaming at up to 1 kHz sampling rate.
  • Calibration traceability: Factory-calibrated against NIST-traceable step-height standards; calibration certificate includes uncertainty budget per ISO/IEC 17025 requirements.

Sample Compatibility & Compliance

The system is optimized for reflective and diffusely scattering surfaces typical of metal build plates (e.g., stainless steel, aluminum alloy), ceramic-coated substrates, and polymer-coated tooling plates used in powder bed fusion (PBF) and binder jetting systems. It accommodates surface roughness (Ra) ranging from 0.1 µm to 6.3 µm without signal saturation or speckle noise degradation. All hardware and firmware comply with CE marking directives (EMC Directive 2014/30/EU, Low Voltage Directive 2014/35/EU) and meet RoHS 3 (EU 2015/863) material restrictions. For regulated production environments, the system supports audit-ready configuration logs and timestamped measurement records aligned with GLP and GMP documentation practices.

Software & Data Management

The bundled SUNS MetroView™ software (v3.2+) provides intuitive point-cloud generation, GD&T-compliant tolerance zone visualization (per ASME Y14.5), and statistical process monitoring (SPC) charts including X-bar/R and Cpk calculation. Raw distance data is stored in HDF5 format with embedded metadata (sensor ID, timestamp, ambient temperature, operator ID), ensuring full FAIR (Findable, Accessible, Interoperable, Reusable) data principles. Optional FDA 21 CFR Part 11 compliance package includes electronic signature capability, role-based access control, and immutable audit trails for all measurement sessions and parameter changes.

Applications

  • Pre-build verification of 3D printer build platform flatness prior to powder spreading or resin dispensing.
  • In-process monitoring of thermal warpage during multi-layer metal AM cycles.
  • Qualification of granite surface plates and machine tool reference tables per ISO 8512-2.
  • Parallelism validation between opposing faces of precision fixtures and metrology-grade gage blocks.
  • Root-cause analysis of layer adhesion failure linked to localized substrate deformation.

FAQ

What is the maximum measurable range and field-of-view (FOV) of this system?
Standard configuration supports a 50 mm × 50 mm FOV with a working distance of 150 mm; extended-range variants (up to 200 mm × 200 mm FOV) are available upon request.
Does the system support automated scanning via motorized stages?
Yes—native API support for common motion controllers (Galil, Aerotech, Newport) enables synchronized XYZ raster scanning and programmable path definition.
Can measurement data be exported to industry-standard CAD or metrology software?
Yes—exports to STEP AP214, IGES, and ASCII point-cloud formats (.xyz, .csv); compatible with PolyWorks, Geomagic Control X, and Metrolog X4 via standard import protocols.
Is on-site installation and ISO 17025-compliant recalibration offered?
SUNS provides certified field service engineers for commissioning, and accredited recalibration services through CNAS-accredited labs with turnaround ≤10 business days.

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