Hamamatsu C4575-03 X-ray Streak Camera
| Brand | Hamamatsu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | C4575-03 |
| Pricing | Upon Request |
| Spectral Response Range | 10 eV to 10 keV |
| Temporal Resolution | < 0.5 ps (FWHM, calculated) |
| Sweep Repetition Rate | Single-shot to 100 Hz max |
| Dynamic Range | > 1:10 |
| Sweep Duration | 35 ps to 2 ns |
| Effective Photocathode Length | 8.6 mm |
Overview
The Hamamatsu C4575-03 X-ray Streak Camera is a high-performance, integrated ultrafast diagnostic instrument engineered for time-resolved X-ray detection in synchrotron radiation facilities, X-ray free-electron laser (XFEL) beamlines, and high-energy density physics experiments. It operates on the principle of photoelectron streaking: incident X-ray photons strike a photocathode, generating photoelectrons that are accelerated and deflected by a time-varying electric field across a microchannel plate (MCP) amplifier. The resulting spatial displacement of electrons on the phosphor screen is linearly proportional to their emission time—enabling direct conversion of temporal profiles into spatial intensity distributions. This electro-optical architecture delivers sub-picosecond temporal resolution without reliance on external pump-probe synchronization, making it suitable for single-shot, non-repetitive X-ray pulse characterization.
Key Features
- Sub-0.5 ps temporal resolution (FWHM, calculated), validated under calibrated X-ray illumination at 1–10 keV energies
- Monolithic vacuum-integrated design with sealed, hermetically bonded streak tube and thermoelectrically cooled 1024 × 1024 pixel CCD sensor
- Large-area transmission-mode photocathode (8.6 mm effective length) optimized for soft-to-hard X-ray quantum efficiency across 10 eV–10 keV
- Integrated sweep generator supporting programmable sweep durations from 35 ps to 2 ns, with jitter < 200 fs RMS
- Real-time gain control via MCP voltage modulation, enabling dynamic range > 1:10 in single-acquisition mode
- Trigger-synchronized operation with TTL/PECL-compatible inputs; supports external delay generators for precise timing alignment
Sample Compatibility & Compliance
The C4575-03 is designed for direct detection of pulsed X-ray sources including XFELs (e.g., LCLS, European XFEL, SACLA), laser-produced plasmas, and synchrotron bending-magnet or undulator pulses. Its photocathode composition (CsI or KBr, configurable per application) ensures high quantum efficiency in the water window (284–543 eV) and beyond. The system complies with IEC 61000-6-3 (EMC emission standards) and meets mechanical vibration tolerance requirements per ISO 10816-1 for laboratory-grade optical instrumentation. All vacuum components adhere to ASTM E595 outgassing specifications for ultra-high-vacuum compatibility (<1×10⁻⁹ Torr base pressure). No radioactive materials or hazardous substances are incorporated; RoHS 2011/65/EU and REACH SVHC declarations are available upon request.
Software & Data Management
Hamamatsu provides the proprietary STREAKVIEW™ acquisition and analysis suite (v5.2+), compatible with Windows 10/11 64-bit systems. The software enables full parametric control of sweep timing, MCP gain, CCD integration, and trigger latency. Raw streak images are saved in 16-bit TIFF format with embedded metadata (timestamp, sweep parameters, calibration coefficients). Time-axis calibration is traceable to NIST-traceable RF reference signals. For regulated environments, optional audit-trail logging and user-access control modules support compliance with FDA 21 CFR Part 11 and GLP/GMP data integrity requirements. Export formats include HDF5, ASCII, and MATLAB .mat for third-party spectral deconvolution or machine-learning preprocessing pipelines.
Applications
- Ultrafast X-ray spectroscopy of transient plasma states in inertial confinement fusion experiments
- Single-shot temporal profiling of self-amplified spontaneous emission (SASE) pulses at XFEL facilities
- Time-of-flight X-ray absorption near-edge structure (XANES) measurements in pump-probe configurations
- In situ diagnostics of laser-driven X-ray source evolution (e.g., betatron radiation, Kα emission dynamics)
- Calibration and validation of X-ray pulse duration monitors (e.g., cross-correlators, THz-field sampling)
- High-resolution X-ray emission spectroscopy from laser-solid interactions (e.g., warm dense matter studies)
FAQ
What X-ray photon energy range is supported?
The C4575-03 detects photons from 10 eV (soft X-ray/VUV) up to 10 keV (hard X-ray), with peak quantum efficiency dependent on photocathode material selection.
Is vacuum interfacing required for operation?
Yes—the streak tube must be operated under high vacuum (<1×10⁻⁶ Pa); standard CF-63 or ISO-KF40 flanges are provided for direct beamline integration.
Can the system resolve overlapping X-ray pulses?
With its 20 dB).
Does the camera support external triggering with sub-ps jitter?
Yes—TTL/PECL input accepts trigger signals with <150 fs RMS jitter relative to internal sweep start, verified using dual-channel oscilloscope cross-correlation.
Is calibration data provided with each unit?
Each C4575-03 ships with factory-measured time dispersion coefficient (ps/mm), spatial distortion map, and photocathode QE curve referenced to NIST SRM 1920a.
