Jingfei FLA7200 Near-Infrared (NIR) Lamp Testing System

Overview

The Jingfei FLA7200 Near-Infrared (NIR) Lamp Testing System is a high-precision, spectroradiometric measurement platform engineered for comprehensive photometric, colorimetric, and electrical characterization of solid-state lighting (SSL) devices—including LED lamps, NIR-emitting diodes, halogen sources, and broad-spectrum thermal emitters. Unlike conventional photometers, the FLA7200 integrates a back-thinned CCD spectrometer with thermoelectric cooling and a calibrated cosine-corrected input optic, enabling traceable spectral measurements across the full 350–1100 nm range. Its optical architecture supports both relative spectral power distribution (SPD) acquisition and absolute radiometric calibration via NIST-traceable standards. The system operates on the principle of wavelength-dispersive detection using a fixed grating monochromator, delivering high signal-to-noise ratio (SNR) even at low-light NIR intensities—critical for evaluating 850 nm and 940 nm illumination modules used in machine vision, biometric sensing, and industrial heating applications.

Key Features

• Full-spectrum analysis from ultraviolet (350 nm) to near-infrared (1100 nm), optimized for NIR lamp validation including quartz halogen, IR LEDs, and ceramic emitters
• High-resolution spectral sampling at 0.4 nm intervals with ±1.0 nm absolute wavelength accuracy—validated per ISO/CIE 130-1 and CIE 127:2007
• Class I photometric accuracy certified to IEC 62612 and LM-79-19 requirements, supporting regulatory reporting and energy labeling compliance
• Dual-mode electrical test capability: programmable constant-current (1.0 mA–2.0 A) and constant-voltage (0.1 V–25.0 V) sourcing with simultaneous IF/VF/IR/VZ parameter capture
• Automated chromaticity calculation per CIE 1931 and CIE 1976 u’v’ systems, including SDCM (MacAdam ellipse) evaluation against ANSI C78.377 and IEC 62717
• Thermally stabilized optical bench with internal reference lamp and auto-zero compensation to minimize drift during extended integration cycles (up to 6.5 s)

Sample Compatibility & Compliance

The FLA7200 accommodates a wide variety of lamp geometries and mounting configurations—including integrated fixtures, bare emitters on heatsinks, and reflector-based NIR arrays—via interchangeable integrating spheres (0.3 m and 1.0 m options) and collimated beam adapters. It meets the mechanical and operational requirements of ISO/IEC 17025-accredited laboratories and supports audit-ready documentation for GLP and GMP environments. All photometric calibrations are performed using NIST-traceable tungsten-halogen and deuterium standards, with uncertainty budgets documented per ISO/IEC Guide 98-3 (GUM). Electrical measurement functions comply with IEC 62384 for DC-LED drivers and IEC 61000-3-2 for harmonic current emission pre-screening.

Software & Data Management

The FLA7200 operates with Jingfei’s proprietary SpectraLab v4.x software suite, a Windows-based application compliant with FDA 21 CFR Part 11 for electronic records and signatures. The software provides full audit trail logging, user role-based access control (RBAC), and automated report generation in PDF, CSV, and XML formats—including IESNA LM-63 and EULUMDAT (.ldt) export. Raw spectral data is stored in industry-standard JIS X 0211-compliant binary format with embedded metadata (timestamp, operator ID, calibration ID, environmental conditions). Batch testing workflows support sequence programming for production-line throughput, with pass/fail thresholds configurable per parameter (e.g., CCT deviation ≤ ±200 K, SDCM ≤ 3, luminous efficacy ≥ target value).

Applications

• Verification of NIR heating tube spectral output for industrial drying, food processing, and thermoforming equipment
• Characterization of 850/940 nm LED arrays used in security illumination, driver monitoring systems, and LiDAR illuminators
• Quality control of halogen-based NIR sources per DIN EN 62471 (photobiological safety)
• Development and validation of smart lighting systems with integrated thermal feedback loops
• Third-party testing for ENERGY STAR, DLC, and CE marking submissions requiring full SPD and electrical performance data
• Research into phosphor-converted NIR emitters and quantum dot-enhanced broadband sources

FAQ

Does the FLA7200 support real-time spectral monitoring during thermal soak tests?
Yes—the system enables time-resolved spectral acquisition with user-defined trigger logic (TTL or software-initiated), allowing continuous SPD capture over temperature ramps up to 120 °C when paired with optional environmental chamber interfaces.
Can the instrument measure pulsed NIR sources operating at frequencies above 1 kHz?
Yes—using gated integration mode synchronized to external TTL triggers, the FLA7200 achieves temporal resolution down to 100 µs, supporting pulse-width modulation (PWM) analysis and transient thermal droop assessment.
Is firmware upgrade capability included, and how are calibration updates managed?
Firmware and calibration file updates are delivered via secure HTTPS portal with SHA-256 signature verification; all calibrations retain unique cryptographic identifiers for version traceability and revalidation scheduling.
What level of technical support is provided for international customers outside mainland China?
Jingfei offers remote diagnostics, English-language application engineering support, and on-site service through authorized regional partners in North America, EU, and APAC—backed by ISO 9001-certified service management processes.