Hefei Kejing DX-100 X-ray Single-Crystal Orienting Diffractometer

Overview

The Hefei Kejing DX-100 X-ray Single-Crystal Orienting Diffractometer is a compact, modular Bragg-angle diffractometer engineered for precise crystallographic orientation determination of single-crystal specimens. Based on the fundamental principle of Bragg diffraction—where monochromatic X-rays incident upon a crystalline lattice produce constructive interference at specific angles governed by nλ = 2d sinθ—the DX-100 enables rapid identification of crystallographic planes relative to sample surfaces. Its split architecture separates the goniometric X-ray optics module from the electronic control unit, minimizing thermal and electromagnetic coupling while facilitating installation in space-constrained laboratories or production cleanrooms. Designed for routine use in materials R&D labs, crystal growth facilities, and semiconductor wafer fabrication support units, the instrument delivers repeatable angular alignment with mechanical stability optimized for manual or semi-automated operation. The Cu-target X-ray tube provides characteristic Kα radiation (λ = 1.5418 Å), suitable for orienting common inorganic crystals including Si, GaAs, sapphire (Al₂O₃), LiNbO₃, and quartz.

Key Features

• Modular design with physically decoupled X-ray head and control electronics for enhanced thermal stability and serviceability
• Adjustable Cu-anode X-ray source operating at up to 30 kV / 5 mA, with fan-assisted cooling and grounded anode configuration for consistent output and operator safety
• Dual-time-constant pulse processing (1 s fast / 2 s slow) to optimize signal-to-noise ratio across varying count rates and crystal quality
• Mechanical goniometer with dual-scale readout: engraved angular ring (1° resolution) plus digital display calibrated to arcsecond-level precision (10″ minimum readout)
• Motorized primary beam shutter for controlled exposure timing and reproducible measurement sequences
• Interchangeable collimating slits (4′, 5′, 6′) to balance beam divergence, intensity, and angular resolution per application requirement
• Full angular coverage: 2θ from –10° to +140° and θ from –10° to +70°, supporting both forward- and back-reflection geometries

Sample Compatibility & Compliance

The DX-100 accommodates standard crystal mounts—including pin-type holders, vacuum chucks, and kinematic stages—for specimens ranging from 5 mm to 75 mm in diameter. It supports orientation verification of bulk crystals, boules, wafers, and epitaxial substrates without requiring polishing or metallization. While not certified for GLP/GMP environments out-of-the-box, its mechanical repeatability (±30″ peak position accuracy) and stable tube output meet baseline requirements for internal process control per ISO 17025–accredited laboratories performing crystallographic QC. The instrument complies with IEC 61000-6-3 (EMC emission limits) and IEC 61010-1 (safety for electrical equipment for measurement), and its radiation shielding meets national Class II X-ray device regulations in China (GBZ 138–2002). Users are required to implement local radiation safety protocols, including interlocked enclosures and dosimetry monitoring, in accordance with applicable national regulatory frameworks.

Software & Data Management

The DX-100 operates via dedicated front-panel controls and real-time digital angle readout, with no embedded PC or proprietary software stack. All measurement data—including 2θ/θ positions, count rates, time constants, and slit configurations—are manually recorded or logged externally using standardized lab notebooks or LIMS-integrated spreadsheets. This minimalist architecture ensures long-term operational continuity, eliminates software obsolescence risks, and simplifies validation for regulated environments where audit trails must remain traceable to physical instrument settings. For users requiring digital acquisition, third-party DAQ systems compatible with TTL pulse outputs from the Geiger-Müller detector may be integrated via standard BNC interfaces, enabling custom scripting (e.g., Python or LabVIEW) for automated scan routines and CSV-based reporting aligned with ASTM E975 or ISO 11639 documentation standards.

Applications

• Pre-growth orientation verification of seed crystals in Czochralski and Bridgman furnaces
• Post-cutting alignment validation of optical and laser-grade crystals prior to polishing
• Quality assurance of substrate orientation in compound semiconductor manufacturing (e.g., GaN-on-sapphire, InP wafers)
• Educational demonstration of Bragg’s law and Laue symmetry in undergraduate solid-state physics laboratories
• Failure analysis of misoriented domains in piezoelectric or ferroelectric single crystals
• Calibration reference for high-resolution XRD systems requiring known orientation standards

FAQ

What X-ray wavelength does the DX-100 generate?

The Cu-anode tube emits characteristic Kα radiation at λ = 1.5418 Å, optimal for orienting most common inorganic single crystals.

Is the instrument capable of automated scanning?

No—the DX-100 is manually operated with digital angle readout; it does not include motorized goniometer axes or scan automation firmware.

Can the Geiger-Müller detector be replaced with a scintillation counter?

The detector interface is proprietary and not user-serviceable; replacement or upgrade requires factory recalibration and mechanical alignment.

Does the system include radiation shielding?

The main unit incorporates lead-lined housing meeting Class II leakage limits per GBZ 138–2002, but external shielding (e.g., lead acrylic panels) must be installed per site-specific safety assessments.

What maintenance is required for long-term reliability?

Annual inspection of X-ray tube filament integrity, collimator alignment verification, and GM counter plateau testing are recommended per manufacturer guidelines.