Duma Optronics BeamOn Series Beam Profiling Analyzer
| Origin | Israel |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | BeamOn Series |
| Price Range | USD 1,400–7,200 (FOB) |
| Core Components | CCD-based beam analysis system with calibrated neutral-density filtering, USB 2.0 interface, and proprietary beam characterization software |
Overview
The Duma Optronics BeamOn Series is a family of high-accuracy, USB-powered beam profiling analyzers engineered for quantitative spatial characterization of continuous-wave (CW) and pulsed laser beams across ultraviolet, visible, near-infrared (NIR), and short-wave infrared (SWIR) spectral ranges. Based on monochrome CCD sensor technology with pixel-level linearity calibration, the system implements ISO 11146-compliant algorithms to compute fundamental beam parameters—including second-moment (D4σ) beam width, centroid position, ellipticity, M²-equivalent divergence metrics, peak intensity distribution, and integrated power—directly from raw irradiance images. Each model integrates thermally stable optical mounting, precision-machined filter wheel housings, and factory-calibrated Schott NG or ND attenuation filters to ensure traceable measurement integrity under varying irradiance conditions (up to 10 W/cm² with optional SAM attenuators). Designed for integration into laser development labs, OEM production lines, and metrology facilities, the BeamOn platform supports both benchtop alignment verification and remote field deployment via USB 2.0 tethering.
Key Features
- Multi-spectral CCD sensors: VIS-NIR (350–1310 nm), UV-NIR (190–1310 nm), IR-1550 (1500–1600 nm), and high-resolution VIS (350–1100 nm) variants
- Integrated motorized or manual filter wheel with three calibrated Schott NG4/NG9/NG10 or ND filters for dynamic optical density adjustment (OD 1.0–6.0)
- Real-time beam parameter calculation per ISO 11146-1 & -2: D4σ width, knife-edge equivalent, beam aspect ratio, centroid stability, and RMS wavefront tilt estimation
- USB 2.0 interface with low-latency frame capture (up to 30 fps at full resolution), no external power supply required for standard operation
- Factory-installed radiometric calibration enabling absolute irradiance mapping (W/cm²) and total power derivation (mW to W range) when paired with certified reference detectors
- Rugged aluminum housing with kinematic post mount (M6 thread) and MIL-STD-810G compliant carrying case for transport and field use
Sample Compatibility & Compliance
The BeamOn Series accommodates free-space Gaussian, multimode, top-hat, and structured laser beams with diameters ranging from 10 µm to 22 mm (expandable to 44 mm using RDC×2 beam reducer). It supports pulse durations from nanosecond to CW regimes, with synchronization capability for externally triggered acquisition (TTL input optional). All models comply with CE marking requirements for electromagnetic compatibility (EN 61326-1) and safety (IEC 61010-1). Measurement traceability aligns with ISO/IEC 17025 laboratory accreditation frameworks when used in conjunction with NIST-traceable power meters and collimated reference sources. Optional accessories—including reflective beam samplers (SAM3-A), high-damage-threshold attenuators (SAM1/SAM2), and ×2 or ×8 beam reducers—extend operational range to multi-kilowatt industrial lasers while preserving spatial fidelity.
Software & Data Management
BeamOn systems ship with Duma’s proprietary BeamStudio software (v5.x), distributed on licensed CD-ROM and compatible with Windows 10/11 (64-bit). The application provides real-time visualization of beam cross-sections, temporal stability plots (centroid drift, width fluctuation over time), batch processing for series of acquisitions, and export of ASCII, CSV, and TIFF formats for third-party analysis (MATLAB, Python, LabVIEW). Audit trail functionality logs user actions, calibration date stamps, and instrument configuration changes—supporting GLP/GMP environments requiring FDA 21 CFR Part 11 compliance when deployed with electronic signature modules. Software updates are delivered via secure vendor portal; no cloud dependency or telemetry collection is implemented.
Applications
- Laser cavity alignment and mode optimization in solid-state, diode-pumped, and fiber laser development
- QC verification of beam homogeneity and pointing stability in medical laser systems (e.g., ophthalmic, dermatological platforms)
- M² factor pre-screening prior to formal ISO 11146 M² measurement setups
- Characterization of ultrafast amplifier output beams where temporal gating is synchronized with camera exposure
- Beam diagnostics in photolithography tool calibration and EUV source monitoring subsystems
- Educational laboratories for hands-on instruction in laser physics, diffraction theory, and optical metrology principles
FAQ
What wavelength ranges does each BeamOn model support?
BeamOn-VIS-NIR covers 350–1310 nm; BeamOn-UV-NIR extends to 190 nm; BeamOn-IR1550 targets 1500–1600 nm; BeamOn HR operates from 350–1100 nm with enhanced pixel resolution.
Can the system measure pulsed lasers with nanosecond duration?
Yes—provided pulse energy per frame remains within CCD saturation limits. External triggering and adjustable exposure timing enable synchronization with repetition rates up to 1 kHz.
Is radiometric calibration included and NIST-traceable?
Each unit ships with factory-applied pixel responsivity and flat-field correction maps. Absolute irradiance calibration requires separate NIST-traceable power meter validation per ISO/IEC 17025 procedures.
Does BeamStudio support automated pass/fail reporting for production line use?
Yes—customizable tolerance thresholds can be defined per parameter (e.g., beam width ±5%, centroid shift <2 µm); results generate color-coded reports with timestamped PDF export.
Are motorized filter wheels available on all models?
Only BeamOn HR-AFW includes the motorized automatic filter wheel; other variants use manually indexed filter carousels with tactile positioning detents.
