Solars SHR Series Laser Wavelength Meter

Overview

The Solars SHR Series Laser Wavelength Meter is a precision optical metrology instrument engineered for absolute wavelength determination of continuous-wave (CW) and externally triggered pulsed lasers. Based on the principle of interferometric fringe analysis using a stabilized, temperature-controlled Fizeau interferometer architecture, the system delivers traceable, high-reproducibility measurements without mechanical scanning or moving parts—ensuring long-term stability and minimal drift. Designed for laboratory, production QA/QC, and R&D environments, the SHR platform supports calibration traceability to NIST-certified standards and complies with ISO/IEC 17025 requirements for measurement uncertainty reporting. Its all-solid-state optical path, fiber-coupled input interface, and compact benchtop form factor make it suitable for integration into laser characterization stations, OEM subsystems, and automated test benches.

Key Features

• Interferometric wavelength measurement with no moving parts—eliminates mechanical wear and enhances operational longevity
• Fiber-optic input (400 µm core, 1 m length, SMA-905 connector) with optional diffuse attenuator (FA-3) for safe, flexible beam coupling
• Multiple spectral configurations: SHR (190–1100 nm), SHR-IR (600–1800 nm), and WaveScan (250–2600 nm across six selectable ranges)
• Real-time acquisition capability: up to 6 Hz scan rate; supports pulse repetition rates >4 MHz in real-time mode and >1 kHz in accumulation mode
• High absolute accuracy: ±0.003 nm (SHR, 193 nm), ±0.02 nm (SHR-IR, 600 nm), ±0.2 nm (WaveScan, full range)
• USB and RS232 communication interfaces; LabVIEW-compatible drivers included for seamless system integration
• Compatible with Windows XP or later; no proprietary OS required

Sample Compatibility & Compliance

The SHR Series accommodates both CW and pulsed laser sources with linewidths ≤125 cm⁻¹ (equivalent to ~0.5 nm at 193 nm and ~18 nm at 1200 nm for SHR; ~4 nm at 600 nm and ~40 nm at 1800 nm for SHR-IR). It is validated for use with diode lasers, Ti:sapphire oscillators, fiber lasers, OPOs, and excimer sources. All models meet CE marking requirements and conform to IEC 61000-6-3 (EMC emission) and IEC 61000-6-2 (immunity) standards. Data integrity protocols align with GLP/GMP documentation expectations, supporting audit-ready measurement logs when used with compliant PC systems. While not FDA 21 CFR Part 11–certified out-of-the-box, the instrument’s deterministic output format and timestamped ASCII data export enable implementation of electronic signature and audit trail workflows within validated environments.

Software & Data Management

Solars provides native Windows-based control software featuring real-time spectrum visualization, multi-channel wavelength tracking, and batch export in CSV and TXT formats. The software supports user-defined pass/fail thresholds, statistical reporting (mean, std dev, min/max over time), and automatic calibration validation alerts. LabVIEW drivers allow direct integration into custom-built test automation frameworks. All measurement data include embedded metadata: timestamp (UTC), instrument serial number, calibration date, spectral range, and acquisition mode—facilitating traceability and compliance with ISO 17025 clause 7.7 (results reporting). No cloud dependency or subscription licensing is required; firmware updates are delivered via offline installer packages.

Applications

• Wavelength verification and drift monitoring of tunable lasers in spectroscopy and metrology labs
• QC testing of laser diodes and DPSS lasers during manufacturing and burn-in
• Characterization of ultrafast oscillator and amplifier systems (e.g., Ti:sapphire, Yb-fiber)
• Calibration support for optical frequency combs and wavemeters in national metrology institutes
• Integration into laser safety interlock systems requiring real-time λ feedback
• Supporting ASTM E275–22 (standard practice for UV-Vis-NIR spectrophotometer qualification) via reference source validation

FAQ

What laser linewidths are supported?
The SHR accepts sources with linewidths ≤125 cm⁻¹; equivalent approximations are provided per model and wavelength band in the specifications.
Can the instrument measure broadband or ASE sources?
No—this is a monochromatic wavelength meter optimized for narrow-linewidth lasers; broadband emission requires a spectrometer.
Is external triggering mandatory for pulsed operation?
Yes; pulsed mode requires TTL-level external trigger synchronization to ensure phase-coherent interferogram capture.
Does the system require periodic recalibration?
Factory calibration is stable for 12 months under normal lab conditions; annual recalibration is recommended for ISO 17025 compliance.
Are FC/APC or other fiber connectors available?
Standard configuration includes SMA-905; FC/PC and FC/APC options are available as configurable accessories.