Auniontech DV-ILPDL Series Multi-Port Optical Device Insertion Loss and Polarization-Dependent Loss Wavelength-Sweep Test System
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Model | DV-ILPDL Series |
| Measurement Principle | Tunable Laser Source + High-Speed Dual-Channel Power Meter with Polarization Control |
| Wavelength Range | O-band (1260–1360 nm) & C+L-band (1480–1620 nm) |
| IL Resolution | 0.001 dB |
| IL Repeatability | ±0.02 dB |
| PDL Repeatability | ±0.01 dB |
| Scan Speed | 1–200 nm/s |
| Spectral Resolution | 0.1 pm |
| IL Dynamic Range | 70 dB |
| PDL Dynamic Range | 25 dB |
| Measurement Time (100 nm @ 50 nm/s) | IL ≤3 s, PDL ≤12 s, ILavg ≤6 s |
| Interface | Gigabit Ethernet (LAN), USB, HDMI |
| Module Chassis | 5-slot mainframe supporting hot-swappable modules |
| Max Channel Count (Cascaded) | ≥144 |
| Environmental Spec | 23 ±5 °C, RH <60% |
Overview
The Auniontech DV-ILPDL Series is a high-performance, modular optical test platform engineered for automated wavelength-swept characterization of multi-port photonic devices. It implements a dual-channel, reference-compensated measurement architecture based on a precision tunable laser source (TLS), a polarization-state generator (PSG), a fiber-coupled beam splitter module, and a high-speed multi-channel optical power meter. By synchronizing TLS wavelength tuning, PSG polarization modulation, and real-time dual-channel power acquisition, the system delivers traceable, high-reproducibility measurements of insertion loss (IL), polarization-dependent loss (PDL), and average insertion loss (ILavg) across full telecom bands — specifically O-band (1260–1360 nm) and C+L-band (1480–1620 nm). Its core design adheres to fundamental principles of photometric ratio measurement and Mueller matrix-based polarization analysis, enabling compliance with industry-standard test methodologies defined in Telcordia GR-1221-CORE and IEC 61300-3-4. The system is purpose-built for R&D validation, process monitoring, and final-test screening of wavelength-selective components including DWDM filters, arrayed waveguide gratings (AWGs), wavelength selective switches (WSS), and integrated photonic circuits.
Key Features
- Modular 5-slot mainframe architecture supporting concurrent installation of optical power meter modules, polarization state generators, and calibrated beam splitters — enabling flexible configuration for IL-only, PDL, or combined IL/PDL workflows.
- Sub-picometer spectral resolution (0.1 pm) and scan speeds up to 200 nm/s, achieving full 100-nm sweeps in ≤3 seconds for IL and ≤12 seconds for PDL under standard conditions.
- Reference-channel compensation architecture eliminates source power drift and thermal-induced baseline error, ensuring ±0.02 dB IL repeatability and ±0.01 dB PDL repeatability over extended measurement sessions.
- High-speed PCIe-based internal communication (>100 Msps) and microsecond-level sampling (1 µs minimum interval) support transient event capture and real-time feedback control in automated test environments.
- Scalable channel expansion via chassis cascading: up to ≥144 independent optical measurement channels achievable through synchronized multi-mainframe operation.
- Onboard data storage capacity of up to 32 million samples per power meter channel, eliminating dependency on continuous host PC streaming during long-duration sweeps.
Sample Compatibility & Compliance
The DV-ILPDL platform supports standardized fiber-optic interfaces including FC/UPC and FC/APC, with optional single-mode (SM) or polarization-maintaining (PM) fiber variants for the beam splitter module. It is compatible with passive and active multi-port devices featuring up to 64 input/output ports when used with external optical switching matrices. All published specifications — including IL accuracy (±0.02 dB for 0–40 dB range), PDL uncertainty (±(0.02 + 3% of measured PDL)), and dynamic range (70 dB IL, 25 dB PDL) — are validated under controlled environmental conditions per ISO/IEC 17025-aligned calibration procedures at 23 ±5 °C and RH <60%. The system architecture supports audit-ready operation compliant with GLP and GMP requirements, including user-accessible calibration logs, firmware version tracking, and timestamped raw-data export.
Software & Data Management
The platform operates via Auniontech’s proprietary ILPDL Control Suite, a Windows-based application offering intuitive instrument configuration, real-time waveform visualization, and automated report generation in PDF and CSV formats. The software provides full API access through a documented C/C++ DLL interface, enabling integration into LabVIEW, Python (PyVISA), MATLAB, or custom CI/CD test frameworks. All measurement data includes embedded metadata: timestamp, wavelength vector, polarization state parameters, instrument serial numbers, and operator ID. Audit trail functionality records all parameter changes, start/stop events, and calibration actions — satisfying FDA 21 CFR Part 11 requirements for electronic records and signatures when deployed in regulated manufacturing environments.
Applications
- Characterization of dense wavelength division multiplexing (DWDM) channel filters and interleavers across full C+L band.
- PDL mapping and IL uniformity verification for planar lightwave circuit (PLC)-based AWGs and multi-stage MUX/DEMUX modules.
- Production-line pass/fail testing of WSS devices with real-time passband shape analysis and ripple quantification.
- Research-grade evaluation of polarization-sensitive photonic integrated circuits (PICs), including silicon photonics modulators and hybrid III-V/Si transceivers.
- Environmental stress testing (temperature cycling, vibration) with synchronized IL/PDL trending using stored baseline references.
FAQ
What wavelength bands does the DV-ILPDL system support?
The system supports O-band (1260–1360 nm) and C+L-band (1480–1620 nm) configurations; specific TLS and PSG modules must be ordered accordingly.
Can the system measure IL and PDL simultaneously on multiple ports?
Yes — when configured with multi-channel power meter modules and an external optical switch matrix, the platform supports sequential multi-port IL/PDL mapping with automatic port indexing and result correlation.
Is the system compatible with third-party tunable lasers or power meters?
No — the DV-ILPDL is a tightly integrated hardware-software system; only Auniontech-certified modules ensure synchronization timing, calibration traceability, and algorithmic consistency.
How is calibration maintained across system upgrades or module replacements?
Each module carries factory-applied NIST-traceable calibration coefficients stored in onboard EEPROM; the software automatically loads and applies these during initialization.
Does the system support automated pass/fail decision logic based on user-defined limits?
Yes — the ILPDL Control Suite allows definition of per-channel, per-wavelength, or integrated-bandpass pass/fail thresholds with configurable alert outputs (email, GPIO, or log file trigger).
