Jihepu ICX41M Inverted Metallurgical Microscope

Overview

The Jihepu ICX41M Inverted Metallurgical Microscope is engineered for high-precision microstructural analysis of metallic and alloy specimens—particularly those requiring observation from the underside, such as bulk samples, heat-treated sections, or specimens mounted in resin without top-surface preparation. Its inverted optical architecture positions the objectives beneath the stage and the specimen above, enabling stable imaging of heavy, irregular, or thermally sensitive samples without interference from objective lens clearance constraints. The system employs an infinity-corrected achromatic optical path optimized for metallurgical contrast enhancement, supporting both brightfield and darkfield illumination modes. Designed for routine QC laboratories, foundry R&D departments, and university materials science facilities, the ICX41M delivers consistent resolution across its full magnification range (50× to 750×), with parfocal, parcentric objectives ensuring minimal refocusing during objective changes.

Key Features

• Inverted rigid cast-metal frame with anti-corrosion surface treatment for long-term mechanical stability and vibration damping.
• Ergonomic low-hand-position coaxial coarse/fine focus mechanism: 9 mm total coarse travel (6.5 mm upward, 2.5 mm downward), 2 µm fine-focus increment, with slip-prevention tension adjustment.
• 360° rotating binocular head with 45° inclination, interpupillary adjustment (50–75 mm), and dual-view port configuration (100:0 or 0:100 beam-splitting ratio).
• Five-position objective turret with internal positioning and built-in magnification sensor; compatible with both brightfield-only and brightfield/darkfield configurations—including DIC (Differential Interference Contrast) slots.
• Dual-iris illumination system: independently centerable field diaphragm and aperture diaphragm, plus filter holder and polarizer/analyzer slots for quantitative contrast control.
• Integrated infrared proximity sensor and real-time objective magnification display on LED brightness indicator bar.
• Three-layer mechanical stage (240 × 250 mm footprint) with 50 × 50 mm travel range, dual linear rail transmission, and right-hand low-profile control knobs.

Sample Compatibility & Compliance

The ICX41M accommodates standard metallographic specimens up to 30 mm in thickness and 150 mm in diameter—ideal for as-cast, forged, welded, or heat-treated cross-sections. Its long working distance objectives (≥8.5 mm at 10×, ≥2.1 mm at 50×) permit unobstructed access to specimens with elevated surface topography or embedded mounting media. The microscope supports ISO 4037-3, ASTM E3-22, and GB/T 13298–2015 standards for metallographic specimen preparation and evaluation. While not pre-certified for GLP/GMP environments, its mechanical repeatability, calibrated magnification feedback, and stable illumination output enable traceable documentation when paired with external digital capture systems compliant with FDA 21 CFR Part 11 requirements.

Software & Data Management

The ICX41M operates as a hardware platform for third-party image acquisition and analysis solutions. It features C-mount interface compatibility (with optional 0.35×, 0.5×, 0.65×, or 1.0× reduction lenses) for integration with USB3.0 or HDMI-capable CMOS cameras. Optional accessories include fixed and rotatable analyzer plates, precision micrometers (0.01 mm graduation), and DIC prism sets for phase-gradient visualization. Though no proprietary software is bundled, the microscope’s standardized optical interfaces and consistent magnification reporting allow seamless alignment with commercial packages such as Olympus Stream, Zeiss ZEN, or open-source tools like ImageJ/Fiji—supporting measurement calibration, grain size quantification per ASTM E112, and automated phase fraction analysis.

Applications

• Microstructural characterization of ferrous and non-ferrous alloys (e.g., grain boundary delineation, inclusion analysis, precipitate morphology).
• Quality control of weld integrity, casting porosity, and heat-affected zone (HAZ) assessment in aerospace and automotive components.
• Failure analysis of fatigue cracks, intergranular corrosion, and stress corrosion cracking in service-exposed parts.
• Research-level investigation of phase transformations during thermal cycling, using polarized light or darkfield contrast to enhance refractive index differences.
• Educational use in materials engineering curricula for hands-on metallography training under standardized ASTM E3 protocols.

FAQ

Does the ICX41M support DIC or polarization contrast out of the box?

The base configuration includes DIC-compatible objective turrets and slot-mounted polarizer/analyzer holders, but DIC prisms and strain-free objectives must be ordered separately.

Is the microscope compatible with automated stage control or motorized focus?

No—the ICX41M uses manual mechanical controls exclusively; however, its C-mount and standardized stage dimensions allow aftermarket retrofitting with OEM-compatible stepper-motor kits.

What is the maximum specimen weight the stage can support?

The reinforced stage and inverted frame support specimens up to 5 kg without measurable deflection or focus drift.

Can the ICX41M be upgraded to include digital image analysis capabilities?

Yes—by adding a calibrated C-mount camera and third-party software licensed for metrology-grade measurements, users may achieve compliance with ISO/IEC 17025 documentation requirements.

Are replacement objectives available with oil immersion capability?

Standard objectives are dry-type only; oil-immersion variants (e.g., 100×/NA 0.90) are not offered in the ICX41M series due to inverted geometry constraints and working distance limitations.