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TPT HB05 Wedge & Ball Bonding Machine

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Brand TPT
Origin Germany
Model HB05
Bonding Methods Wedge-Wedge, Ball-Wedge, Ribbon & Bump Bonding
Wire Diameter Range 17–75 µm (gold/aluminum)
Ribbon Size Max 25 × 250 µm
Ultrasonic Frequency 62 kHz, PLL-controlled
Ultrasonic Power Output 0–5 W
Bond Time 0–1 s
Bond Force 5–130 cNm
Capillary/Tool Ø1.58 mm, L=19 mm
Bond Head Depth Capacity 16 mm
Bond Arm Length 165 mm
Stage Fine-Adjustment Travel 10 mm (6:1 reduction ratio)
Temperature Control Up to 250 °C ±1 °C
Power Supply 100–240 V AC, ±10%, 50/60 Hz, max. 10 A
Dimensions (W×D×H) 550 × 450 × 250 mm
Net Weight 25 kg

Overview

The TPT HB05 Wedge & Ball Bonding Machine is a compact, benchtop thermosonic bonding system engineered for precision interconnect formation in semiconductor R&D labs, prototyping facilities, and low-volume pilot production lines. It implements thermosonic bonding—combining controlled heat, ultrasonic energy, and precise mechanical force—to form reliable metallurgical bonds between wire or ribbon conductors and substrate pads (e.g., Au, Al, Cu on Si, GaAs, or ceramic substrates). Unlike dedicated single-mode bonders, the HB05 supports multiple bonding configurations—including wedge-wedge, ball-wedge, ribbon, and bump bonding—within a single platform, enabled by interchangeable tooling and programmable parameter sets. Its modular architecture allows rapid reconfiguration between gold wire (17–75 µm), aluminum wire (17–75 µm), and flat ribbon (up to 25 × 250 µm), making it suitable for diverse packaging technologies such as RF modules, MEMS sensors, power devices, and advanced heterogeneous integration.

Key Features

  • Multi-mode bonding capability: Switch seamlessly between ball, wedge, ribbon, and bump bonding via tool exchange and software-defined process mapping.
  • High-resolution motorized wire clamp and tail control ensures consistent loop geometry and repeatable wire breakage at bond termination.
  • Deep-cavity bond head with 16 mm vertical access accommodates high-profile packages, stacked dies, and thick substrates without mechanical interference.
  • 4.3-inch LCD interface with dedicated function keys enables intuitive real-time adjustment of all critical parameters—including bond force, ultrasonic power, time, temperature, and Z-axis trajectory.
  • Integrated 62 kHz PLL-synchronized ultrasonic generator delivers stable, frequency-locked output (0–5 W) with minimal drift under thermal load—critical for reproducible intermetallic formation.
  • Thermal subsystem maintains heater block temperature within ±1 °C across the full 25–250 °C operating range, compliant with JEDEC J-STD-020 moisture sensitivity level (MSL) preconditioning requirements.
  • 20-user-programmable recipes stored onboard support rapid process transfer between operators and shift changes without external PC dependency.

Sample Compatibility & Compliance

The HB05 accommodates standard semiconductor package formats including QFN, SOIC, DFN, TO-can, and custom ceramic/metal substrates. Its 165 mm bond arm reach and 10 mm fine-adjustment stage (6:1 mechanical reduction) enable accurate placement on die pads with ±2 µm positional repeatability under calibrated conditions. The system complies with IEC 61000-6-2 (immunity) and IEC 61000-6-4 (emission) standards. All thermal and ultrasonic parameters are traceable and loggable—supporting GLP/GMP-aligned documentation workflows. While not certified to ISO 13485 or FDA 21 CFR Part 11 out-of-the-box, audit-ready data export (CSV/TXT) and timestamped parameter logs facilitate internal validation per USP analytical instrument qualification protocols.

Software & Data Management

The HB05 operates independently via its embedded controller; no host PC is required for routine operation. All 20 program slots store complete parameter sets—including force ramp profiles, ultrasonic burst sequencing, temperature ramp rates, and Z-axis motion paths. Parameter changes are logged with timestamps and operator ID (via optional USB keyboard input). Exportable logs include bond count, error codes (e.g., wire break, misbond, timeout), and thermal cycle history—enabling SPC analysis using third-party tools. Firmware updates are performed via USB flash drive, ensuring version control and traceability in regulated environments.

Applications

  • R&D validation of new wire alloys (e.g., palladium-coated Cu, Ag-alloy wires) and ribbon geometries for high-current applications.
  • Process development for flip-chip underfill dispensing alignment verification using ball-bonded fiducials.
  • Reliability testing (e.g., temperature cycling, HAST) requiring consistent bond heel geometry and intermetallic layer thickness.
  • Low-volume manufacturing of medical implantable devices where lot traceability and parameter lockout are mandatory.
  • Failure analysis lab use—re-bonding lifted leads or reconstructing interconnects for cross-section SEM/EDS correlation.

FAQ

Does the HB05 support automated vision alignment?
No—the HB05 is a manually aligned, operator-guided system. Vision-assisted alignment requires external microscope integration and is not natively supported.
Can aluminum wire bonding be performed at room temperature?
Aluminum wedge bonding typically requires elevated substrate temperature (≥150 °C) to achieve sufficient ductility and oxide disruption; the HB05’s thermal control supports this requirement.
Is the ultrasonic transducer serviceable in-field?
Yes—transducer replacement is designed for field maintenance by certified technicians using standard torque tools and calibration fixtures.
What is the recommended preventive maintenance interval?
TPT recommends quarterly inspection of ultrasonic horn wear, capillary tip geometry (via SEM), and Z-axis linear guide lubrication—documented in the included Maintenance Logbook.
Does the system meet CE marking requirements?
Yes—the HB05 carries CE marking per Directive 2014/30/EU (EMC) and 2014/35/EU (LVD), with technical documentation available upon request for EU-based end-users.

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