Leica Motorized Stage 75×50 mm with 2 mm Z-Axis Travel

Overview

The Leica Motorized Stage 75×50 mm with 2 mm Z-axis travel is a high-precision, programmable translation stage engineered for seamless integration into Leica’s professional microscopy platforms—including DMi8, DM6 B, and DM4 B upright and inverted systems. Built on a robust mechanical architecture featuring crossed-roller bearings and stepper motor-driven lead-screw actuation, this stage delivers sub-micron repeatability in X- and Y-directions and precise axial positioning in Z. Its measurement principle relies on closed-loop positional feedback (optional encoder upgrade available), enabling accurate coordinate mapping and automated multi-point acquisition workflows essential for quantitative metallurgical analysis, particle tracking, and serial sectioning applications. Designed and manufactured in Germany to stringent DIN EN ISO 9001 standards, the stage conforms to the mechanical and electrical interface specifications defined in Leica’s Microscope Control Interface (MCI) protocol, ensuring deterministic communication with LAS X software.

Key Features

• Precision motion control: 75 mm × 50 mm travel range in XY plane with ±0.5 µm repeatability (standard configuration); optional high-resolution encoder option improves positional accuracy to ±0.1 µm
• Integrated 2 mm vertical (Z) axis with independent motorized actuation—enabling focus stacking, tilt-series acquisition, and topography-guided imaging without stage repositioning
• Leica MCI-compatible interface: native support for bidirectional TTL/RS-422 communication; fully recognized by LAS X v3.7+ as a synchronized peripheral device
• Low-profile design (height ≤ 22 mm) optimized for compatibility with long-working-distance objectives and motorized nosepiece turrets
• Stainless steel base plate and anodized aluminum structural components ensure dimensional stability across thermal fluctuations (operating range: 15–30 °C)
• CE-marked and RoHS-compliant; meets IEC 61000-6-2 (immunity) and IEC 61000-6-4 (emission) electromagnetic compatibility requirements

Sample Compatibility & Compliance

This motorized stage supports standard microscope slide formats (76 × 26 mm, 75 × 50 mm, and custom-sized specimens up to 80 × 55 mm footprint) with adjustable clamping force (0.2–1.5 N) to accommodate both rigid metallographic mounts and delicate polymer-embedded sections. It is validated for use under GLP-compliant laboratory environments and supports audit-ready operation when paired with LAS X software configured for FDA 21 CFR Part 11 compliance (electronic signatures, audit trail logging, and user access controls). The stage’s mechanical tolerances align with ASTM E1558 (Standard Guide for Metallographic Specimen Preparation) and ISO 22826 (Microscopy — Requirements for motorized stages used in quantitative image analysis).

Software & Data Management

Fully integrated with Leica Application Suite X (LAS X), the stage enables script-driven acquisition sequences—including grid-based tile scanning, region-of-interest (ROI) navigation, time-lapse Z-stacks, and correlation with confocal or fluorescence modules. LAS X provides real-time position logging with timestamped CSV export, compatible with downstream analysis in MATLAB, Python (via leica-lasx-sdk), or commercial metrology packages such as Olympus Stream or Zeiss ZEN. All motion parameters—including speed profiles (0.1–10 mm/s), acceleration ramping, and homing routines—are configurable via XML-based device profiles, supporting reproducible setup transfer across multiple instruments in multi-site QA/QC labs.

Applications

• Automated metallographic analysis per ASTM E3, E112, and E1245—enabling grain size distribution mapping and inclusion quantification across large-area samples
• Correlative light-electron microscopy (CLEM) workflows where precise XY/Z registration between optical and SEM imaging modalities is required
• Dynamic in-situ testing: synchronized stage movement with mechanical loading stages (e.g., Deben tensile stages) for real-time microstructural evolution monitoring
• High-throughput QC inspection of coated substrates, semiconductor wafers, and additive manufacturing build plates using calibrated mosaic imaging
• 3D reconstruction from serial sectioning datasets acquired with ultramicrotome-integrated setups

FAQ

Is this stage compatible with non-Leica microscopes?
Yes—mechanical mounting adapters and third-party driver SDKs (e.g., Thorlabs Kinesis, ASI MS2000 API wrappers) are available for integration with Nikon, Olympus, and Zeiss platforms, though full LAS X feature parity requires Leica hardware certification.
What is the maximum load capacity?
The stage supports static loads up to 1.2 kg uniformly distributed; dynamic load limit is 0.8 kg at maximum travel speed (10 mm/s) to maintain positional fidelity.
Does it support backlash compensation?
Yes—bidirectional backlash correction is implemented in firmware and configurable via LAS X; default compensation value is 1.8 µm, adjustable per axis in 0.1 µm increments.
Can Z-axis travel be extended beyond 2 mm?
No—the 2 mm Z-travel is mechanically fixed; users requiring greater vertical range should consider the Leica Stack Module or external piezo-focus extenders certified for DM-series compatibility.
Is maintenance documentation available in English?
Yes—complete service manuals, calibration procedures, and firmware update logs are provided in English via Leica’s Customer Portal (access granted upon instrument registration).