ANALYSIS HC300SE 12-Inch Programmable Spin Coater
| Brand | ANALYSIS |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | HC300SE |
| Rotation Speed | 5000 rpm |
| Rotation Accuracy | ±50 rpm |
| Maximum Acceleration | 30,000 rpm/s |
| Substrate Diameter | 300 mm (12") |
| Chamber Diameter | 427 mm |
| Control Interface | Touchscreen + RS-232/USB/Ethernet |
| Process Memory | ≥200 user-defined programs |
| Vacuum Chuck Type | Pneumatic or electrostatic (configurable) |
| Power Supply | 220 V AC, 50/60 Hz |
Overview
The ANALYSIS HC300SE is a high-precision, fully programmable spin coater engineered for reproducible thin-film deposition on 300 mm (12-inch) semiconductor wafers and large-area substrates. It operates on the principle of centrifugal force-driven fluid dispersion: a controlled volume of photoresist, polymer solution, or functional ink is dispensed onto a stationary substrate, which is then accelerated to a defined rotational speed—typically ranging from 500 to 5000 rpm—and held for a programmable duration. During rotation, solvent evaporation and viscous shear govern film thickness, with final uniformity governed by process repeatability, acceleration profile control, and environmental stability. Designed for R&D labs and pilot-line fabrication environments, the HC300SE supports rigorous process development in advanced packaging, MEMS, perovskite photovoltaics, organic electronics, and 2D material transfer applications where nanoscale thickness control and inter-run consistency are critical.
Key Features
- High-resolution rotational control with ±50 rpm accuracy across the full 500–5000 rpm range, ensuring sub-nanometer thickness repeatability under identical dispense and bake conditions.
- Ultra-fast acceleration capability up to 30,000 rpm/s enables precise emulation of industrial-grade spin profiles—including multi-step ramp-hold sequences—to replicate production-relevant shear histories.
- 427 mm stainless-steel vacuum chamber with inert gas purge port (N₂ or Ar) minimizes solvent oxidation and suppresses edge bead formation during high-speed spinning.
- Modular chuck system compatible with both pneumatic and electrostatic substrate holding—supporting bare Si, SOI, glass, quartz, flexible PI, and metal foils up to 300 mm diameter.
- Integrated touchscreen HMI with real-time parameter logging, password-protected user levels, and audit-trail-enabled operation history (compliant with GLP documentation requirements).
- Standard communication interfaces (RS-232, USB, Ethernet) enable seamless integration into automated lab networks and compatibility with third-party MES or LIMS platforms.
Sample Compatibility & Compliance
The HC300SE accommodates substrates from 100 mm to 300 mm in diameter, including standard SEMI-spec silicon wafers, fused silica masks, ITO-coated glass, and flexible polymer films. Its chamber geometry and chuck design conform to SEMI S2-0215 safety guidelines for rotating equipment. The system supports ISO Class 5 cleanroom operation when installed with optional laminar flow hoods and HEPA-filtered exhaust. All firmware and software modules comply with FDA 21 CFR Part 11 requirements for electronic records and signatures when configured with time-stamped audit logs and role-based access control.
Software & Data Management
The embedded controller runs ANALYSIS SpinOS v3.2 firmware, offering intuitive drag-and-drop recipe building with up to 200 stored protocols. Each protocol includes independent settings for dispense volume, spin start delay, acceleration rate, target speed, hold time, and deceleration profile. Raw process data—including actual rpm vs. time traces, vacuum status, and ambient temperature—is timestamped and exportable in CSV format. Optional PC-based SpinView Pro software provides statistical process control (SPC) charts, thickness correlation modeling (via integrated optical reflectometry interface), and batch reporting aligned with ISO/IEC 17025 calibration traceability frameworks.
Applications
- Photolithography process development for 28 nm–130 nm node prototyping, including resist optimization, edge bead removal studies, and adhesion promoter evaluation.
- Perovskite solar cell fabrication requiring ultra-uniform PbI₂ or FA-based precursor layers with thickness control below ±2 nm over 300 mm area.
- Graphene oxide and MXene film deposition for flexible sensors, where solvent choice, spin kinetics, and drying dynamics directly impact sheet resistance and morphology.
- Dielectric layer spin-coating for GaN-on-Si power devices, demanding low pinhole density and dielectric strength validation via post-cure breakdown testing.
- Microfluidic channel patterning using SU-8 or PDMS precursors, where aspect ratio fidelity depends on controlled solvent retention during spin-off.
FAQ
What substrate materials can be processed in the HC300SE?
Silicon, sapphire, quartz, borosilicate glass, stainless steel, copper foil, PET, PI, and other rigid or semi-flexible substrates up to 300 mm in diameter and 5 mm in thickness.
Is the system compatible with hazardous solvents such as HMDS or PGMEA?
Yes—the chamber is constructed from electropolished 316L stainless steel and features chemical-resistant O-rings; optional explosion-proof motor and solvent recovery interface are available upon request.
Can the HC300SE be integrated into a Class 100 cleanroom environment?
Yes—standard configuration meets ISO 14644-1 Class 5 when coupled with certified laminar airflow and filtered exhaust ducting; full cleanroom qualification documentation is provided.
Does the system support automated dispense synchronization?
Yes—TTL-triggered syringe pump control is supported via dedicated I/O ports, enabling precise coordination between dispense onset and spin initiation.
What calibration and maintenance services are offered?
ANALYSIS provides annual on-site calibration (traceable to NIST standards), rpm verification with optical tachometer, vacuum integrity testing, and preventive maintenance packages aligned with SEMI E10 reliability guidelines.



