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| Brand | SPECREATION |
|---|---|
| Model | TableXES-V2k |
| Origin | Anhui, China |
| Instrument Type | Benchtop XES/XAFS Spectrometer |
| X-ray Source | 1.2 kW Sealed-Tube X-ray Tube (Customizable Anode Material) |
| Energy Range | 4.5–20 keV (Single-scan range >600 eV at 7–9 keV) |
| Energy Resolution | 0.5–1.5 eV (at 7–9 keV, XANES region) |
| Monochromator | Spherical bent crystal (Si or Ge), 100 mm aperture, 500 mm radius |
| Photon Flux | 5×10⁵–1×10⁶ photons/sec @ 9 keV |
| Detector | Silicon Drift Detector (SDD) |
| Sample Carousel | 7–16-position motorized sample wheel |
| Scan Mechanism | High-precision goniometric stage with thermal drift compensation |
| Safety | Interlocked radiation shielding compliant with IEC 61010-1 and GBZ 117-2020 |
| Optional Modes | Fluorescence-detected XAFS (FD-XAFS), Resonant Inelastic X-ray Scattering (RIXS)-compatible XES, In Situ/Operando cell integration |
| Brand | SPECREATION |
|---|---|
| Model | TableXAFS-500 |
| Origin | Anhui, China |
| X-ray Source Power | 1.2 kW |
| Monochromatic Photon Flux | 500,000–1,000,000 photons/sec @ 9 keV |
| Detectable Elemental Concentration Limit | ≥1 wt% |
| Tunable X-ray Energy Range | 5–20 keV |
| XAFS Scan Speed | 20 eV/min |
| Energy Resolution | 0.5–1.5 eV (near-edge, 7–9 keV) |
| Monochromator Crystal | 100 mm diameter, R = 500 mm spherical Si or Ge bent crystal |
| Detector | Silicon Drift Detector (SDD) |
| Sample Carousel Capacity | 7–16 positions |
| Single-Scan Energy Coverage | >600 eV @ 7–9 keV |
| Brand | SPECREATION |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | Custom Configurable |
| Price | Upon Request |
| Spectral Resolution | 0.07 nm @ 50 µm Slit Width |
| Brand | SPECREATION |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic |
| Model | CP-EFlat |
| Price Range | USD 70,000 – 125,000 |
| Optical Design | Grazing-Incidence Concave Varied-Line-Spacing (VLS) Flat-Field Spectrograph |
| Detector Type | CCD (Charge-Coupled Device) |
| Wavelength Range | 1–200 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ±0.05 nm |
| Spectral Bandwidth | 0.1–5.0 nm (adjustable) |
| Stray Light | ≤0.01% T |
| Slit Width | 0.05–0.5 mm (motorized, continuous adjustment) |
| Flat-Field Imaging Area | 25 mm |
| Vacuum Performance | ≤1×10⁻⁴ Pa (UHV option available: ≤1×10⁻⁸ Pa) |
| Grating Options | 120, 300, 1200, 2400 g/mm (dual-grating vacuum-compatible turret mount) |
| Resolution (FWHM) | 0.01–0.3 nm (grating-dependent) |
| Zero-Order Blocker | Standard |
| Filter Holder | Standard |
| Laser Alignment Aid | Integrated visible (635 nm) alignment diode |
| Software Control | LabVIEW-based platform with wavelength calibration traceability to NIST-traceable emission lines |
| Brand | SPECREATION |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Model | CP-SR |
| Spectral Resolution | 0.1 nm @ 37.93 nm (tunable via grating selection) |
| Wavelength Range | 10–300 nm |
| Brand | SPECREATION |
|---|---|
| Origin | Anhui, China |
| Model | TableXAFS-3000 |
| X-ray Source Power | 2.0 kW Mo anode with high-performance power supply (optional foreign source upgrade) |
| Monochromatic X-ray Photon Flux | 2.5 × 10⁶ photons/s |
| Minimum Detectable Elemental Concentration | < 0.5 wt% |
| Tunable X-ray Absorption Energy Range | 4.5–20 keV |
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