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| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus II |
| Excitation Source | End-window Rh-target X-ray tube (3 kW or 4 kW) |
| High-voltage Generator | High-frequency inverter type |
| Max. Output | 60 kV / 150 mA (4 kW) |
| Stability | ±0.005% (against ±10% AC line fluctuation) |
| Cooling | Integrated water-cooling system |
| Sample Changer Capacity | Up to 48 positions |
| Sample Dimensions | Ø51 mm × 40 mm (H) |
| Analyzed Area | Up to Ø35 mm |
| Sample Rotation | 30 rpm |
| Primary Beam Filters | Al, Ti, Cu, Zr (4-position auto-switch) |
| Collimators | 6 automatic apertures (Ø35, 30, 20, 10, 1, 0.5 mm) |
| Divergence Slits | 3 types (standard, high-resolution, ultra-light-element option) |
| Receiving Slits | SC and F-PC compatible |
| Goniometer | Independent θ–2θ drive |
| Angular Range | SC: 5°–118°, F-PC: 13°–148° |
| Max. Scan Speed | 1400°/min (2θ) |
| Continuous Scan Rate | 0.1–240°/min |
| Crystal Changer | 10-position auto-exchange |
| Standard Crystals | LiF(200), Ge, PET, RX25 |
| Optional Crystals | LiF(220), RX4, RX9, RX35–RX80, RX61F, TAP |
| Vacuum System | Dual-chamber rapid evacuation (dual-pump configuration) |
| Detectors | SC scintillation counter (1000 kcps linearity) for heavy elements |
| Pulse Height Analyzer (PHA) | Auto-adjustment (PAS, Rigaku patent) |
| F-PC Anode Wire Cleaning | Automatic thermal cleaning (ACC, Rigaku patent) |
| Optional Accessories | He purge module (with baffle), temperature-controlled sample stage (36.5 °C), CCD-based micro-imaging (100 µm resolution, 0.5 mm micro-area analysis & mapping), r-θ sample stage (Rigaku patent) |
| Software | NEW SQX (qualitative ID, background subtraction, smoothing, peak deconvolution, calibration curve method per JIS, matrix correction, standardless quantification, EZ-scan templates, auto-aperture selection, precision testing, email reporting, multi-standard management) |
| Compliance | Designed for GLP/GMP environments |
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