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| Origin | Japan |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Imported |
| Model | IPX-LC |
| Pricing | Upon Request |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Ultima IV Series |
| Instrument Type | Powder X-ray Diffractometer |
| X-ray Generator Power | 3 kW |
| Goniometer | Horizontal Type |
| Minimum Angular Step | 0.0001° |
| Optical System | CBO Cross-Beam Optics (Patented) |
| Detector | D/teX-Ultra High-Speed Energy-Dispersive Detector |
| Optional Modules | In-Plane Geometry Unit, Small-Angle X-ray Scattering (SAXS) Module, Thin-Film Analysis Module, Micro-Beam Mapping Unit, XRD-DSC Simultaneous Measurement System |
| Software Suite | PDXL (with Rietveld), NANO-Solver, GXRR, and XRD Analysis Package |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | SmartLab Series |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| X-ray Generator Power | 3 kW standard, optional 9 kW rotating anode |
| Goniometer Minimum Step | 0.0001° (1/10,000°) |
| Angular Accuracy | Dual optical encoder, direct-on-axis positioning |
| Optical System | CBO Cross-Beam Optics (patented) |
| Detector Options | D/teX-Ultra high-speed energy-discriminating detector (energy resolution <20%), PILATUS 100K/R 2D pixel array detector |
| Software | SmartLab Guidance (patented intelligent measurement & analysis platform) |
| Optional Modules | SAXS/Ultra-SAXS, thin-film analysis (including In-Plane geometry), micro-area mapping (CBO-F optics), monochromated Kα₁ beam optics |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| X-ray Generator Power | 3 kW |
| Goniometer Type | Horizontal |
| Goniometer Radius | 300 mm |
| Programmable Variable Slit | Yes |
| Minimum Step Size | 0.0001° |
| Optical System | CBO Cross-Beam Optics (Patented by Rigaku) |
| Detectors | D/teX Ultra250 (0D/1D mode), HyPix-400 Semiconductor Array Detector (0D/1D/2D mode) |
| Software | SmartLab Studio II |
| Sample Viewing | Integrated Video Observation System |
| Compliance | Designed for ASTM E975, ISO 17892-12, and JIS Z 8821 applications |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | D/max-2600/PC |
| X-ray Generator Power | 9 kW |
| Goniometer Type | Vertical or Horizontal Wide-Angle |
| Minimum Step Angle | 0.0001° |
| Variable Aperture Slit | Programmed |
| Optical Configurations | Focusing and Parallel Beam (Switchable) |
| Monochromator | High-Efficiency Graphite |
| Detector | D/teX-Ultra (Energy Resolution <20%) |
| Automation | Fully Automated Alignment & Calibration |
| Software Suite | Comprehensive XRD Analysis Package |
| Sample Types | Powder, Bulk, Thin Film, Micro-region, Trace |
| Environmental Capabilities | In-situ HT/VT/LT, Humidity, Electrochemical, Magnetic Field |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Floor-Standing |
| Detector | PILATUS200K Hybrid Pixel Array Detector |
| Detector Pixel Size | 172 µm |
| Dynamic Range | 1 × 10⁶ photons/pixel |
| Operating Temperature | Ambient (No Cryogenic Cooling Required) |
| X-ray Source Options | MicroMax003 (Cu or Mo), DualSource (Cu + Mo), MicroMax007HF, MicroMax007HF-DW, MultiMax9 |
| Goniometer Types | Partial χ, Fixed χ, Three-Axis AFC-Kappa, Four-Axis Kappa |
| Optional Accessories | Low-Temperature Device (e.g., Oxford Cryostream) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | XtaLAB Synergy |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Stability | < 0.0001 (unitless, indicating angular reproducibility or beam stability per manufacturer specification) |
| Detector | HyPix-6000HE Photon-Counting Pixel Array Detector |
| Detector Active Area | 77.5 mm × 80.0 mm |
| Pixel Size | 100 µm × 100 µm |
| Cooling Method | Air-Cooled |
| Dynamic Range | Up to 31-bit equivalent |
| Readout Mode | Shutterless, 0-ms dead time |
| Goniometer | AFC-Kappa Four-Axis |
| X-ray Source Options | Microfocus Sealed-Tube (Cu/Mo), MM007HF Rotating Anode, FR-X High-Brilliance Rotating Anode |
| Anode Materials | Cu, Mo, or Dual Cu/Mo |
| Cryogenic Capability | Integrated Low-Temperature System (e.g., Oxford Instruments Cryostream-compatible) |
| Software Suite | CrysAlisPro (data collection & processing), AutoChem (automated structure solution and refinement) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | NANOPIX |
| Instrument Type | Integrated SAXS/WAXS Scattering System |
| Measurement Range (q) | 0.02 – 5.0 nm⁻¹ (corresponding to real-space d-spacing: 0.16 – 288 nm) |
| Beam Size | Ø70 µm |
| Sample Requirement | ≥ few mg (solid), ≥ few µL (liquid) |
| Data Acquisition Time | As low as <60 s per frame (depending on flux, sample scattering power, and detector integration time) |
| X-ray Source | MM007HF microfocus rotating anode or FR-X sealed-tube source |
| Beam Conditioning | Selectable pinhole collimation (1-, 2-, or 3-pinhole configurations) |
| Sample Stages | GI-SAXS/WAXS stage, cryo/variable-temperature stage (−150 °C to +400 °C), vacuum-compatible stage, tensile stage, multi-axis goniometer |
| Detector | HyPix-3000 or HyPix-6000 hybrid pixel array detector (2D) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | 2991F2 |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Floor-Standing |
| X-ray Target | Cu |
| Max. Tube Voltage/Current | 30 kV / 5 mA |
| Cooling | Air-Cooled |
| Angular Range | 2θ = 0°–110°, θ = −10°–60° |
| Angular Resolution | 30 arcseconds (total system accuracy) |
| Detector | 2-inch Scintillation Counter |
| Output | Analog Signal |
| Time Constants | 0.1 s / 0.4 s (switchable) |
| Beam Shielding | 1 mm Pb-lined metal enclosure |
| Dimensions (per shield) | 580 mm (W) × 730 mm (D) × 530 mm (H) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | D/max RAPID |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-Standing |
| X-ray Source Options | 3 kW Sealed-Tube or 18 kW Rotating-Anode Anode |
| Detector | Large-Area Cylindrical 2D Imaging Plate (IP), 466 mm × 256 mm |
| Angular Range | –60° to +144° 2θ |
| Beam Conditioning | Incident-Beam Monochromator |
| Collimators | 800, 300, 100, 50, 30 µm (optional 10 µm) |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |
| Brand | Rigaku |
|---|---|
| Origin | Beijing, China |
| Model | Clayquan II |
| Compatibility | Windows XP/Vista/2003/7 (Chinese), Microsoft Office 2003/2007 |
| Output Format | .xls |
| Standards Compliance | SY/T 5160–2010, SY/T 5477–2003, SY/T 5163–2010 |
| Mineral Coverage | Smectite (S), Illite/Smectite mixed-layer (I/S), Illite (It), Kaolinite (Kao), Chlorite (C), Chlorite/Smectite mixed-layer (C/S), Palygorskite (Pa), Vermiculite (V), Illite/Vermiculite mixed-layer (I/V), Pyrophyllite (Py), Talc (Ta), Serpentine (Se) |
| Mixed-layer ratio calculation | Supported for I/S, I/V, C/S |
| Quantitative method | Reference Intensity Ratio (RIR) with internal standard correction and peak deconvolution |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | SmartSite RS |
| Weight | 3 kg |
| Dimensions (Test Head) | 114 mm (W) × 248 mm (D) × 111 mm (H) |
| Detector Type | Dual semiconductor-based 2D area detectors |
| X-ray Source | Microfocus sealed-tube anode (Cr, Fe, Co, Cu selectable) |
| ψ-angle range | −60° to +60° |
| 2θ-angle range | 70° to 160° (adjustable per material and reflection) |
| Safety | Integrated laser alignment, 3-axis accelerometer for tilt monitoring, optional lead-lined shielding enclosure for lab use |
| Control Interface | Android-based touchscreen tablet with LAN/Wi-Fi connectivity |
| Compliance | IEC 61000-6-3, IEC 61000-6-4, JIS Z 4901:2020 (X-ray equipment safety), ISO 21940-11 (residual stress measurement — XRD method) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | MiniFlex 600 |
| Instrument Type | Benchtop Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| Power Output | 600 W |
| Dimensions (W×H×D) | 560 × 700 × 395 mm |
| Weight | ~80 kg |
| Safety | Interlocked X-ray shutter with automatic beam cutoff during sample loading |
| Detector | Compatible with D/teX Ultra2 high-speed 1D array detector |
| Optional Accessories | Monochromator (Kβ suppression), Rotating Sample Stage, Air/Moisture-Sensitive Sample Stage, 6-Position Auto-Sampler |
| Software Suite | PDXL (Qualitative & Quantitative Analysis), ICDD PDF-4+ Database Integration, Dust Quantification Module (for occupational hygiene applications), Multi-Scan Acquisition, Rietveld Refinement (optional module) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix 14 |
| Element Range | Be (4) to U (92) |
| Simultaneous Channels | Up to 40 |
| Detection Limit | 0.0001% |
| Analytical Range | 0.0001% – 100% |
| Footprint | 1 m² |
| Light Element Capability | Be, B, C, N, O, F |
| Vacuum Control | APC (Automatic Pressure Control) |
| Sample Changer Options | ASC8 (standard), ASC20/50/100 (optional) |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | GOX Series |
| Pricing | Upon Request |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | XtaLABmini |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Benchtop |
| X-ray Source | Mo Kα, 600 W high-frequency generator |
| Goniometer Axes | χ fixed at 54°, Φ rotation: −360° to +360° about sample center axis, ω range: 2θ ± 90° (−60° to +120°), 2θ fixed at 30° |
| Sample Viewing | 70× CCD microscope with 50 mm camera-to-sample distance |
| Detector | CCD, active area Φ75 mm, pixel sizes 73.2 µm / 146.4 µm, resolution modes 1024 × 1024 / 512 × 512, readout times 2.24 s / 0.56 s, dark current 0.1 e⁻/pixel/s |
| Optional | Cryogenic sample stage (e.g., Oxford Instruments Cryostream-compatible) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus II |
| Excitation Source | End-window Rh-target X-ray tube (3 kW or 4 kW) |
| High-voltage Generator | High-frequency inverter type |
| Max. Output | 60 kV / 150 mA (4 kW) |
| Stability | ±0.005% (against ±10% AC line fluctuation) |
| Cooling | Integrated water-cooling system |
| Sample Changer Capacity | Up to 48 positions |
| Sample Dimensions | Ø51 mm × 40 mm (H) |
| Analyzed Area | Up to Ø35 mm |
| Sample Rotation | 30 rpm |
| Primary Beam Filters | Al, Ti, Cu, Zr (4-position auto-switch) |
| Collimators | 6 automatic apertures (Ø35, 30, 20, 10, 1, 0.5 mm) |
| Divergence Slits | 3 types (standard, high-resolution, ultra-light-element option) |
| Receiving Slits | SC and F-PC compatible |
| Goniometer | Independent θ–2θ drive |
| Angular Range | SC: 5°–118°, F-PC: 13°–148° |
| Max. Scan Speed | 1400°/min (2θ) |
| Continuous Scan Rate | 0.1–240°/min |
| Crystal Changer | 10-position auto-exchange |
| Standard Crystals | LiF(200), Ge, PET, RX25 |
| Optional Crystals | LiF(220), RX4, RX9, RX35–RX80, RX61F, TAP |
| Vacuum System | Dual-chamber rapid evacuation (dual-pump configuration) |
| Detectors | SC scintillation counter (1000 kcps linearity) for heavy elements |
| Pulse Height Analyzer (PHA) | Auto-adjustment (PAS, Rigaku patent) |
| F-PC Anode Wire Cleaning | Automatic thermal cleaning (ACC, Rigaku patent) |
| Optional Accessories | He purge module (with baffle), temperature-controlled sample stage (36.5 °C), CCD-based micro-imaging (100 µm resolution, 0.5 mm micro-area analysis & mapping), r-θ sample stage (Rigaku patent) |
| Software | NEW SQX (qualitative ID, background subtraction, smoothing, peak deconvolution, calibration curve method per JIS, matrix correction, standardless quantification, EZ-scan templates, auto-aperture selection, precision testing, email reporting, multi-standard management) |
| Compliance | Designed for GLP/GMP environments |
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