Empowering Scientific Discovery

Beijing Ruifeng Xianke Technology Co., Ltd.

Categories
  • All
  • Favorite
  • Popular
  • Most rated
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAcculogic
OriginCanada
ModelSCORPION FiS 640
Maximum Test Points1024
Board Size Capacity350 mm × 400 mm
Fixture Change Time< 60 s
Operating SystemWindows-based
Embedded Network AnalyzerYes
Software CompatibilityCompatible with Acculogic Flying Probe Test (FPT) platforms
Footprint1050 mm × 1050 mm
Fixture ReusabilitySupports legacy SCORPION iCT7000 fixtures
Programmable Power Supply IntegrationUp to 4 external iTH 7000-grade units (optional)
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAcculogic
OriginCanada
ModelSCORPION iCT7000
Maximum Test Points8192
Board Size Capacity350 mm × 400 mm
Fixture Change Time< 60 s
Operating SystemWindows-based
Embedded Network AnalyzerYes
Software CompatibilityFlying Probe Tester (FPT) software formats
Power IntegrationUp to 4 external high-performance programmable power supplies
ComplianceDesigned for IPC-A-610, IPC-J-STD-001, and ISO 9001-aligned manufacturing environments
Interface ProtocolSMEMA-compatible (via optional iTH7000 handler integration)
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAcculogic
OriginCanada
ModelFLS980 Series
ConfigurationDual-Sided, Closed-Loop System
Maximum Probe Modules22 (top + bottom)
Minimum Step Resolution1 µm
Positioning Repeatability±10 µm
Programmable Probe Angle±6°
Max PCB Size813 × 965 mm (32″ × 38″)
Max Component Height85 mm
Max Probe Tip Height45 mm
Tip Radius Range50–500 µm
Tip ProfilesNeedle, Cup, Dome
Measurement SpeedUp to 1000 measurements/sec
Analog Test Capability4-wire per probe
Supported Test Modes2-wire, 4-wire, Quasi-4-wire, Powered Functional Test, Boundary Scan (JTAG), NetScan™
Laser-Based Board Warpage CompensationYes
Vision SystemHigh-Resolution Reference Camera with Advanced Image Processing
Motion ArchitectureFrictionless Air-Gap Linear Shuttles
Compliance FrameworkSupports GLP/GMP audit trails, ISO/IEC 17025 traceability workflows, and FDA 21 CFR Part 11–ready software logging (via Integrator™)
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAcculogic
OriginCanada
ModelFLS980Dxi
Motion ControlClosed-loop linear motor shuttles
Minimum Step Resolution1 µm
Positioning Repeatability±10 µm
Maximum Probes22 (top + bottom)
Programmable Probe Tilt±6°
PCB Max Size813 × 965 mm (32″ × 38″)
Max Component Height85 mm
Max Probe Height45 mm
Tip Radius Range50–500 µm
Tip Geometry OptionsNeedle, Cup, Dome
Analog Measurement SpeedUp to 1000 measurements/sec
Measurement Modes2-wire, 4-wire, quasi-4-wire
Stimulus/Measurement ResourcesDual independent channels
Supported Test TypesAnalog, Digital, Mixed-Signal, Boundary Scan (JTAG), NetScan™
Warpage CompensationIntegrated LaserScan™ and high-res fiducial camera
Software PlatformIntegrator™ with motion control & measurement algorithms
Compliance FrameworkSupports GLP/GMP audit trails, ASTM F2627 (for PCB test system validation), ISO/IEC 17025 traceability workflows
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAcculogic
OriginCanada
Manufacturer TypeAuthorized Distributor
Product OriginImported
ModelACCULOGIC FLS980 Series
PricingUpon Request
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAcculogic
OriginCanada
ModelFLS980
ConfigurationDual-Sided, Closed-Loop, Up to 22 Probes
Minimum Step Resolution1 µm
Positioning Repeatability±10 µm
Programmable Probe Tilt±6°
Max PCB Size813 × 965 mm (32″ × 38″)
Max Component Height85 mm
Max Probe Tip Radius50–500 µm
Analog Measurement SpeedUp to 1000 measurements/sec
4-Wire CapabilityFull per probe
Test Channel CountUp to 128 non-multiplexed channels
Warpage CompensationLaserScan + High-Resolution Vision
ComplianceSupports GLP/GMP audit trails, ASTM F2622 (for electronic assembly test systems), ISO/IEC 17025 traceability frameworks
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAcculogic
OriginCanada
ModelFLS980 Series III
Positioning Repeatability±10 µm
Minimum Step Resolution1 µm
Maximum PCB Size813 × 965 mm (32" × 38")
Programmable Probe Angle±6°
Max. Probe Count (Top + Bottom)22
Measurement SpeedUp to 1000 measurements/sec
Electrical Test CapabilitiesAnalog, Digital, Mixed-Signal, Boundary Scan (JTAG), Powered Functional Test (up to GHz range)
Warpage CompensationLaserScan-enabled Z-axis mapping
Vision SystemHigh-resolution fiducial camera with advanced image processing
Compliance SupportASTM F2413-18 (for test system validation), ISO/IEC 17025 traceability framework, GLP/GMP-aligned audit trail in Integrator™ software
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAcculogic
OriginCanada
ModelFLS980 Series III
Positioning Repeatability±10 µm
Minimum Step Resolution1 µm
Max. Configurable Probes22 (dual-sided)
Programmable Probe Tilt Angle±6°
Max. PCB Size813 × 965 mm (32″ × 38″)
Max. Component Height85 mm
Max. Probe Tip Radius Range50–500 µm
Analog Measurement Speedup to 1000 measurements/sec
Test Channel Count (non-multiplexed)up to 128
Laser-Based Board Warpage CompensationYes
Vision SystemHigh-resolution fiducial camera with advanced image processing
ComplianceDesigned for GLP/GMP-aligned test environments
Added to wishlistRemoved from wishlist 0
Add to compare
BrandSUSS MicroTec
OriginGermany
ModelMA300 Gen3
Wafer Size Support200 mm & 300 mm
Alignment Accuracy (Top-Side)±0.5 µm
Alignment ModesTop-Side, Bottom-Side, Infrared (IR)
Exposure MethodContact/Near-Contact Photolithography
Optical SystemMO Exposure Optics®
Application FocusAdvanced Packaging (TSV, RDL, Bumping), MEMS, LED, Power Devices, WLP, Flip-Chip
ComplianceDesigned for ISO Class 5–7 cleanroom integration
Automation LevelFull cassette-to-cassette robotic handling
Added to wishlistRemoved from wishlist 0
Add to compare
BrandSUSS
OriginGermany
ModelMA200 Gen3
Substrate Compatibility≤200 mm wafers & square substrates
Alignment Accuracy (Top-Side)≤0.5 µm
Resolution (Vacuum Contact Mode)<0.8 µm
Resolution (Proximity Mode)≥3.5 µm
Exposure OpticsMO Exposure Optics® with telecentric illumination, HR/LGO mode switching, customizable filters & reduction kits for smaller wafers
Automation LevelFully automated batch processing
ComplianceDesigned for ISO Class 5–7 cleanroom integration, compatible with SEMI S2/S8 safety standards and GLP/GMP-aligned process documentation workflows
Added to wishlistRemoved from wishlist 0
Add to compare
BrandSUSS MicroTec
OriginGermany
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelSUSS MA200 Gen3
PricingUpon Request
Added to wishlistRemoved from wishlist 0
Add to compare
BrandSUSS
OriginGermany
ModelDSC300 Gen3
Wafer Size Support300 mm (optional 200 mm)
Resolution2 µm (line/space)
Overlay Accuracy≤1.0 µm
Depth of Focus (DOF)High (NA-tunable)
Substrate CompatibilitySi, glass, SiC
Max. Warp Tolerance2 mm bow
Optical SystemWynne-Dyson broadband imaging optics
Exposure SourceBroadband UV (g-, h-, i-line compatible)
Operation ModeFull-field projection + continuous scanning
Automation LevelFully automated platform
Added to wishlistRemoved from wishlist 0
Add to compare
BrandTPT
OriginGermany
ModelHB10
Bonding MethodsWedge-Wedge, Ball-Wedge, Ribbon & Bump Bonding
Wire Diameter Range17–75 µm (gold/aluminum)
Ribbon Sizeup to 25 × 250 µm
Ultrasonic Frequency62 kHz, PLL-controlled
Ultrasonic Power Output0–5 W
Bond Time0–10 s
Bond Force5–150 cNm (350 cNm optional)
Motorized Z-Axis Stroke17 mm
Deep-Cavity Bond Head Clearance16 mm
Bond Arm Length165 mm
Touchscreen Interface6.5" LCD
Program Storage Capacity100 recipes
Temperature Control Rangeup to 250 °C (±1 °C)
Power Supply100–240 V AC, ±10%, 50/60 Hz, max. 10 A
Dimensions (W×D×H)680 × 640 × 490 mm
Net Weight42 kg
Added to wishlistRemoved from wishlist 0
Add to compare
BrandSUSS
OriginGermany
ModelMA12 Gen3
TypeSemi-Automatic Mask Aligner for Photolithography
Application ScopeMask & Reticle Manufacturing, Wafer-Level Packaging, MEMS, R&D Prototyping
Alignment Accuracy≤ 1.0 µm (Optical, Off-Axis/IR Options Available)
Maximum Substrate Size200 mm
Max. Wafer Bow Tolerance±2 mm
Resolution≤ 2 µm (Line/Space, with Optimized Resist & Process)
Exposure SourceBroadband UV (i-line, g-line, h-line)
Numerical Aperture (NA)Adjustable
DOFUp to 150 µm (Configurable)
Software ComplianceSupports Audit Trail, User Access Levels, and Electronic Signature per FDA 21 CFR Part 11 Requirements
Added to wishlistRemoved from wishlist 0
Add to compare
BrandTPT
OriginGermany
ModelHB16
Bonding MethodsWedge-Wedge, Ball-Wedge, Ribbon & Bump Bonding
Wire Diameter17–75 µm (Au/Al)
Ribbon Sizeup to 25 × 250 µm
Ultrasonic Frequency62 kHz, PLL-controlled
Bond Force5–150 cNm (350 cNm optional)
Motorized Z-axis Travel17 mm
Motorized Y-axis Travel7 mm
Bond Head Depth16 mm
Bond Arm Length165 mm
Touchscreen Interface6.5" LCD
Program Storage100 recipes
Temperature Controlup to 250 °C ±1 °C
Power Supply100–240 V AC, 50/60 Hz, ≤10 A
Dimensions680 × 640 × 490 mm
Weight42 kg
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAcculogic
OriginCanada
ModelAcculogic FLS980
TypeFlying Probe Tester for PCBs
Positioning Repeatability±10 µm
Minimum Step Resolution1 µm
Programmable Probe Angle±6°
Max. Configurable Probes22 (dual-side)
Max. PCB Size813 × 965 mm (32″ × 38″)
Max. Component Height85 mm
Max. Probe Tip Radius Range50–500 µm
Measurement SpeedUp to 1000 measurements/sec
Electrical Test CapabilityAnalog, Digital, Mixed-Signal, Boundary Scan (JTAG), Powered Functional Test up to GHz range
ComplianceSupports GLP/GMP audit trails, ASTM F2413-18 (PCB test methodology reference), ISO/IEC 17025 traceability framework (via software logging)
Added to wishlistRemoved from wishlist 0
Add to compare
BrandSUSS MicroTec
Country of OriginGermany
ModelMA/BA Gen4
TypeSemi-Automated Mask Aligner & Thermal/Nanoimprint Lithography Platform
Application ScopeR&D, Pilot Production, High-Volume Prototyping
ComplianceISO 9001 Certified Manufacturing, CE Marked, Compatible with ISO 14644-1 Class 5 Cleanroom Integration
Optical SystemMO Exposure Optics® with Telecentric Illumination
Alignment ModesTop-Side, Bottom-Side, IR Alignment
Optional Alignment Accuracy≤ 0.5 µm (with DirectAlign®)
ResolutionDown to 0.8 µm (hard/soft/vacuum contact mode)
Substrate Compatibility100–200 mm wafers, reticles, glass, quartz, SiC, GaAs, flexible substrates
Automation LevelSemi-Automated with SMILE™ Process Integration Framework
SoftwareLITHOGRAPH® v5.x with Audit Trail, User Role Management, Recipe Versioning, and GLP/GMP-Ready Data Logging
Added to wishlistRemoved from wishlist 0
Add to compare
BrandTPT
OriginGermany
ModelHB75
Mounting TypeDesktop
Control Interface6.5" TFT Touchscreen
Placement Accuracy±2 µm (typical, under calibrated lab conditions)
Chip Size Range100 µm × 100 µm to 10 mm × 10 mm
Z-Axis Stroke17 mm (motorized)
Placement Force Range10–150 cN·m (350 cN·m optional)
Placement Time1–10,000 ms (extendable to 20,000 ms)
Dispensing CapabilityOptional adhesive dispensing module
Dip-Coating FunctionIntegrated
Vacuum SourceOnboard integrated vacuum pump
Motion ArchitectureTrue orthogonal X-Y-Z kinematics
Tool ChangerRotating nozzle turret
Programmable RecipesUp to 100 stored programs
Operating ModesManual, semi-automatic, and step-by-step guided placement
Heating StageOptional temperature-controlled platform (up to 250 °C ±1 °C)
Power Supply100–240 V AC, ±10%, 50/60 Hz, max. 10 A
Dimensions (W×D×H)680 × 640 × 490 mm
Net Weight42 kg
Added to wishlistRemoved from wishlist 0
Add to compare
BrandNordson Dage
OriginUnited Kingdom
ModelXD7500VR Jade FP
X-ray Tube TypeOpen Transmission Tube
Operating Voltage Range30–160 kV
Target Power3 W
Feature Resolution950 nm (0.95 µm)
Geometric MagnificationUp to 1400×
System MagnificationUp to 4200×
Maximum Sample Dimensions736 × 580 mm
Detector Resolution1.33 MP
ComplianceCE, RoHS, ISO 9001-certified manufacturing environment
Software PlatformDAGE VisionX™ v5.x with GLP-compliant audit trail and FDA 21 CFR Part 11-ready configuration options
Added to wishlistRemoved from wishlist 0
Add to compare
BrandSUSS
OriginGermany
ModelMJB4
Substrate SizeUp to 100 mm
Alignment AccuracySub-micron
Resolution≤ 0.5 µm (hard contact) to 2 µm (soft contact)
Exposure ModesSoft Contact, Hard Contact, Vacuum Contact
Optical SystemMO® Exposure Optics with Telecentric Illumination
Uniformity>95% across field
Compatible SubstratesFragile, III-V, Compound Semiconductors, Glass, Si, SOI, Flexible Foils (thickness up to 4 mm)
Show next
InstrumentHive
Logo
Compare items
  • Total (0)
Compare
0