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| Brand | AEP Technology |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | NANOMAP D |
| Price Range | USD 65,000 – 130,000 |
| Type | Non-contact + Contact Hybrid Profilometer / Surface Roughness & 3D Topography Analyzer |
| Brand | AEP Technology |
|---|---|
| Origin | USA |
| Model | NANOMAP 500LS |
| Type | Contact-mode profilometer / surface roughness analyzer |
| Vertical Resolution | ≤0.1 nm |
| Lateral Scan Range (Tip Scan) | 10 µm × 10 µm to 500 µm × 500 µm |
| Lateral Scan Range (Stage Scan) | up to 50 mm |
| Maximum Vertical Dynamic Range | 500 µm |
| Measurement Speed | High-speed scanning from 1 nm to 10 mm profiles |
| Sample Handling | No specialized preparation required |
| Brand | Nanosurf |
|---|---|
| Origin | Switzerland |
| Model | FLEX-AFM |
| Instrument Type | Atomic Force Microscope |
| XY Positioning Noise | ≤ 0.15 nm (RMS, in air & liquid) |
| Sample Dimensions | Ø ≤ 100 mm, Thickness ≤ 5 mm |
| Sample Stage Travel Range | 300 mm × 300 mm |
| Scan Range | 100 µm × 100 µm × 10 µm (XY × Z) |
| XY Drive Resolution | 0.152 nm |
| Z Drive Resolution | 0.046 nm |
| Minimum Z Noise Floor | 0.15 nm (RMS, closed-loop) |
| Compatible Environments | Ambient air, liquid, controlled atmosphere (e.g., inert gas, low-oxygen), temperature-controlled stages |
| Controller | C3000 (24-bit, dual-channel lock-in amplifiers, digital feedback) |
| Optical Integration | Fully compatible with inverted optical microscopes |
| Modular Add-ons | ECS 204 electrochemical stage, ATS 204 automated translation stage, Isostage active vibration isolation, acoustic enclosure, glovebox integration kit |
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