Empowering Scientific Discovery

Beijing Yichenghengda Technology Co., Ltd.

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BrandNanosurf
OriginSwitzerland
ModelFLEX-AFM
Instrument TypeAtomic Force Microscope
XY Positioning Noise≤ 0.15 nm (RMS, in air & liquid)
Sample DimensionsØ ≤ 100 mm, Thickness ≤ 5 mm
Sample Stage Travel Range300 mm × 300 mm
Scan Range100 µm × 100 µm × 10 µm (XY × Z)
XY Drive Resolution0.152 nm
Z Drive Resolution0.046 nm
Minimum Z Noise Floor0.15 nm (RMS, closed-loop)
Compatible EnvironmentsAmbient air, liquid, controlled atmosphere (e.g., inert gas, low-oxygen), temperature-controlled stages
ControllerC3000 (24-bit, dual-channel lock-in amplifiers, digital feedback)
Optical IntegrationFully compatible with inverted optical microscopes
Modular Add-onsECS 204 electrochemical stage, ATS 204 automated translation stage, Isostage active vibration isolation, acoustic enclosure, glovebox integration kit
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