Benyuan Nanotechnology
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| Key | Brand: Benyuan Nanotechnology |
|---|---|
| Model | BY2000 |
| Origin | Beijing, China |
| Instrument Type | Atomic Force Microscope (AFM) / Scanning Tunneling Microscope (STM) / Lateral Force Microscope (LFM) |
| Vertical Position Detection Noise | 0.1 nm |
| Maximum Sample Diameter | 45 mm |
| Maximum Sample Thickness | 15 mm |
| XY Sample Stage Travel Range | 100 mm × 100 mm |
| XY Scan Range | ~10 μm |
| Z Scan Range | ~2 μm |
| Image Resolution Options | 128×128, 256×256, 512×512, 1024×1024 pixels |
| Scan Angle | 0–360° |
| Scan Frequency | 0.1–100 Hz |
| Controller | TI 32-bit DSP with Real-Time OS |
| DAC/ADC | 16-bit high-speed |
| High-Voltage Driver | 5-channel APEX integrated HV op-amps |
| Interface | 10/100 Mbps Fast Ethernet |