FSM
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| Brand | FSM |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | FA-2000 |
| Pricing | Available Upon Request |
| Brand | FSM |
|---|---|
| Origin | USA |
| Model | FSM-413 EC |
| Measurement Principle | Infrared (IR) Interferometric EchoProbe™ Technology |
| Substrate Compatibility | Si, GaAs, InP, SiC, Sapphire, Quartz, Glass, Polymers |
| Configurations | Single-Probe (substrate thickness only) / Dual-Probe (total thickness + topography) |
| Optional Modules | Trench/Through-Silicon Via (TSV) Depth, Film Thickness, Bump Height, Surface Roughness (Rq/Ra), Sidewall Angle |
| Compliance | Designed for ISO 9001-certified semiconductor fabrication environments |
| Brand | FSM |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | VIT |
| Pricing | Available Upon Request |