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GETec AFSEM™ In-Situ Atomic Force Microscopy System for Scanning Electron Microscopes

2026-04-16 Electron Microscope, Optical Instruments, Scanning Probe Microscopes

Brand	GETec Microscopy
Origin	Austria
Model	AFSEM
Instrument Type	In-Situ AFM Integration System for SEM
Sample Dimensions	H = 41 mm, L = 110 mm, W = 77 mm
Stage Travel Range	X = ±4 mm (±7.5 mm optional), Y = ±4 mm, Z = 25 mm

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