JEOL
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| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | Gather-X |
| Mounting Type | Side-entry (inclined insertion) |
| Energy Resolution | ≤129 eV (Mn-Kα), ≤59 eV (C-Kα) |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | >500,000 cps |
| Elemental Detection Range | Li to U |
| Detector Active Area | 100 mm² |
| Window Type | Windowless |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | CRYO ARM™ 200 II (JEM-Z200CA) |
| Acceleration Voltage | 200 kV |
| Magnification Range | ×100 to ×1,000,000 |
| Spherical Aberration Coefficient (Cs) | 1.5 mm |
| Chromatic Aberration Coefficient (Cc) | 1.8 mm |
| Specimen Temperature | ≤100 K |
| Sample Storage Capacity | Up to 12 cryo-samples |
| Energy Filter | Integrated Omega-type Energy Filter |
| Optional Software | JEOL Automated Data Acquisition System (JADAS) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | JEM-3300 |
| Price Range | USD 6.2–6.9 million (est.) |
| Acceleration Voltage | Up to 300 kV |
| Magnification Range | 2,000× – 1,000,000× |
| Electron Source | Cold Field Emission Gun (CFEG) |
| Energy Filter | Integrated Omega-Type Electron Energy Filter |
| Automation | Automated Sample Loading System, JADAS Software Suite, Phase Plate Compatibility, Köhler Illumination Optics |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | IB-19530CP |
| Price | USD 150,000 |
| Equipment Type | Ion Beam Sample Preparation System for Electron Microscopy |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JBX-9500FS |
| Acceleration Voltage | 100 kV |
| Maximum Substrate Size | 300 mm Ø wafers or 6-inch masks |
| Maximum Field Size | 1000 µm × 1000 µm |
| Stage Travel Range | 260 mm × 240 mm |
| Minimum Positioning Unit (LBC) | 0.15 nm (λ/4096) |
| Overlay Accuracy | ≤ ±11 nm |
| Field Stitching Accuracy | ≤ ±10 nm |
| In-Field Placement Accuracy | ≤ ±9 nm |
| Position DAC Resolution | 20-bit |
| Scan DAC Resolution | 14-bit |
| Scan Step Size | 0.25 nm |
| Maximum Scan Rate | 100 MHz |
| Electron Source | ZrO/W Schottky Emitter |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-120i |
| Acceleration Voltage | Up to 120 kV |
| Magnification Range | 50× – 1,200,000× |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-2100Plus |
| Acceleration Voltages | 80, 100, 120, 160, 200 kV |
| Magnification Range | 50× to 1,500,000× |
| Point Resolution | 0.19 nm |
| Line Resolution | 0.14 nm |
| Minimum Probe Size | 0.5 nm |
| Tilt Range | ±25° |
| Condenser System | Three-Stage Lens Design |
| Pole Piece Options | UHR, HR, HT, HC, CRYO |
| Operating System | 64-bit Windows-based Control Interface |
| Integrated Detectors | STEM, EDS, CCD, EELS |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-2800 |
| Point Resolution | 0.21 nm |
| Lattice Resolution | 0.10 nm |
| STEM Resolution | 0.16 nm |
| Secondary Electron Resolution | 0.5 nm |
| EDS Configuration | Dual Ultra-High-Sensitivity Silicon Drift Detectors (SDD) |
| Lorentz Mode | Standard Equipment |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-ACE200F |
| Price | USD $3,000,000 |
| Acceleration Voltage | Up to 200 kV |
| Maximum Magnification | 2,000,000× |
| Point Resolution | 0.21 nm |
| Lattice Resolution | 0.10 nm |
| STEM Resolution | 0.136 nm |
| Information Limit | 0.11 nm |
| EDS Configuration | Dual Ultra-High-Sensitivity Silicon Drift Detectors (SDD) |
| Lorentz Mode | Standard |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-ARM200F(C)-NEO ARM |
| Acceleration Voltages | 30 kV, 80 kV, 200 kV |
| Magnification Range | 50× to 2,000,000× |
| Point Resolution | 0.078 nm (at 200 kV) |
| Energy Resolution | ≤0.3 eV (with monochromated cold FEG) |
| Configuration | Dual spherical aberration correctors (objective and condenser), integrated STEM/TEM/EELS/EDS platform |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-ARM300F2 |
| Price | USD 6.8M (est.) |
| Acceleration Voltage | Up to 300 kV |
| Magnification Range | 100×–2,000,000× |
| Guaranteed HAADF-STEM Resolution | 53 pm (300 kV, with ETA corrector + FHP2 polepiece) |
| EDS Detector | Dual large-area SDD (158 mm² total active area) |
| Solid Angle for EDS | 2.2 sr (with WGP polepiece) |
| Cs Corrector | JEOL 12-Pole Monochromator-Based Spherical Aberration (Cs) Corrector |
| Software | COSMO™ Auto-Aberration Correction Suite |
| Gun Type | Next-Generation Cold Field-Emission Gun (Cold-FEG) |
| Environmental Shielding | Integrated Active Vibration & Acoustic Damping Enclosure |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-F200 |
| Price | USD $2,000,000 |
| Acceleration Voltage | Up to 200 kV |
| Magnification Range | 50× – 2,000,000× |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Instrument Type | Continuous-Wave (CW) ESR |
| Models | JES-X310, JES-X320 |
| Control System | Fully Computer-Controlled |
| Magnetic Field Control | Advanced Digital Gradient-Stabilized Electromagnet System |
| Operating Mode | X-band (9–10 GHz) |
| Detection Method | Phase-Sensitive Lock-in Detection with Field Modulation |
| Cryogenic Compatibility | Optional Liquid Nitrogen and Helium Cryostat Integration |
| Safety Compliance | IEC 61010-1, CE Marked |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JIB-4700F |
| Instrument Type | Benchtop Dual-Beam FIB-SEM |
| Electron Source | Cold Field Emission Gun (CFEG) |
| Secondary Electron Resolution | 1.2 nm @ 15 kV, 1.6 nm @ 1 kV |
| Backscattered Electron Resolution | 2.5 nm |
| FIB Resolution | 5 nm @ 30 kV |
| Magnification Range | 25× – 1,000,000× |
| Acceleration Voltage | 0.1–30 kV |
| Maximum FIB Current | 90 nA |
| Maximum SEM Probe Current | 300 nA |
| Gas Injection System | Up to 3 independent channels |
| Sample Stage | 5-axis fully aligned motorized stage |
| Maximum Sample Diameter | 150 mm |
| Sample Loading | Airlock-style exchange |
| Detector Interfaces | EDS, EBSD, STEM, SE/BSE |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JIB-PS500i |
| Electron Beam Resolution | 0.7 nm @ 15 kV, 1.0 nm @ 1 kV |
| Ion Beam Resolution | 3 nm |
| Maximum Ion Beam Current | 100 nA |
| Maximum Electron Beam Current | 500 nA |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Instrument Type | Magnetic Sector Mass Spectrometer |
| Application Focus | Dioxin (PCDD/Fs) Analysis |
| GC Compatibility | Dual-Column Interface |
| Detector | Photomultiplier Tube (PMT) |
| Software | Diok Suite (EPA Method 1613 Compliant) |
| Vacuum Integrity | Column Exchange Without Ion Source Venting |
| Regulatory Alignment | Designed for EPA 1613, EU 2017/771, and ISO 18073 Compliance |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JMS-800D |
| Configuration | Magnetic Sector GC-MS System for Dioxin Analysis |
| Detector Type | Photomultiplier Tube (PMT) |
| Software | Diok Suite for Dioxin/Furan Quantitation |
| Vacuum System | Oil-diffusion or Turbo-molecular Pumping (Typical for JMS-800D Era) |
| Mass Resolution | >10,000 (10% Valley) at m/z 320 |
| Mass Range | Up to m/z 1000 |
| Ion Source | Electron Ionization (EI), Dual-Channel Design |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JMS-Q1600GC |
| Instrument Type | Single Quadrupole Mass Spectrometer |
| GC Configuration | Conventional Gas Chromatography-Mass Spectrometry (GC-MS) |
| Series | UltraQuad™ SQ-Zeta |
| Generation | 6th-generation JEOL GC-MS platform |
| Application Scope | Quantitative and Qualitative Analysis in Environmental, Food Safety, Agrochemical, Materials, and Flavor Chemistry |
| Compliance Framework | Designed for GLP/GMP-aligned laboratories |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JMS-S3000 |
| Ion Optics | SpiralTOF™-plus 2.0 |
| Operating Modes | TOF (standard), Linear TOF (optional), TOF/TOF (optional) |
| Application Scope | Synthetic polymers, biomacromolecules, materials science |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Instrument Type | Time-of-Flight (TOF) Mass Spectrometer |
| Configuration | Liquid Chromatography–Mass Spectrometry (LC-MS) Platform |
| Ionization Modes | Electrospray Ionization (ESI), Direct Analysis in Real Time (DART™), Cold Spray Ionization (CSI) |
| Intended Use | General-purpose high-resolution mass analysis in research, quality control, and regulatory-compliant laboratories |
| Compliance Context | Designed to support GLP/GMP workflows and data integrity requirements per FDA 21 CFR Part 11 and ISO/IEC 17025 guidelines |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JMS-T2000GC |
| Type | Time-of-Flight (TOF) GC-MS System |
| Ionization Modes | Electron Ionization (EI), Chemical Ionization (CI), Field Ionization (FI), and Optional Atmospheric Pressure Chemical Ionization (APCI) |
| Mass Accuracy | < 1 ppm (external calibration), < 0.5 ppm (internal lock mass) |
| Mass Resolution | > 10,000 (FWHM, m/z 500) |
| Acquisition Rate | Up to 50 spectra/sec |
| Mass Range | m/z 10–4,000 |
| Detector | Microchannel Plate (MCP) with Delayed Extraction |
| Vacuum System | Dual-stage differential pumping with turbomolecular pumps |
| GC Interface | Direct capillary column coupling with heated transfer line (up to 350 °C) |
| Software | MassCenter™ v5.x with automated deconvolution, library search (NIST, Wiley, JEOL MS Library), and quantitative workflow support |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JNM-ECZL Series |
| Sample Type | Solid-Liquid Dual-Mode |
| Instrument Category | High-Field NMR Spectrometer |
| System Architecture | Integrated Smart Transceiver System (STS) |
| Multi-Resonance Capability | Standard Configuration |
| Design Principle | Compact High-Field Platform with Digital RF Control |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JNM-ECZL400R |
| NMR Frequency | 400 MHz (¹H) |
| Magnet Type | Superconducting, Cryogen-Free Option Available |
| Field Homogeneity | < 0.1 Hz/30 min (shimmed) |
| Temperature Control Range | –140 °C to +140 °C |
| Sample Format | Solid, Semi-Solid, Gel, Liquid, and Heterogeneous Samples |
| Probe Compatibility | Broadband Solid-State MAS Probes (e.g., 2.5–4 mm rotors), Static & Variable-Temperature Configurations |
| Optional FFC Module | SPINMASTER FFC2000 (0.01–42 MHz field-cycling range) |
| Optional SMARTracer Module | 0.1–10 MHz |
| Optional 3 T Permanent Magnet Add-on | Extends ¹H Larmor frequency to ~130 MHz |
| Sample Tube Standard | 4 mm or 3.2 mm ZrO₂ MAS rotors (solid) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-7001F |
| Vacuum Mode | High Vacuum / Low Vacuum (up to 50 Pa) |
| Resolution | 3.0 nm @ 30 kV (Backscattered Electron Imaging) |
| Sample Chamber Diameter | Up to 200 mm |
| Stage | Motorized 5-axis (X, Y, Z, Tilt, Rotation) |
| Detector Compatibility | EDS, WDS, EBSD, CL, SE, BEI |
| Operating System | Windows XP (original factory configuration) |
| Gun Chamber Pressure | ≤5 × 10⁻⁷ Pa |
| Recommended Gas for LV Mode | Dry Nitrogen |
| Instrument Age | ~10 years |
| Condition | Refurbished & Functionally Verified |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-7610FPLUS |
| Year of Manufacture | 2017 |
| Operational Age | 5 years |
| Vacuum System | Turbo-molecular + Ion Pump |
| Max Magnification | 1,000,000× |
| Resolution (SE) | 0.8 nm @ 15 kV, 1.0 nm @ 1 kV |
| Acceleration Voltage | 100 V – 30 kV |
| Electron Source | Schottky Thermal Field-Emission Gun |
| Beam Current | Up to 200 nA |
| Working Distance | 8 mm |
| Stage | 5-axis Motorized, ±5° to +70° tilt, 360° rotation |
| EDS Detector Area | ≥20 mm², Be–Am detection range, Mn-Kα resolution ≤127 eV |
| EBSD Compatibility | Yes |
| Compliance | ASTM E1558, ISO 16700, IEC 61000-4-5 (EMC), GLP-ready data logging |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT100 |
| Vacuum Modes | High Vacuum & Low Vacuum (10–300 Pa) |
| Resolution | 3 nm @ 30 kV (HV), 4 nm @ 30 kV (LV) |
| Acceleration Voltage | 0.5–30 kV (optional extension to 30 kV) |
| Magnification | ×5 to ×300,000 |
| Stage Travel | X 80 mm, Y 40 mm, Z 5–48 mm, Tilt −10° to +90°, Rotation 360° |
| Max Sample Diameter | 150 mm |
| EDS Functions | Point analysis, elemental mapping, line scan, real-time filtering |
| Detector Options | Dry SD (10/30/60/100 mm² active area) |
| Software | InTouchScope™ GUI with integrated SEM/EDS workflow |
| Power Requirement | 100 V AC, no cooling water required |
| Footprint | ~30% smaller than prior JEOL benchtop SEMs |
| Operational Age | 2 years |
| Compliance | Designed per JEOL’s internal quality system aligned with ISO 9001 |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT200 |
| Instrument Age | 2 years |
| Configuration | Standard SEM + EDS (Energy Dispersive X-ray Spectroscopy) |
| Vacuum Mode | High Vacuum & Low Vacuum (LA) compatible |
| Sample Stage | Motorized Tilt/Rotation/XYZ |
| CCD Navigation Camera | 5 MP, 6 × 4.5 cm FOV, Digital Zoom up to ×20 |
| Software Platform | SMILE VIEW™ Lab |
| Compliance | Fully serviceable per JEOL OEM maintenance protocols |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT210 |
| Instrument Type | Floor-standing |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm @ 30 kV |
| Magnification Range | 5× – 300,000× |
| Accelerating Voltage | 0.5–30 kV |
| Backscattered Electron Resolution | 4 nm (Low Vacuum Mode) |
| Maximum Sample Dimensions | Ø150 mm × 53 mm height |
| Specimen Chamber Expansion Ports | Multiple |
| Stage Type | Motorized 5-Axis Stage |
| Standard Detectors | Everhart-Thornley SE Detector, Solid-State BSE Detector |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT510 |
| Instrument Type | Floor-standing SEM |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm @ 30 kV, 15 nm @ 1 kV |
| Backscattered Electron Resolution | 4 nm @ 30 kV |
| Accelerating Voltage Range | 0.3–30 kV |
| Magnification Range | 14×–800,000× (on display) |
| Vacuum Mode | Low-vacuum compatible with LHSED detector |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT710HR |
| Instrument Type | Benchtop SEM |
| Electron Source | Thermal Field Emission Gun (TFEG) |
| Secondary Electron Resolution | 1 nm @ 30 kV |
| Backscattered Electron Resolution | 2 nm @ 30 kV |
| Accelerating Voltage | 0.1–30 kV |
| Maximum Magnification | 1,000,000× |
| Probe Current | Up to 300 nA |
| Sample Chamber | Large-volume, front-loading with wide-access door |
| Operating Modes | High Vacuum / Low Vacuum (LV/LA variants available) |