Julight
Filter
Showing all 2 results
| Brand | Julight |
|---|---|
| Model | SP-LV-1000 |
| Laser Source | Semiconductor Diode |
| Interferometry Principle | Self-Mixing Interferometry (SMI) |
| Measurement Axis | Normal-to-surface displacement/velocity |
| Operating Distance | 0.1–5 m (customizable up to 50 m) |
| Scan Angle Range | ±25° × ±25° |
| Max Scan Points | 1024 × 1024 per frame |
| Scan Speed | 0.5–50 pts/s |
| Frequency Range | DC–50 kHz (standard) |
| Signal Output | Analog voltage proportional to displacement or velocity |
| Data Acquisition Resolution | Up to 25,600 spectral lines |
| Surface Compatibility | Diffuse, rough, unpolished metals, plastics, rubber, wood, composites |
| Integrated Imaging | 96× real-time color zoom (24× optical + 4× digital), auto-focus, on-screen point selection |
| Software Features | Automated grid generation, programmable scanning, modal analysis, FRF quality assessment, time/frequency domain recording, 3D animation & visualization |
| Compliance | Designed for GLP/GMP-aligned workflows |
| Brand | Julight |
|---|---|
| Model | VSM1000-UW |
| Wavelength | 780 nm |
| Measurement Principle | Self-Mixing Interferometry (SMI) in aqueous media |
| Maximum Water Path Thickness | 200 cm |
| Frequency Range | 0–35 MHz |
| Displacement Resolution | 0.2 nm |
| Working Distance | 0.1–5 m (motorized autofocus) |
| Measurement Modes | Single-point, 2D scanning, 3D scanning |
| Accuracy | ±1% (0–50 kHz), ±5% (20 kHz–35 MHz) |
| Compliance | Designed for ISO 18431-1 (mechanical vibration and shock — signal processing), compatible with GLP/GMP data integrity workflows via audit-trail-enabled software |