Nanosurf
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| Brand | Nanosurf |
|---|---|
| Origin | Switzerland |
| Model | FLEX-AFM |
| Instrument Type | Atomic Force Microscope |
| XY Positioning Noise | ≤ 0.15 nm (RMS, in air & liquid) |
| Sample Dimensions | Ø ≤ 100 mm, Thickness ≤ 5 mm |
| Sample Stage Travel Range | 300 mm × 300 mm |
| Scan Range | 100 µm × 100 µm × 10 µm (XY × Z) |
| XY Drive Resolution | 0.152 nm |
| Z Drive Resolution | 0.046 nm |
| Minimum Z Noise Floor | 0.15 nm (RMS, closed-loop) |
| Compatible Environments | Ambient air, liquid, controlled atmosphere (e.g., inert gas, low-oxygen), temperature-controlled stages |
| Controller | C3000 (24-bit, dual-channel lock-in amplifiers, digital feedback) |
| Optical Integration | Fully compatible with inverted optical microscopes |
| Modular Add-ons | ECS 204 electrochemical stage, ATS 204 automated translation stage, Isostage active vibration isolation, acoustic enclosure, glovebox integration kit |
| Brand | Nanosurf |
|---|---|
| Origin | Switzerland |
| Model | FlexAFM |
| Instrument Type | Material-Focused AFM |
| Position Detection Noise | <35 pm |
| Maximum Sample Diameter | ≤120 mm |
| Control Electronics | C3000i (24-bit), upgradeable to CX (28-bit) |
| Software | Nanosurf Software Suite |
| Compliance | Designed for ISO/IEC 17025-aligned lab environments, supports GLP/GMP audit trails via optional software modules |
| Brand | Nanosurf |
|---|---|
| Origin | Switzerland |
| Model | Naio STM |
| Position Detection Noise | 0.15 nm |
| Sample Area | 500 nm × 500 nm |
| XY Scan Range | 500 nm × 500 nm |
| XY Resolution | 7.6 pm |
| Z Scan Range | 200 nm |
| Z Resolution | 3 pm |
| Maximum Tunneling Current | 100 nA |
| Sample Stage Diameter | 10 mm |
| Max Sample Thickness | 3 mm |
| Imaging Modes | Constant-Current & Constant-Height |
| Spectroscopy Modes | I–V, I–z |
| Max Image Pixels | 2048 × 2048 |
| Max Spectral Points | 32768 |
| XY Tilt Compensation | Hardware-based |
| Interface | USB 2.0 |
| Dimensions | 204 mm × 204 mm × 104 mm |
| Weight | 3.45 kg |