RHK
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| Brand | RHK |
|---|---|
| Origin | USA |
| Model | PAN STM/AFM |
| Operating Modes | STM & Non-Contact AFM |
| Temperature Range | <300 mK, Room Temperature (RT), Variable Temperature (VT), High Temperature (HT) |
| X-Y-Z Coarse Motion Range | 5 mm × 5 mm × 10 mm |
| Scan Range (RT) | 5 µm × 5 µm |
| Sample Size Capacity | 10 mm × 10 mm |
| Scanner Dimensions | 40 mm × 70 mm |
| Vibration Damping | Integrated Spring & Eddy-Current Damping System |
| Compatibility | Flow-type & Bath-type Cryostats, Superconducting Magnets, UHV Systems |
| Controller | RHK R9 Full-Digital SPM Controller with IVP-R9 Preamp |
| Brand | RHK |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | QuadraProbe |
| Instrument Type | Scanning Tunneling Microscope (STM) |
| Sample Stage Travel Range | 1.5 µm (300 K) |
| Sample Temperature | 10 K (LHe), 80 K (LN₂) |
| Coarse Approach Range (X/Y/Z) | ±1.5 mm per step |
| Sample Positioning Accuracy | ±1.5 mm |
| STM Resolution | Atomic resolution on HOPG achievable with all four probes |
| SEM Resolution | <20 nm |
| Probe Material | Tungsten wire, optionally coated with Pt, Au, or other conductive metals |