Yidian Analysis
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| Brand | Yidian Analysis |
|---|---|
| Origin | Shanghai, China |
| Model Range | 752G, 752N, 752N (PLUS), 754N, 756N, N4, N4S, N5S, L5, L5S, L6, L6S, L7, L8, L9, 760CRT |
| Optical System | Single-beam (752/754/756/N-series) or Double-beam (L7–L9, 760CRT) |
| Wavelength Range | 190–1100 nm |
| Spectral Bandwidth | 2 nm (standard models) to 0.5 nm (high-resolution L-series & 760CRT) |
| Photometric Accuracy | ±0.3% T |
| Wavelength Accuracy | ±0.5 nm |
| Stray Light | ≤0.05% T at 220 nm and 360 nm |
| Detector | Silicon photodiode (standard) or PMT (760CRT) |
| Data Interface | RS-232, USB, optional Ethernet |
| Compliance | ISO 9001 certified manufacturing |