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| Brand | ROOKO |
|---|---|
| Origin | Zhejiang, China |
| Model | FT-371 |
| Measurement Range | 10¹–2×10¹⁰ Ω/□ |
| Resistivity Range | 10²–2×10¹¹ Ω·cm |
| Test Current | 1 mA – 1 pA |
| Current Accuracy | ±0.1% of reading |
| Resistance Accuracy | ≤5% (≤10⁸ Ω), ≤20% (>10⁸ Ω) |
| Display | 4.3" LCD showing R, ρ, Rₛ, T, σ, probe geometry, spacing, thickness, temp. coeff., I/V |
| Measurement Method | Dual-electrode four-point probe (linear or square configuration) |
| Power Supply | AC 220 V ±10%, 50 Hz, <30 W |
| Overall Uncertainty | ≤4% (certified standard sample) |
| Optional Accessories | PC control software, square probe head, linear probe head, temperature-controlled test platform, probe spacing (1/2/3 mm), probe tip materials (tungsten carbide, stainless steel, gold-plated phosphor bronze hemispherical) |
| Brand | ROOKO |
|---|---|
| Model | FT-361 |
| Origin | Zhejiang, China |
| Automation Level | Manual |
| Compliance | GB/T 1551–2018 (Silicon Single Crystal Resistivity Test Method), ASTM F84–20 |
| Sheet Resistance Range | 10⁻⁶–2×10² Ω/□ |
| Resistivity Range | 10⁻⁷–2×10³ Ω·cm |
| Test Current | 0.1 μA, 1 μA, 10 μA, 100 μA |
| Current Accuracy | ±0.1% of reading |
| Resistance Measurement Accuracy | ≤0.3% |
| Overall System Uncertainty | ≤4% (verified against NIST-traceable standard wafers) |
| Probe Spacing Options | 1 mm, 2 mm, 3 mm |
| Probe Tip Materials | Tungsten Carbide, Stainless Steel, Gold-Plated Phosphor Bronze Hemispherical Tips |
| Display | 4.3-inch TFT LCD showing R, ρ, Rₛ, T, σ, d, αₜ, V, I, probe geometry, spacing, thickness, unit conversion |
| Power Input | AC 220 V ±10%, 50 Hz |
| Max Power Consumption | <30 W |
| Optional Accessories | PC control software (with audit trail & CSV/PDF export), square probe head, linear probe head, motorized XYZ test stage, thermal chamber interface kit |
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