Optical Instrument Components
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| Brand | Asphericon |
|---|---|
| Model | CHL Series |
| Material | S-LAH64 High-Refractive-Index Optical Glass |
| Surface Irregularity (RMSi) | ≤ 0.5 µm |
| EFL Tolerance | ≤ ±0.1% |
| Clear Aperture | ≥ 90% |
| Standard Coatings | A (400–600 nm), B (600–1050 nm), C (1000–1600 nm) |
| Laser Damage Threshold | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Conformance | ISO 10110-5 (Surface Form Tolerance) |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | CHL10-08-P |
| Material | S-LAH64 |
| Clear Aperture | 10 × 10 mm |
| Numerical Aperture (NA) | 0.54 |
| Design Wavelength | 780 nm |
| Coating | AR for 780 nm |
| Surface Figure Accuracy (RMS) | < λ/20 @ 633 nm |
| Surface Roughness (Ra) | < 5 Å |
| Focal Length (Tangential) | 8.0 mm |
| Focal Length (Sagittal) | ∞ (Cylindrical Geometry) |
| Damage Threshold | > 5 J/cm² @ 780 nm, 10 ns, 10 Hz |
| Brand | Asphericon (Germany) |
|---|---|
| Origin | Germany |
| Model | CHL15-12-P-U |
| Component Category | Optical Element |
| Surface Figure Error (RMSi) | ≤500 nm |
| Clear Aperture | 15 × 15 mm |
| Effective Focal Length (EFL) | 12 mm |
| Numerical Aperture (NA) | 0.54 |
| f/d Ratio | 0.8 |
| Working Distance (WD) | 9.2 mm |
| Design Wavelength | 780 nm |
| Substrate Material | S-LAH64 |
| Coating Options | AR Coating A (400–600 nm), B (600–1050 nm), or C (1000–1500 nm) |
| Brand | Asphericon (Germany) |
|---|---|
| Origin | Germany |
| Model | CHL30-26-P-U |
| Component Category | Optical Element |
| RMSi Surface Form Error | ≤500 nm |
| Size | 30 × 30 mm |
| Effective Focal Length (EFL) | 26 mm |
| Numerical Aperture (NA) | 0.52 |
| f/d Ratio | 0.87 |
| Working Distance (WD) | 21.5 mm |
| Design Wavelength | 780 nm |
| Substrate Material | S-LAH64 |
| Coating Options | AR Coating A (400–600 nm), B (600–1050 nm), or C (1000–1500 nm) |
| Brand | Asphericon |
|---|---|
| Model | S-LAH64 |
| Material | S-LAH64 optical glass |
| Surface Irregularity (RMSi) | ≤ 0.5 µm |
| EFL Tolerance | ≤ 0.1% |
| Diameter Tolerance | +0/−0.05 mm |
| Center Thickness Tolerance | ±0.05 mm |
| Clear Aperture | ≥90% |
| Standard AR Coatings | A (400–600 nm), B (600–1050 nm), C (1000–1600 nm) |
| Laser Damage Threshold | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | SQM25-10-A-532 |
| Thread | M28×0.75 mm |
| Outer Diameter Mount | 30 mm |
| Length | 17.3 mm |
| Input Beam Diameter @1/e² | 10 mm |
| Output Beam Diameter (FWHM) | 10 mm |
| Design Wavelength | 532 nm |
| Operating Wavelength Range | 500–620 nm |
| Laser Damage Threshold | 12 J/cm², 100 Hz, 6 ns @ 532 nm |
| Brand | Asphericon |
|---|---|
| Model | StockOptics Axicon |
| Type | Precision Fused Silica Axicon (Conical Lens) |
| Material | Fused Silica |
| Surface Figure (RMSi) | ≤ 0.07 µm |
| Surface Quality | 40–20 scratch-dig |
| Diameter Tolerance | +0/−0.1 mm |
| Center Thickness Tolerance | ±0.1 mm |
| Clear Aperture | ≥90% |
| Standard AR Coatings | A (400–600 nm), B (600–1050 nm), C (1000–1600 nm), X (240–380 nm) |
| Laser Damage Threshold | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Brand | asphericon |
|---|---|
| Origin | Germany |
| Model | UAM25-28-C-MII |
| Thread Type | Female/Female M28×0.75 |
| Length | 10.3 mm |
| Outer Diameter | 30 mm |
| Clear Aperture | 24.5 mm |
| Component Category | Optical Mounting Adapter |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | XFL25-005-U |
| Material | Fused Silica |
| Design Wavelength | 780 nm |
| Apex Angle | 0.5° |
| Component Type | Optical Element |
| Coating | AR-Coated for 780 nm (Standard) |
| Surface Quality | 20–10 Scratch-Dig |
| Wavefront Error | λ/10 @ 633 nm (typ.) |
| Clear Aperture | ≥90% of Diameter |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ASTN-D1-W150 |
| Component Category | Broadband Tunable Light Source |
| Light Source Configuration | Single 30 W Deep-UV Deuterium Lamp + 150 W Halogen Lamp |
| Typical Deuterium Lamp Lifetime | 1,000 h (min. 500 h) |
| Typical Halogen Lamp Lifetime | 50–2,000 h |
| Monochromator | CM110, f/3.9 |
| Grating Capacity | Dual pre-installed gratings |
| Interface | RS-232 Serial |
| Scan Modes | Bidirectional |
| Scan Units | nm, Å, cm⁻¹, eV |
| Optional IR Extension | SiC Thermal Source (1–16 µm) |
| Fiber Coupling Options | SMA, FC, CS Ferrule (AFCM-L-XX series, sold separately) |
| Filter Mount | AB202 |
| Filter Series | AB3XXX |
| Brand | ART Photonics |
|---|---|
| Origin | Germany |
| Model | newopto |
| Fiber Type | Chalcogenide (CIR) / Polycrystalline (PIR) |
| Transmission Range | 6500–1700 cm⁻¹ (CIR) / 3600–600 cm⁻¹ (PIR) |
| Max. Temp. | ≤90°C (CIR) / ≤100°C (PIR) |
| Total Length | 1 m (standard) |
| Shaft Length | 120 mm |
| Shaft Diameter | 10 mm |
| Shaft Material | PEEK |
| Protective Tube Material | PEEK |
| Connector | Long SMA (custom options available) |
| Detachable Loop Configuration | Single-loop, double-loop, triple-loop, and multi-loop variants |
| Brand | AULTT |
|---|---|
| Model | AULTT-P |
| Type | Compact USB-Powered CCD Spectrometer with UV-VIS-NIR Coverage |
| Origin | Beijing, China |
| Manufacturer | Zhongjiaojinyuan (CNI) |
| Component Category | Light Source–Integrated Spectral Measurement System |
| Key Specifications | 185–1100 nm spectral range (model-dependent), 0.03 nm optical resolution, <0.3 nm wavelength repeatability, 30 µm slit, 600 lines/mm grating (optimized for UV or VIS), 2048- or 3648-pixel linear silicon CCD detector, USB 2.0 bus-powered operation |
| Software | Win7-compatible spectral acquisition & analysis suite with multi-instrument support, real-time exposure control, spectral video capture, and export to CSV, TXT, PDF, BMP |
| Compliance | Designed for laboratory-grade optical metrology in R&D, QA/QC, and educational environments |
| supports ASTM E308, CIE 15 | 2018, ISO/CIE 11664, and GLP-aligned data traceability (audit trail enabled in software log) |
| Brand | AULTT |
|---|---|
| Model | P2000 |
| Detector | 2048-pixel linear silicon CCD |
| Wavelength Range | 350–1000 nm |
| Optical Resolution (FWHM) | ≤ 0.03 nm |
| Wavelength Repeatability | < ±0.3 nm |
| Slit Width | 30 µm |
| Grating | 600 lines/mm @ 450 nm |
| Interface | USB 2.0 |
| Power Supply | Bus-powered via USB |
| Operating System | Windows 7 and later |
| Software | Integrated spectral analysis suite with multi-instrument support, exposure auto-adjustment, spectral video capture, and export to CSV, TXT, PDF, BMP |
| Brand | AULTT |
|---|---|
| Model | P3000 |
| Detector | 3648-pixel linear silicon CCD |
| Wavelength Range | 200–800 nm (UV-Vis) |
| Optical Resolution (FWHM) | ≤ 0.03 nm |
| Wavelength Repeatability | < ±0.3 nm |
| Slit Width | 30 µm |
| Grating | 600 lines/mm, blazed at 250 nm |
| Interface | USB 2.0, bus-powered |
| Software Compatibility | Windows 7 and later |
| Data Export Formats | CSV, TXT, PDF, BMP |
| Spectral Acquisition Modes | Single-shot, continuous scan, spectral video |
| Calibration | Factory NIST-traceable wavelength & radiometric calibration |
| Compliance | CE, RoHS |
| Accessories Support | Modular fiber-optic coupling (SMA905), interchangeable light sources (deuterium, tungsten-halogen, LED), cuvette holders, integrating spheres, and filter kits |
| Brand | AULTT |
|---|---|
| Model | P4000 |
| Detector | 3648-pixel linear silicon CCD |
| Wavelength Range | 185–1100 nm |
| Optical Resolution (FWHM) | ≤0.03 nm |
| Wavelength Repeatability | < ±0.3 nm |
| Slit Width | 30 µm |
| Grating | 600 lines/mm, blazed at 250 nm |
| Interface | USB 2.0, bus-powered |
| Software Compatibility | Windows 7 and later |
| Compliance | CE-marked optical instrumentation, compliant with IEC 61326-1 for EMC in laboratory environments |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Optical Instrument Component / Fiber Optic Coupler |
| Model | GalvoStation (Microscopy & Imaging Accessory) |
| Pricing | Available Upon Request |
| Component Type | Tapered Fiber Probe with Galvanometric Scanning Assembly |
| Brand | Auniontech (IPOptica) |
|---|---|
| Clear Aperture | Up to 70 mm |
| Operating Wavelength | 405–1100 nm (model-dependent) |
| Peak Rotation | 45° ± 0.5° |
| Damage Threshold | >7 J/cm² @ 10 ns (HPKT), >10 J/cm² @ 10 ns (HPTG), 3 J/cm² @ 10 ns (VITG) |
| Transmission | >98% (rotator), >96% (isolator) |
| Isolation | >35 dB (HPTG/HPKT), >30 dB (VITG) |
| Storage Temperature | −40°C to +70°C |
| Beam Pointing Stability | <5 mrad |
| Brand | Axetris |
|---|---|
| Origin | Switzerland |
| Housing | TO-39 metal can |
| Optical Window Options | Sapphire, CaF₂, BaF₂, Germanium |
| Spectral Range | 2–16 µm |
| Emission Profile | Near-ideal blackbody radiation |
| Modulation Capability | Electrical (chopper-free), kHz-range square-wave compatible |
| Power Consumption | Low (<150 mW typical operating power) |
| Lifetime | >50,000 hours (MTTF) |
| MEMS Architecture | Silicon-based microheater with dielectric thin-film coating on Si substrate |
| Compliance | IEC 61721-3-7 Class 7M3 qualified (excluding CaF₂/BaF₂ window variants) |
| Brand | Axetris |
|---|---|
| Origin | Switzerland |
| Model | EMIRS200 Series |
| Component Type | Thermal Infrared Source |
| Spectral Range | 2–14 µm |
| Emission Profile | Near-Blackbody |
| Modulation Capability | Electrical (Chopper-Free) |
| Package | Hermetically Sealed TO-39 Metal Can |
| Window Options | Sapphire, CaF₂, BaF₂, Ge |
| Compliance | IEC 60747-17 / IEC 62047-19 (MEMS), IEC 60749-21 (Reliability), IEC 60068-2 Environmental Testing |
| Lifetime | >50,000 hours (at rated power, 25°C ambient) |
| Power Consumption | <150 mW (typical operating point) |
| MEMS Architecture | Silicon-based microheater with dielectric emissive coating on SOI substrate |
| Brand | Axetris |
|---|---|
| Origin | Switzerland |
| Model | EMIRS200_AT01T_BT130 |
| Housing | TO-39 metal can with protective cap |
| Emitter Type | MEMS-based micro-hotplate thermal IR source |
| Spectral Range | 2–16 µm (blackbody-like emission) |
| Modulation Capability | Electrical AC modulation up to several hundred Hz (chopper-free) |
| Window Options | Sapphire, CaF₂, BaF₂, Ge |
| Compliance | IEC 60747-17 / IEC 62047-18 / IEC 6721-3-7 Class 7M3 (except CaF₂/BaF₂ window variants) |
| Power Consumption | <150 mW typical operating power |
| Lifetime | >50,000 hours (L₅₀ at rated drive conditions) |
| Radiation Efficiency | >90% emissivity across 3–12 µm band |
| Brand | Axetris |
|---|---|
| Origin | Switzerland |
| Product Type | Micro-Optical Components |
| Material | Silicon & Fused Silica |
| Wavelength Range | UV to Mid-IR |
| Lens Types | Aspheric Microlenses & Microlens Arrays |
| Primary Applications | Fiber Coupling, LD/VCSEL Collimation, Optical Sensing, Telecom Systems |
| Compliance | Telcordia GR-1209-CORE, GR-1221-CORE |
| OEM Support | Full Design-to-Volume Manufacturing Services |
| Brand | Bakman |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PB1319 |
| Price Range | USD 2,800 – 8,500 |
| Operating Temperature (Standard) | −40 °C to +85 °C |
| Operating Temperature (Cryogenic Variant) | 4.5 K to 350 K |
| Pump Wavelength | 760–855 nm |
| THz Bandwidth | 0.1–3 THz |
| Bias Voltage Range | ±20 V (typ.), ±25 V (max) |
| Dark Current @20 V, 25 °C | ≤0.5 µA |
| THz Output Power @200 GHz, 30 mW pump | 0.02–0.5 µW |
| Dynamic Range @100 GHz / @1000 GHz | 70 dB / 50 dB |
| Optical Return Loss @780 nm | ≥40 dB |
| Packaging | Fiber-coupled, hermetically sealed module with integrated silicon hyperhemispherical lens |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model Range | Customizable Standard & OEM Models |
| Pricing | Available Upon Request |
| Brand | BATOP |
|---|---|
| Origin | Germany |
| Model | SAM-1064-1-1ps-x |
| Component Type | Optical Element |
| Mounting Options | Unmounted (450 µm thickness), Mounted (4 mm × 4 mm chip), or Fiber-Pigtailed (FC/PC or FC/APC) |
| Wavelength | 1064 nm |
| Saturation Fluence | ~1 µJ/cm² (typ.) |
| Recovery Time | ~1 ps |
| Reflectivity (HR) | >99.9% at design wavelength |
| Cavity Structure | AlAs/GaAs Bragg stack with low-temperature GaAs (LT-GaAs) saturable absorber layer |
| Compliance | RoHS-compliant, ISO 9001-manufactured wafers |
| Brand | BATOP |
|---|---|
| Origin | Germany |
| Product Types | SESAM, RSAM, SOC, PCA |
| Wavelength Range | 800 nm – 3000 nm |
| Saturation Absorption (A₀) | 0.6% – 70% |
| Recovery Time (τ) | 500 fs – 124 ps |
| Packaging Options | Bare Die (4×4 mm, 1×1 mm, 1.3×1.3 mm), Copper-Mounted (12.7 mm / 25.0 mm / 25.4 mm dia., soldered or glued, air-cooled or water-cooled), Fiber-Pigtailed (FC/PC or FC/APC, HI980 fiber) |
| Brand | BATOP (distributed by Microphotons) |
|---|---|
| Origin | Germany |
| Manufacturer Type | OEM Manufacturer |
| Product Category | Optical Component |
| Model | TPX-D50-f35-0 |
| Material | Polymethylpentene (TPX) |
| Diameter | 50.8 mm (2 inch) |
| Focal Length | 35.0 mm |
| Mounting Tube Length | 12.7 mm |
| Compliance | ISO 9001-certified manufacturing |
| Optical Transmission Range | 0.1–4.0 THz (typical) |
| Brand | Bioptechs |
|---|---|
| Origin | USA |
| Model | FCS2 (for inverted microscopes), FCS3 (for upright microscopes), CFCS2 (cooling-enabled variant) |
| Component Category | Optical Instrument Component |
| Optical Compatibility | Full compatibility with brightfield, phase contrast, DIC, fluorescence (including TIRF and confocal), and super-resolution modalities |
| Temperature Control Range | Ambient to 50 °C ±0.2 °C (air-gap-free design) |
| Flow Regime | Tunable from near-laminar (low-shear) to directed high-shear, user-defined geometry |
| Chamber Volume & Geometry | Fully user-adjustable chamber height (10–500 µm), optical path length, and flow channel profile |
| Thermal Uniformity | <0.1 °C spatial variation across imaging area |
| Fluidic Interface | 1/16″ OD tubing compatible (C-Flex®, Tygon®) |
| Environmental Sealing | Closed-system operation compatible with CO₂/bicarbonate or organic buffering systems |
| Assembly | Tool-free, modular configuration |
| Brand | Biphoton |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Optical Instrument Component |
| Model | SU-8 2000 Series |
| Wavelength Sensitivity | Near UV (350–400 nm), compatible with i-line, electron beam, and X-ray lithography |
| Typical Film Thickness | 0.5–650 µm |
| Application Scope | MEMS, microfluidics, optical waveguides, passivation layers, and photonic device fabrication |
| Compliance | Compatible with standard semiconductor cleanroom processes (Class 100/10) and ISO 14644-1 certified environments |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Product Type | AFM Cantilever Probes |
| Material | Single-Crystal Silicon or Silicon Nitride |
| Tip Radius | 1 nm – 30 nm (model-dependent) |
| Spring Constant | 0.25 N/m – 450 N/m |
| Resonant Frequency | 10 kHz – 525 kHz |
| Coating Options | Al, Au, PtIr, Cr/Au, Conductive Diamond, DLC, Magnetic CoCr, Ptlr |
| Packaging | Individual Box (10 pcs), Wafer (300–400 pcs), or Custom Sets |
| Compliance | ISO/IEC 17025 traceable calibration available for certified probes |
| Brand | Cairn |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | Multisplit V2 |
| Pricing | Available Upon Request |