Optical Instruments
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Showing 841–870 of 1896 results
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Imaris |
| Price | Contact for Quote |
| Brand | Imperx |
|---|---|
| Origin | USA |
| Model | Cheetah |
| Interface Options | Camera Link / USB3 Vision / GigE Vision |
| Resolution Range | 2.8 MP to 25 MP |
| Frame Rate Range | up to 129 fps (8-bit, full resolution) |
| Shutter Modes | Global & Rolling |
| Dynamic Range | Wide Dynamic Range (WDR) with 3 adjustable knee points |
| Sensor Type | Monochrome or Color CMOS |
| NIR Sensitivity | Enhanced |
| Trigger Modes | Software, Hardware, Encoder |
| ROI Support | Yes |
| Dark Current | Low |
| Smear & Dark Sun Suppression | Yes |
| Dual-Frame (A/B) Configuration | Yes |
| Compliance | RoHS, CE, FCC, FDA 21 CFR Part 11 (software-controlled audit trail optional) |
| Brand | IMPERX |
|---|---|
| Origin | USA |
| Model | Tiger T8810 / T8820 |
| Sensor | ON Semiconductor KAI-47051 CCD |
| Resolution | 8856 × 5280 (47 MP) |
| Frame Rate | T8810 — 3.5 fps, T8820 — 7 fps |
| Bit Depth | 12-bit internal processing |
| Interface | Camera Link (Base/Medium/Full configuration support) |
| Operating Temperature | −40 °C to +85 °C |
| Compliance | MIL-STD-810F certified |
| Housing | Industrial-grade sealed aluminum chassis |
| Brand | Impetux |
|---|---|
| Origin | Spain |
| Model | SENSOCELL |
| Laser Wavelength | 1064 nm (single-frequency) |
| Maximum Laser Power | 3 W |
| Number of Independent Optical Traps | 1–256 |
| Force Measurement Principle | Light Momentum Method (EP 2,442,316) |
| Force Resolution | <0.05 pN |
| Positional Accuracy | 1 nm |
| Displacement Precision | 0.1 nm |
| Trap Stiffness | 3 pN/mW·μm (for 1 μm polystyrene sphere) |
| Field of View | 70 μm × 70 μm (with 60× objective) |
| Trap Actuation Bandwidth | up to 25 kHz |
| Compatible Microscopy Modes | Brightfield, EPI, TIRF, Confocal, Super-resolution |
| Fluorescence Range | 405–670 nm |
| Sample Compatibility | Glass slides, petri dishes, microfluidic chips, live-cell incubation systems (e.g., OKOLAB) |
| Brand | Inframet |
|---|---|
| Origin | Poland |
| Model | NIMAX |
| Light Source Options | 2850 K halogen & 660 nm LED |
| Luminance Range | 2×10⁻⁵ to 200 lx |
| Luminance Resolution | 10 µlx (low-light range) |
| Collimator Apertures | 35 mm and 120 mm |
| Collimator Resolution | >30 lp/mrad (35 mm), >60 lp/mrad (120 mm) |
| Brightness Meter Range | 0.01–100 cd/m² |
| Operating Temperature | 5–40 °C |
| Dimensions | 1771 × 1429 × 553 mm |
| Weight | 130 kg |
| Power Supply | 110–230 VAC, 50/60 Hz |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | InnoSlab |
| Core Technology | Solid-State Diode-Pumped Slab Laser |
| Beam Shaping Capability | Customizable (Gaussian, 1D Top-Hat, 2D Square Top-Hat) |
| Wavelength Options | 1064 nm / 532 nm / 355 nm / 266 nm |
| Pulse Energy | Up to 60 mJ |
| Pulse Width | < 4 ns |
| Peak Power | Up to 7 MW |
| Repetition Rate | Up to 150 kHz |
| Average Output Power | Up to 600 W |
| Beam Quality | M² < 2.0 |
| Polarization Ratio | >100:1 |
| Energy Stability (RMS) | ≤4% |
| Beam Ellipticity (Far-Field) | <10% |
| Beam Diameter | 3 mm (nominal) |
| Divergence (Full Angle) | 225–500 µrad |
| Warm-up Time | 15–30 min |
| Brand | INSA Optics |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | FTmicro10 |
| Price Range | USD 84,000 – 112,000 |
| Brand | ZOLIX |
|---|---|
| Model | TSMW-XYZ-2A(L) |
| Handedness | Left-Handed (L suffix) |
| Y-Axis Travel | 25 mm |
| X- and Z-Axis Travel | 13 mm |
| Origin | Beijing, China |
| Manufacturer | ZOLIX Optics Co., Ltd. |
| Domestic Production Category | China-Made |
| Brand | ZOLIX |
|---|---|
| Model | TSMW-XYZ-1A(L) |
| Type | Manual Precision Optical Translation Stage |
| Configuration | Left-Handed (L-suffix) |
| Z-Axis Travel | 25 mm |
| X- and Y-Axis Travel | 13 mm each |
| Origin | Beijing, China |
| Manufacturer | ZOLIX Optics Co., Ltd. |
| Domestic Production | Yes |
| Pricing | Available Upon Request |
| Brand | Spectrum Technologies |
|---|---|
| Origin | USA |
| Model | 2860 |
| Magnification Range | 40×–140× |
| Interface | USB 2.0 |
| Illumination | Integrated LED |
| Software Included | Basic Imaging Suite (Labeling, Annotation, Timestamping, Scale Calibration) |
| Optional Upgrades | Real-time Video Capture Module (2860V), UV Illumination Variant (2860UV), Megapixel Sensor Version (2860MP), 3D Stereo Mount (2860HS), macOS-Compatible Software (2860MAC) |
| Compliance | CE, FCC, RoHS |
| Brand | IRISIOME |
|---|---|
| Origin | France |
| Model | SID Series |
| Wavelength Options | 515/532/775/780/1030/1064/1550/1560 nm |
| Average Output Power | 10 mW – 20 W |
| Pulse Width | 15–35 ps (FWHM) |
| Repetition Rate | 1 Hz – 2 GHz (continuous & burst mode) |
| Spectral Bandwidth | <1 nm (FWHM) |
| Pulse Energy | >1 µJ |
| Power Stability | <2% RMS |
| Timing Jitter | <10 ps RMS |
| Polarization | Linear, >20 dB |
| Beam Quality | M² <1.3 (free-space), fiber-coupled options available |
| Cooling | Air-cooled |
| Brand | ISS |
|---|---|
| Origin | USA |
| Model | Q2 |
| Fluorescence Lifetime Range | 100 ps – 100 ms |
| Time Resolution | ≤1 ps |
| Counting Rate | 65 MHz/channel |
| Detection Channels | up to 8 |
| Scan Mode | Galvo-based XY scanning (5 kHz) with closed-loop motorized stage |
| Spatial Resolution | configurable from 1×1 to 4096×4096 pixels |
| Frame Rate | up to 20 fps @ 256×256 |
| Spectral Range (detection) | 350–1100 nm & 900–1700 nm |
| Excitation Options | UV–Vis–NIR lasers, supercontinuum source, single- or two-photon excitation |
| Temperature Control | 77 K – 500 K |
| Compliance | GLP/GMP-ready data audit trail, FDA 21 CFR Part 11–compatible software architecture |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | iStar Series |
| Sensor Format | 512 × 512 or 1024 × 1024 |
| Image Intensifier Diameter | 18 mm or 25 mm |
| Phosphor Screen | P43 or P46 |
| Minimum Optical Gate Width | 2 ns |
| Delay Resolution | 25 ps |
| Total Trigger-to-Gate Delay | 40 ns |
| Gating Technology | Intelligate™ Synchronized MCP–Photocathode Gating |
| Onboard Digital Delay Generator | Yes |
| Remote Control Interface | Wireless |
| UV Response | Optimized for deep-UV with >10⁷ on/off contrast ratio |
| Compliance | Designed for GLP/GMP-compliant time-resolved imaging workflows requiring traceable timing control |
| Brand | Itioture |
|---|---|
| Origin | Taiwan |
| Manufacturer Type | OEM/ODM Producer |
| Model | XDRS-028 |
| Measurement Range (Salinity) | 0–28% w/w NaCl |
| Resolution | 0.1% |
| Accuracy | ±0.2% |
| Temperature Measurement Range | 0–40 °C |
| Temperature Accuracy | ±1 °C |
| ATC Range | 5–40 °C |
| Dimensions | 120 × 56 × 36 mm |
| Weight | 120 g |
| Display | Backlit LCD |
| Brand | JENSPRIMA |
|---|---|
| Origin | Shanghai, China |
| Model | innoCon 6800T |
| Product Type | Online Analyzer |
| Turbidity Range | 0.0–4.0 / 40.0 / 400.0 / 1000.0 NTU |
| SS Range | 0.0–10.0 / 100.0 / 1000.0 / 2000.0 mg/L |
| Resolution | 0.1 NTU, 0.1 mg/L |
| Operating Temperature | 0–60 °C |
| Accuracy | ±2% of full scale |
| Output | Dual 4–20 mA (turbidity & temperature), RS485 Modbus RTU |
| Enclosure Rating | IP65/NEMA 4X |
| Sensor Protection Rating | IP68 |
| Sensor Material | 316L stainless steel housing, custom optical glass |
| Sensor Dimensions | Ø42 mm × 210 mm L, 1" NPT male thread |
| Max Pressure | 4 bar |
| Cable Length | 10 m standard |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | CRYO ARM™ 200 II (JEM-Z200CA) |
| Acceleration Voltage | 200 kV |
| Magnification Range | ×100 to ×1,000,000 |
| Spherical Aberration Coefficient (Cs) | 1.5 mm |
| Chromatic Aberration Coefficient (Cc) | 1.8 mm |
| Specimen Temperature | ≤100 K |
| Sample Storage Capacity | Up to 12 cryo-samples |
| Energy Filter | Integrated Omega-type Energy Filter |
| Optional Software | JEOL Automated Data Acquisition System (JADAS) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | JEM-3300 |
| Price Range | USD 6.2–6.9 million (est.) |
| Acceleration Voltage | Up to 300 kV |
| Magnification Range | 2,000× – 1,000,000× |
| Electron Source | Cold Field Emission Gun (CFEG) |
| Energy Filter | Integrated Omega-Type Electron Energy Filter |
| Automation | Automated Sample Loading System, JADAS Software Suite, Phase Plate Compatibility, Köhler Illumination Optics |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | IB-19530CP |
| Price | USD 150,000 |
| Equipment Type | Ion Beam Sample Preparation System for Electron Microscopy |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-120i |
| Acceleration Voltage | Up to 120 kV |
| Magnification Range | 50× – 1,200,000× |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-2100Plus |
| Acceleration Voltages | 80, 100, 120, 160, 200 kV |
| Magnification Range | 50× to 1,500,000× |
| Point Resolution | 0.19 nm |
| Line Resolution | 0.14 nm |
| Minimum Probe Size | 0.5 nm |
| Tilt Range | ±25° |
| Condenser System | Three-Stage Lens Design |
| Pole Piece Options | UHR, HR, HT, HC, CRYO |
| Operating System | 64-bit Windows-based Control Interface |
| Integrated Detectors | STEM, EDS, CCD, EELS |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-2800 |
| Point Resolution | 0.21 nm |
| Lattice Resolution | 0.10 nm |
| STEM Resolution | 0.16 nm |
| Secondary Electron Resolution | 0.5 nm |
| EDS Configuration | Dual Ultra-High-Sensitivity Silicon Drift Detectors (SDD) |
| Lorentz Mode | Standard Equipment |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-ACE200F |
| Price | USD $3,000,000 |
| Acceleration Voltage | Up to 200 kV |
| Maximum Magnification | 2,000,000× |
| Point Resolution | 0.21 nm |
| Lattice Resolution | 0.10 nm |
| STEM Resolution | 0.136 nm |
| Information Limit | 0.11 nm |
| EDS Configuration | Dual Ultra-High-Sensitivity Silicon Drift Detectors (SDD) |
| Lorentz Mode | Standard |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-ARM200F(C)-NEO ARM |
| Acceleration Voltages | 30 kV, 80 kV, 200 kV |
| Magnification Range | 50× to 2,000,000× |
| Point Resolution | 0.078 nm (at 200 kV) |
| Energy Resolution | ≤0.3 eV (with monochromated cold FEG) |
| Configuration | Dual spherical aberration correctors (objective and condenser), integrated STEM/TEM/EELS/EDS platform |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-ARM300F2 |
| Price | USD 6.8M (est.) |
| Acceleration Voltage | Up to 300 kV |
| Magnification Range | 100×–2,000,000× |
| Guaranteed HAADF-STEM Resolution | 53 pm (300 kV, with ETA corrector + FHP2 polepiece) |
| EDS Detector | Dual large-area SDD (158 mm² total active area) |
| Solid Angle for EDS | 2.2 sr (with WGP polepiece) |
| Cs Corrector | JEOL 12-Pole Monochromator-Based Spherical Aberration (Cs) Corrector |
| Software | COSMO™ Auto-Aberration Correction Suite |
| Gun Type | Next-Generation Cold Field-Emission Gun (Cold-FEG) |
| Environmental Shielding | Integrated Active Vibration & Acoustic Damping Enclosure |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-F200 |
| Price | USD $2,000,000 |
| Acceleration Voltage | Up to 200 kV |
| Magnification Range | 50× – 2,000,000× |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JIB-4700F |
| Instrument Type | Benchtop Dual-Beam FIB-SEM |
| Electron Source | Cold Field Emission Gun (CFEG) |
| Secondary Electron Resolution | 1.2 nm @ 15 kV, 1.6 nm @ 1 kV |
| Backscattered Electron Resolution | 2.5 nm |
| FIB Resolution | 5 nm @ 30 kV |
| Magnification Range | 25× – 1,000,000× |
| Acceleration Voltage | 0.1–30 kV |
| Maximum FIB Current | 90 nA |
| Maximum SEM Probe Current | 300 nA |
| Gas Injection System | Up to 3 independent channels |
| Sample Stage | 5-axis fully aligned motorized stage |
| Maximum Sample Diameter | 150 mm |
| Sample Loading | Airlock-style exchange |
| Detector Interfaces | EDS, EBSD, STEM, SE/BSE |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JIB-PS500i |
| Electron Beam Resolution | 0.7 nm @ 15 kV, 1.0 nm @ 1 kV |
| Ion Beam Resolution | 3 nm |
| Maximum Ion Beam Current | 100 nA |
| Maximum Electron Beam Current | 500 nA |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT210 |
| Instrument Type | Floor-standing |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm @ 30 kV |
| Magnification Range | 5× – 300,000× |
| Accelerating Voltage | 0.5–30 kV |
| Backscattered Electron Resolution | 4 nm (Low Vacuum Mode) |
| Maximum Sample Dimensions | Ø150 mm × 53 mm height |
| Specimen Chamber Expansion Ports | Multiple |
| Stage Type | Motorized 5-Axis Stage |
| Standard Detectors | Everhart-Thornley SE Detector, Solid-State BSE Detector |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT510 |
| Instrument Type | Floor-standing SEM |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm @ 30 kV, 15 nm @ 1 kV |
| Backscattered Electron Resolution | 4 nm @ 30 kV |
| Accelerating Voltage Range | 0.3–30 kV |
| Magnification Range | 14×–800,000× (on display) |
| Vacuum Mode | Low-vacuum compatible with LHSED detector |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT710HR |
| Instrument Type | Benchtop SEM |
| Electron Source | Thermal Field Emission Gun (TFEG) |
| Secondary Electron Resolution | 1 nm @ 30 kV |
| Backscattered Electron Resolution | 2 nm @ 30 kV |
| Accelerating Voltage | 0.1–30 kV |
| Maximum Magnification | 1,000,000× |
| Probe Current | Up to 300 nA |
| Sample Chamber | Large-volume, front-loading with wide-access door |
| Operating Modes | High Vacuum / Low Vacuum (LV/LA variants available) |