Optical Instruments
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| Brand | Ophir |
|---|---|
| Origin | Israel |
| Model | VEGA |
| Probe Compatibility | Thermopile, Pyroelectric, Photodiode, BeamTrack, RP Sensors |
| Display | 320×240 TFT Color LCD |
| Data Storage Capacity | 250,000 readings |
| Sampling Rate (with Pyroelectric Probes) | Up to 4,000 Hz |
| Interface | USB 2.0, RS232, Optional GPIB |
| Software Integration | StarLab, StarCom, LabVIEW, COM Object, ActiveX |
| Compliance | CE, RoHS, ISO/IEC 17025 traceable calibration support |
| Origin | Beijing, China |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Domestic |
| Model Variants | OMHS, OMMB, OMLH |
| Pricing | Available Upon Request |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | OTBS Series |
| Height | 700 mm (standard) |
| Height Adjustment Range | OTBS36-1: +30 mm |
| OTBS66-1 | −10 mm |
| OTBS69-1 | ±0 mm (fixed) |
| OTBS612-1 | ±0 mm |
| OTBS1218-1 | ±0 mm |
| Compatible Mounting Surface | OTBB-series ferromagnetic stainless steel breadboards |
| Load Capacity | Designed for light-to-medium optical payloads (<25 kg per stand, typical configuration) |
| Construction | Heavy-gauge steel frame with vibration-damping rubber feet |
| Footprint Compatibility | Matches standard OTBB breadboard hole patterns (M6 threaded holes on 25 mm grid) |
| Brand | OPTON |
|---|---|
| Model | OIA |
| Origin | Beijing, China |
| Type | Domestic |
| Price | USD 350,000 (approx.) |
| Core Technology | Reflected-light Polarized Optical Microscopy + AI-powered Image Recognition & Quantitative Phase Analysis |
| Brand | auniontech (distributor) |
|---|---|
| Origin | Switzerland |
| Product Type | Motorized Liquid Lens Integration Module |
| Mount | S-Mount & C-Mount |
| Sensor Compatibility | 4/3" Format |
| Focal Length Range | 5–300 mm |
| Aperture | Low f-number, vignetting-free design |
| Form Factor | Compact integrated optical module |
| Compliance | Designed for industrial vision integration per ISO 10110 optical manufacturing standards |
| Brand | Auniontech (Distributor) |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Optical Instrument Component |
| Model Designation | ELM-T Series Telecentric Lens Module |
| Pricing | Available Upon Request |
| Brand | AtumLaser |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Erbius-SF-1550-X |
| Output Power Options | 1 W, 5 W, 10 W |
| Center Wavelength | 1550 nm (tunable within 1535–1580 nm) |
| Linewidth (FWHM) | < 1 kHz |
| Beam Quality (M²) | ≤ 1.05 |
| Power Stability | < ±1% RMS over 8 hours |
| Relative Intensity Noise (RIN) | < −120 dB/Hz @ 1 MHz peak |
| Polarization | Linear (optional) or Random |
| Piezo Tuning Bandwidth | Up to 10 kHz |
| Thermal Tuning Range | 500 pm |
| Operating Temperature | 15–35 °C |
| Cooling | Conductive + optional air cooling |
| Compliance | RoHS, CE, FDA 21 CFR Part 11 (software-controlled variants), ISO 9001-manufactured subsystems |
| Brand | Otsuka Electronics |
|---|---|
| Origin | Japan |
| Model | RETS-100nx |
| Measurement Range (Retardation) | 0–60,000 nm |
| Wavelength Range | 400–800 nm (optional extensions available) |
| Retardation Repeatability (n=30) | ≤0.08 nm (quartz waveplate, ~600 nm) |
| Cell Gap Range | 0–600 µm (An=0.1) |
| Cell Gap Repeatability (n=30) | ≤0.005 µm (at ~3 µm gap, An=0.1) |
| Axis Detection Repeatability (n=30) | ≤0.08° |
| Spot Diameter | φ2 mm (standard) |
| Light Source | 100 W halogen lamp |
| Detector | Proprietary high-speed multichannel spectrometer (≈500 wavelength channels) |
| Standard Stage | 100×100 mm fixed platform |
| Optional Accessories | Motorized XY stage, tilt-rotary stage for Rth and 3D birefringence analysis, axis-angle compensation module |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | iKon-M (912 & 934 variants) |
| Sensor Format | 512 × 512 (iKon-M 912) / 1024 × 1024 (iKon-M 934) |
| Effective Pixels | 4 Megapixel (iKon-M 934) |
| Pixel Size | 24 µm (iKon-M 912) / 13 µm (iKon-M 934) |
| Quantum Efficiency | >90% (iKon-M 912), up to 95% (iKon-M 934) |
| Read Noise | ≤3 e⁻ RMS |
| Full Well Capacity | 300,000 e⁻ (iKon-M 912) |
| Cooling | TE-cooled UltraVac™ vacuum enclosure to –100 °C |
| Readout Speeds | 50 kHz to 5 MHz |
| Dark Current | <0.0001 e⁻/pix/sec at –100 °C |
| Compliance | CE, RoHS, ISO 9001 certified manufacturing |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | iKon-XL CCD |
| Price Range | USD 13,500 – 68,000 (est.) |
| Effective Pixels | 16.8 Megapixel |
| Pixel Size | 15 × 15 µm |
| Sensor Type | Back-Illuminated CCD (e2v CCD231-84 or CCD230-84) |
| Cooling Method | Thermoelectric (TE) with ColdSpace™ |
| Operating Temperature | −100 °C |
| Quantum Efficiency | Up to 95% (deep-depletion NIR-enhanced) |
| Read Noise | ≤ 2.1 e⁻ |
| Full Well Capacity | 350,000 e⁻ |
| Digitization | 18-bit ADC |
| Interface | USB 3.0 or Fiber Optic |
| Readout Modes | Single-channel or Quad-channel (quadrant-balanced) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | iXon 888 |
| Pixel Size | 13 µm |
| Sensor Type | Back-Illuminated Electron-Multiplying CCD |
| Quantum Efficiency | >95% (peak) |
| Cooling | Thermoelectric (−80 °C typical operating temperature) |
| Readout Modes | EMCCD and conventional CCD |
| Frame Rate | Up to 30 fps at full resolution (configurable via ROI and binning) |
| Interface | USB 3.0 |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | Marana 4.2B-6 |
| Image Resolution | 2048 × 2048 |
| Pixel Size | 6.5 µm × 6.5 µm |
| Sensor Active Area | 13.3 mm × 13.3 mm |
| Onboard Memory | 1 GB |
| Readout Speed | 310 MHz |
| Dynamic Range | 34,000:1 |
| Quantum Efficiency | 95% |
| Cooling Temperature | −45 °C |
| Full-Frame Frame Rate | 74 fps |
| ROI (512 × 512) Frame Rate | 397 fps |
| Read Noise | 1.2 e⁻ |
| Vacuum-Sealed Housing | Yes |
| Mechanical Shutter | None |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Sona 4.2B-6 |
| Image Resolution | 2048 × 2048 |
| Pixel Size | 6.5 µm × 6.5 µm |
| Sensor Dimensions | 13.3 mm × 13.3 mm |
| Onboard Memory | 1 GB |
| Readout Speed | 310 MHz |
| Dynamic Range | 34,000:1 |
| Quantum Efficiency | 95% |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | blueDrive |
| Price Range | USD 13,500 – 68,000 |
| Instrument Type | AFM Accessory |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher ES EC-AFM |
| Price Range | USD 340,000 – 410,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM), Materials-Focused |
| Position Detection Noise | 625 Hz (RMS, bandwidth-corrected) |
| Sample Dimensions | Ø < 15 mm, Thickness < 5 mm |
| XY Stage Scan Range | 180 µm × 180 µm (optical field of view), with full 180 mm × 180 mm motorized sample positioning area |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher S |
| Instrument Type | Materials-Focused AFM |
| Closed-Loop Noise (X,Y) | <0.06 nm |
| Closed-Loop Noise (Z) | <0.05 nm |
| Height Noise | <0.015 nm |
| Sample Diameter | <15 mm (standard), <7 mm (high-stability configuration) |
| XY Stage Travel Range | 180 mm × 180 mm |
| Imaging Speed | Up to 10–100× faster than conventional AFMs |
| Probe Compatibility | Supports ultra-small probes (e.g., 3 × 9 µm optical spot size, optional) |
| Environmental Flexibility | Upgradeable to Cypher ES (environmental control) and Cypher VRS (video-rate scanning) |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Model | Cypher VRS |
| Instrument Type | Material-Focused Atomic Force Microscope |
| XY Positional Noise | <60 pm |
| Z Positional Noise | <50 pm |
| Maximum Sample Diameter | ≤15 mm |
| Maximum Sample Thickness | ≤7 mm |
| Sample Stage Travel Range | 180 mm × 180 mm |
| Scan Speed | Up to 625 lines/sec |
| Frame Rate | >10 fps at 512×512 pixel resolution |
| Excitation Method | blueDrive™ Photothermal Actuation |
| Compliance | ASTM E2539, ISO/IEC 17025-compatible operation, GLP/GMP-ready data integrity architecture |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Fast-Scan Scanning Capacitance Microscope (SCM) |
| Price Range | USD 25,000 – 65,000 |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Jupiter XR |
| Price Range | USD 320,000 – 385,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | 35 pm |
| Maximum Sample Diameter | 210 mm |
| XY Stage Travel Range | 200 mm × 200 mm |
| Scan Range | Up to 100 μm (full closed-loop) |
| Imaging Speed | 5–20× faster than conventional large-sample AFMs |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MFP-3D |
| Price Range | USD 135,000 – 205,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Z-Axis Positioning Noise | < 0.06 nm (RMS, in air) |
| X/Y Closed-Loop Scanning Noise | < 0.5 nm (RMS) |
| Sample Diameter | ≤ 80 mm |
| Sample Thickness | ≤ 25 mm |
| Visual Field of View | 200 mm × 200 mm (XY stage travel with optical alignment) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Scanning Microwave Impedance Microscopy (sMIM) |
| Instrument Type | Scanning Probe Microscope |
| Application Domain | Nanoscale Electrical Characterization |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Vero |
| Price | Upon Request |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | X&Y Sensor Noise < 60 pm, Z Sensor Noise < 50 pm |
| Sample Dimensions | Up to 15 mm in diameter, 7 mm in thickness |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecBattery |
| Detector Compatibility | Ultim Max / Xplore / UltimExtreme EDS detectors |
| Maximum Field Count | 10,000 fields per sample |
| Max Particle Count | 200,000 particles per sample |
| Throughput | Up to 30,000 particles/hour |
| EDS Count Rate Capability | Up to 400 kcps |
| Effective Detector Area | Up to 170 mm² |
| Software-Enabled Capabilities | Automated particle detection, multi-threshold contrast segmentation, morphology-based filtering, Z-focus stabilization across large-area scans, cross-field particle reconstruction, customizable classification logic, ASTM/ISO-compliant reporting templates, FDA 21 CFR Part 11-ready audit trail (optional configuration) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | AZtecFeature |
| Instrument Type | Benchtop SEM-EDS System |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 1.0 nm @ 15 kV, WD = 4 mm |
| Magnification Range | 20–2,000× (low mag) |
| Accelerating Voltage | 1–30 kV |
| Backscattered Electron Resolution | 4 nm @ 30 kV (low-vacuum mode) |
| Detector Configuration | Up to four Ultim Max SDDs supported |
| Real-time Particle Counting Capacity | Up to 200,000 particles per sample |
| Data Acquisition & Quantification Engine | Tru-Q® automated elemental identification and quantification |
| Peak Deconvolution | Advanced sum-peak correction for high-count-rate accuracy |
| Software Architecture | Native 64-bit multithreaded processing |
| Compliance | ASTM E1588–10e1 (GSR), ISO 16232 (cleanliness), VDA 19.1, USP <788>, GLP/GMP-aligned audit trail support |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecPharma |
| Compliance | FDA 21 CFR Part 11, EU Annex 11, GxP-aligned |
| Software Platform | AZtecLive-based |
| User Authentication | Integrated Windows Active Directory / LDAP |
| Audit Trail | Immutable, timestamped, user-attributed, inspector-accessible |
| Digital Signature | Enforced per action (acquisition, processing, reporting) |
| SOP Integration | Configurable acquisition profiles with version-controlled parameters |
| Real-time EDS Imaging | Elemental mapping with live spectral overlay comparison |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecTEM |
| Instrument Type | EDS Software Platform |
| Compatibility | JEOL 200 kV & 300 kV Transmission Electron Microscopes equipped with JED EDS detectors |
| Key Features | Point-and-ID analysis, LineScan, Elemental Mapping (TruMap, QuantMap), Drift Correction (AutoLock), Real-time Dynamic Imaging (AZtecLive) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecWave |
| Detector Type | Wavelength Dispersive Spectrometer (WDS) with Integrated EDS Compatibility (Ultim Max) |
| Roland Circle Radius | 210 mm |
| Energy Resolution | <10 eV (Mn Kα, typical) |
| Detection Limit | <100 ppm (matrix-dependent) |
| Peak-to-Background Ratio | >10,000:1 (typical for major elements) |
| Optical Geometry | Focusing Johann-type spectrometer with bent crystals |
| Incident Slit | Motorized, variable width |
| Installation | Tilt-mounted for minimal working distance dependency |
| Software Platform | AZtecWave v4.x or later |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-Blue One |
| Image Resolution | 0.5 MP (812 × 612), 1.7 MP (1608 × 1104), or 7.1 MP (3208 × 2200) |
| Pixel Size | 9 µm (0.5 MP & 1.7 MP variants), 4.5 µm (7.1 MP variant) |
| Sensor Diagonal | 9.6 mm (0.5 MP), 17.6 mm (1.7 MP & 7.1 MP) |
| Interface | CoaXPress 2.0 or SFP+ 10 GigE |
| Bit Depth | 14-bit |
| Quantum Efficiency | >70% @ peak (550–650 nm) |
| Read Noise | <1.5 e⁻ (typical, correlated double sampling) |
| Shutter Type | Global shutter |
| Compliance | GigE Vision v2.0, GenICam3 |