Optical Instruments
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| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-Blue One UV |
| Image Resolution | 2848 × 2848 |
| Pixel Size | 2.74 µm |
| Sensor Diagonal | 11.2 mm |
| Interface | CoaXPress 2.0 or SFP+ 10GigE |
| Bit Depth | 14-bit |
| Quantum Efficiency | >70% (peak in UV) |
| Shutter Type | Global Shutter |
| Spectral Range | 200–1000 nm |
| Cooling | Active thermoelectric stabilization down to 0 °C |
| Lens Mount | CS-mount (with C-mount adapter) |
| ADC Modes | 8-bit / 12-bit selectable |
| Analog Gain | up to 24 dB |
| Digital Gain | up to 48 dB |
| ROI & Multi-Window Support | Yes |
| Compliance | GigE Vision v2.0, GenICam v3.x |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | C-Nano |
| CCD Camera Resolution | 1244 × 1024 pixels |
| Maximum Pattern Acquisition Rate | 870 Hz |
| Spatial Resolution | 2 nm |
| Angular Resolution | < 0.05° |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-RED 2 ER |
| Effective Pixels | 640 × 512 |
| Pixel Size | 15 µm |
| Frame Rate | 600 fps (full frame), up to 32,066 fps (region-of-interest) |
| Spectral Range | 1.1–1.9 µm (C-RED 2 ER 1.9) or 1.2–2.2 µm (C-RED 2 ER 2.2) |
| Read Noise | < 50 e⁻ (1.9 µm version), < 40 e⁻ (2.2 µm version) |
| Cooling | Integrated dual-stage thermoelectric cooler (ΔT ≤ 60 °C vs. ambient) |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-RED 2 Lite |
| Effective Resolution | 640 × 512 |
| Pixel Size | 15 µm |
| Detector Type | InGaAs PIN photodiode array |
| Electronic Shutter Pulse Width | < 5 µs |
| Cooling | Passive thermoelectric stabilization (fanless) + optional water-cooled cold plate |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-RED 2 |
| Effective Resolution | 640 × 512 pixels |
| Pixel Size | 15 µm |
| Frame Rate | up to 600 fps |
| Read Noise | <30 e⁻ |
| Electronic Shutter Pulse Width | <5 µs |
| Maximum Exposure Time | 60 s |
| Dynamic Range | 93 dB |
| ADC Resolution | True 16-bit |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-RED 3 |
| Resolution | 640 × 512 pixels |
| Pixel Size | 15 µm |
| Readout Speed | Up to 600 fps (full frame) |
| Integration Time | < 5 µs (electronic shutter) |
| Cooling | Uncooled |
| Form Factor | Compact OEM-ready design |
| Power Consumption | < 5 W |
| Interface | Camera Link HS or 10 GbE |
| Spectral Range | 0.9–1.7 µm |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | C-RED New Space |
| Effective Pixels | 640 × 512 |
| Pixel Size | 15 µm |
| Full-Frame Frame Rate | 600 fps |
| Windowed Mode (32 × 4) | 32,066 fps |
| Read Noise | <30 e⁻ |
| Dynamic Range | 93 dB (True 16-bit mode) |
| Operating Temperature Range | -40 °C to +65 °C |
| Sensor Material | InGaAs (VGA array) |
| Cooling | Advanced passive/thermoelectric hybrid thermal management |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-RED One |
| Sensor Format | 320 × 256 |
| Pixel Size | 24 µm |
| Spectral Range | J/H/K bands (0.9–2.5 µm) |
| Readout Noise | Sub-electron |
| Max Frame Rate | 3500 fps (full frame) / 10 kHz (ROI) |
| Cooling | Integrated pulse-tube cryocooler to 90 K |
| Vacuum System | Sealed, autonomous regeneration |
| Vibration Reduction | 10× active suppression |
| Readout Modes | Global reset, rolling reset, single readout, CDS, multiple non-destructive reads (MDR) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | C-Swift |
| CCD Camera Resolution | 1244 × 1024 |
| Maximum Frame Rate | 870 Hz |
| Spatial Resolution | 2 nm |
| Angular Resolution | < 0.05° |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher ES Polymer Edition |
| Price Range | USD 420,000 – 700,000 (est.) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science |
| Position Detection Noise | 625 Hz |
| Sample Dimensions | Ø < 15 mm, Thickness < 5 mm |
| Stage Travel Range | 180 mm × 180 mm |
| Environmental Control | Sealed fluid/gas chamber compatible |
| Temperature Control Range | 0–250 °C |
| Nanomechanical Capabilities | Integrated NanoMechPro toolkit (Force Modulation, Contact Resonance, and HarmoniX™) |
| Excitation Method | blueDrive photothermal excitation for tapping mode |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Cypher VRS1250 |
| Instrument Type | Materials-Focused Atomic Force Microscope |
| Position Detection Noise | X&Y < 60 pm |
| Sample Dimensions | Ø ≤ 15 mm, Thickness ≤ 7 mm |
| Stage Travel Range | 180 mm × 180 mm |
| Software | SmartScan |
| Environmental Compatibility | Fully compatible with Cypher ES environmental control system (temperature-controlled sample stage: –30 °C to +250 °C) |
| Excitation Method | blueDrive™ photothermal excitation |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | iXon Ultra 897 |
| Pixel Size | 16 µm |
| Readout Speed | 17 MHz (full frame) |
| Frame Rate | 56 fps (512 × 512), 595 fps (128 × 128 ROI) |
| Cooling | Thermoelectric to −100 °C |
| Quantum Efficiency | Extended back-illuminated response (EX2 technology) |
| Gain Calibration | RealGain™ and EMCAL™ |
| Interface | USB 2.0 with raw data access |
| Operating Modes | EMCCD and conventional CCD |
| Software Features | OptAcquire, iCam, Counting Conversion, Edge Suppression |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Jupiter Discovery AFM |
| Pricing | Available Upon Request |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Matrix |
| Price Range | USD 320,000 – 385,000 |
| Instrument Type | Magnetic Force Microscope (MFM) Control System |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | NA-TKD |
| Compatibility | Fully compatible with Oxford Instruments Symmetry CMOS EBSD detectors |
| Configuration | Near-axis phosphor screen geometry |
| Primary Application | High-resolution crystallographic orientation and strain mapping in thin, beam-sensitive, or nanoscale materials |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | OCAM² |
| Sensor Type | Back-illuminated Frame-transfer EMCCD (OCAM²K) / Split-frame EMCCD with Embedded Electronic Shutter (OCAM²S) |
| Resolution | 240 × 240 pixels |
| Pixel Size | 24 µm |
| Maximum Frame Rate | 2067 fps (up to 3700 fps in binning mode) |
| Read Noise | Sub-electron (≤0.7 e⁻ rms) |
| Quantum Efficiency | >95% (400–900 nm) |
| Minimum Integration Time | <1 µs (OCAM²S, with 50 ns timing precision) |
| Image Transfer Time | 12 µs per frame |
| Output Latency | As low as 43 µs post-exposure |
| Clocking Speed | Up to 7 Mlines/s |
| Spectral Range | 400–900 nm |
| Cooling | Peltier-cooled (−40 °C typical operating temperature) |
| Compliance | CE, RoHS, ISO 9001-manufactured |
| Software Interface | GenICam-compliant, supports GigE Vision and custom SDKs |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | OmniGIS II |
| Gas Port Configuration | Single-port, multi-source compatible |
| Gas Capacity | Up to 3 primary gas sources + 2 auxiliary gases |
| Control Architecture | Pressure-feedback regulated flow control |
| Vacuum Compatibility | Adaptive operation across wide chamber pressure range (10⁻⁷ mbar to 10⁻¹ mbar) |
| Integration | Designed for SEM and FIB platforms |
| Compliance | CE-marked |
| Software Interface | Native integration with AZtec GIS Control Suite (v5.0+) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | OmniProbe (OP350, OP400, Cryo) |
| Drive Technology | Piezoelectric actuation |
| Positioning Resolution | Sub-nanometer |
| Operating Temperature Range (Cryo) | –180 °C to room temperature |
| Port Compatibility | Standard SEM/FIB vacuum feedthroughs (e.g., 60 mm, 80 mm) |
| Control Interface | Digital USB/Ethernet with real-time image-synchronized calibration |
| Compliance | Designed for GLP/GMP-aligned workflows |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Relate Correlative Imaging Software |
| Data Format Support | Aztec H5oina, AFM native formats (e.g., Gwyddion, Nanoscope, SPIP) |
| Primary Function | Multi-modal correlative analysis of SEM/TEM, EDS, EBSD, and AFM datasets |
| Compatibility | Integrated with Oxford Instruments Aztec and Symmetry platforms |
| Licensing | Node-locked or floating license options |
| Compliance | Supports GLP/GMP-aligned documentation workflows, audit-trail-ready metadata logging |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Symmetry S2 EBSD Detector |
| CCD Camera Resolution | 1244 × 1024 pixels |
| Pattern Resolution (High-Speed Mode) | 156 × 88 pixels |
| Spatial Resolution | 10 nm |
| Angular Resolution | 0.05° |
| Maximum Indexing Speed | 4500 patterns per second (pps) |
| Beam Current Requirement for 4500 pps | 12 nA |
| Integrated Forward Scatter Detectors (FSD) | 5-channel |
| Interface | Bellows-type SEM vacuum-compatible port with auto-calibrating tilt mechanism |
| Collision Avoidance | Proximity sensor–enabled retraction system |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Symmetry S3 |
| CCD Camera Resolution | 1244 × 1024 pixels |
| Maximum Acquisition Speed | 870 Hz (≥5700 patterns per second at 156 × 128 binning) |
| Spatial Resolution | 2 nm |
| Angular Resolution | <0.1° |
| Optical System | Lensless fiber-optic coupling |
| Sensor | Custom EBSD-optimized CMOS |
| Pattern Distortion | <1 pixel (sub-pixel guaranteed) |
| Sensitivity | up to 1000 pps/nA |
| Fluorescent Screen Travel Range | ±22 mm motorized vertical adjustment |
| Collision Protection | Patented proximity sensor system |
| Optional FSD | 5-diode front-scatter detector system |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TKD |
| Price Range | USD 1,400 – 7,000 |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Extreme Infinity ∞ |
| Quotation | Upon Request |
| Detector Type | Sidewall-Insertion (Side-Entry) |
| Energy Resolution | C Ka ≤ 46 eV @ 50,000 cps |
| Elemental Range | Li (Z=3) to Cf (Z=98) |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Extreme |
| Instrument Type | Multi-Detector Configuration |
| Energy Resolution | 127 eV (Mn Kα) |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 500,000 cps |
| Elemental Detection Range | Li to Bi |
| Detector Active Area | 100 mm² |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Max Infinity ∞ |
| Quotation | Upon Request |
| Detector Mounting | Tilting (Side-Entry) |
| Energy Resolution | C Ka < 46 eV @ 50,000 cps |
| Elemental Detection Range | Be (Z=4) to Cf (Z=98) |
| Detector Active Area Options | 40 mm², 65 mm², 100 mm², 170 mm² |
| Window Type | SuperATW (Atmospheric Thin Window) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Ultim Max |
| Detector Type | Tilting Insertion Mount |
| Energy Resolution | 127 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | 1,500,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 40–170 mm² |
| Window Type | Super-Atmospheric Thin Window (SATW) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Max TLE |
| Instrument Type | Side-Insertion EDS Detector |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | >200,000 cps (Xplore TEM), up to 400,000 cps (Ultim Max TLE, quantitative mode) |
| Elemental Detection Range | Beryllium (Be) to Californium (Cf) |
| Active Detector Area | 80 mm² (Xplore TEM), 100 mm² (Ultim Max TLE) |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | UltimMax TEM |
| Instrument Type | Side-entry (tilt-compatible) |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | 400,000 cps |
| Elemental Detection Range | Be to Cf |
| Detector Active Area | 80 mm² |
| Window Type | Windowless |
| Solid Angle | 0.2–0.6 srad |
| Low-Energy X-ray Sensitivity Gain | Up to 8× vs. conventional windowed detectors |
| In Situ Operation Temperature | Up to 1000 °C |
| Compatible Accelerating Voltages | Up to 200 kV |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | UltimMax TLE |
| Detector Type | Tilting Insertion Geometry |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Input Count Rate | 400,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 100 mm² |
| Window Type | Windowless |
| Solid Angle | 0.5–1.1 srad |
