Optical Laboratory Equipment
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| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Category | Domestic (China) |
| Model | ASMV5-TR |
| Pricing | Upon Request |
| Adjustment Axes | Z, θx, θy, θz |
| Vertical Travel (Tz) | 5 mm |
| Angular Range (θx, θy) | ±5° |
| Compatible Sub-Assemblies | TSMT5-1A Dual-Axis Tip-Tilt Stage, RSM82-1A Rotary Stage, TSMV5-1A Vertical Lift Stage |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | a |
| Wavelength Range | 300–1600 nm |
| Input Beam Diameter (1/e²) | 10 mm |
| Output Beam Diameter (dAiry) | 10 mm |
| Laser-Induced Damage Threshold | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Key | Brand: Asphericon |
|---|---|
| Design Wavelengths | 355 nm / 532 nm / 632 nm / 780 nm / 1064 nm |
| Max Input Aperture | 10.6–14.7 mm |
| Max Output Aperture | 22.5 mm |
| Magnification Options | 1.5× / 1.75× / 2.0× |
| Cascadable Units | up to 5 |
| Diffraction-Limited Performance | individually measured & certified |
| Laser Damage Threshold (coated) | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Material | Fused Silica or BK7 (as specified) |
| Surface Figure Error (RMS) | ≤0.018λ @ 532 nm (single unit), ≤0.040λ @ 532 nm (5-unit cascade) |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | a |
| Spectral Range | 350–2500 nm |
| Input Beam Diameter (1/e²) | 10 mm ±10% |
| Output Beam Diameter (FWHM) | 15.2–15.7 mm |
| Uniformity | >90% (RMS non-uniformity <10%) |
| Working Distance | ≥300 mm (a |
| Total Length | 89.6–93.6 mm |
| Wavefront Error (RMS) | 0.05λ @ design wavelength |
| Strehl Ratio | 0.9 |
| ISO Edge Steepness | 0.4 |
| Laser-Induced Damage Threshold (LIDT) | 12 J/cm², 100 Hz, 6 ns, 532 nm |
| Coating | Custom high-LIDT AR coatings available on request |
| Brand | asphericon |
|---|---|
| Model | a |
| Component Type | Optical Element |
| Design Wavelength | 780 nm |
| Output Beam Diameter (FWHM) | 15 mm |
| Input Fiber NA Range | 0.07–0.095 |
| Beam Uniformity | >90% |
| Working Distance | up to 2000 mm |
| RMS Wavefront Error | <0.05λ (measured: 0.02λ) |
| Strehl Ratio | >0.9 |
| Compatible Connectors | FC/PC, FC/APC |
| Diffraction-Limited Performance | Yes |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | TSM25-10-LD-B-632 |
| Thread | M28×0.75 mm |
| Outer Diameter Mount | 30 mm |
| Length | 92.3 mm |
| Input Beam Diameter (1/e²) | 10 mm (±10%) |
| Output Beam FWHM | 15.4 mm |
| Output Aperture | 15.4 mm |
| Stable Beam Profile Range | up to 1500 mm |
| Design Wavelength | 632 nm |
| Spectral Range | 530–800 nm |
| Laser Damage Threshold | 12 J/cm², 100 Hz, 6 ns @ 532 nm |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | TSM25-10-LD-B-780 |
| Mount Thread | M28×0.75 mm |
| Outer Diameter | 30 mm |
| Length | 92.8 mm |
| Input Beam Diameter (1/e²) | 10 mm (±10%) |
| Output Beam FWHM | 15.4 mm |
| Output Aperture | 15.4 mm |
| Stable Beam Profile Range | up to 1500 mm |
| Design Wavelength | 780 nm |
| Spectral Range | 620–1040 nm |
| Laser Damage Threshold | 12 J/cm² (100 Hz, 6 ns, 532 nm) |
| Brand | Asphericon |
|---|---|
| Material | UV-grade Fused Silica |
| Surface Form Error (RMSi) | ≤0.02 µm |
| Surface Roughness (Rq) | ≤0.5 nm |
| Laser Damage Threshold | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Coating Options | 7 standard AR coatings (X, A, K, B, L, C, M) |
| EFL Tolerance | ≤0.1% |
| Diameter Tolerance | +0/−0.05 mm |
| Center Thickness Tolerance | ±0.05 mm |
| Clear Aperture | ≥90% |
| Compliance | RoHS-compliant |
| Design Wavelengths | 240–1600 nm (model-dependent) |
| Stock Availability | Yes |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | AFL50-80-P-U |
| Material | Fused Silica |
| Surface Irregularity (RMSi) | < 500 nm |
| Wavefront RMS | < 235 nm |
| Diameter | 50 mm |
| Effective Focal Length (EFL) | 80 mm |
| Numerical Aperture (NA) | 0.29 |
| f/d ratio | 1.6 |
| Working Distance (WD) | 70.6 mm |
| Design Wavelength | 285 nm |
| Scratch-Dig | 20-20 |
| Coating Option | Standard AR (e.g., Coating B: 600–1050 nm, Rₐᵥg ≤ 0.4%) |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | AHL10-08-P-U |
| Material | S-LAH64 |
| Wavelength | 780 nm |
| Diameter | 10 mm |
| Numerical Aperture | 0.55 |
| Surface Irregularity (RMSi) | ≤0.1 µm |
| EFL Tolerance | ≤0.1% |
| Clear Aperture | ≥90% |
| Scratch-Dig | 60-40 |
| Diameter Tolerance | +0/−0.05 mm |
| Center Thickness Tolerance | ±0.05 mm |
| Laser Induced Damage Threshold | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Coating Options | Standard AR Coatings A (400–600 nm), B (600–1050 nm), C (1000–1600 nm) |
| Brand | asphericon |
|---|---|
| Origin | Germany |
| Model | ALL50-100-U-U |
| Material | N-BK7 |
| Diameter | 50 mm |
| Effective Focal Length (EFL) | 100 mm |
| f/d Ratio | 2.0 |
| Numerical Aperture (NA) | 0.24 |
| Working Distance (WD) | 93.4 mm |
| Design Wavelength | 780 nm |
| Surface Irregularity (RMSi) | < 100 nm |
| Wavefront RMS | < 51 nm |
| Scratch-Dig | 60–40 |
| Coating | Broadband AR (A/B/C series, optimized for 780 nm) |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | ASM25-10-C-1064 |
| Thread | M28×0.75 mm |
| Outer Diameter Mount | 30 mm |
| Length | 17.3 mm |
| Input Beam Diameter @1/e² | 10 mm |
| Output Beam Diameter (dAiry) | 10 mm |
| Design Wavelength | 1064 nm |
| Wavelength Range | 1000–1500 nm |
| Laser Damage Threshold | 12 J/cm², 100 Hz, 6 ns @ 532 nm |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | BAM25-175-B-632 |
| Design Wavelength | 632 nm |
| Expansion Ratio | 1.75× |
| Input Aperture | 12.4 mm |
| Output Aperture | 22.5 mm |
| Thread | M28×0.75 |
| Length | 34.8 mm |
| Diameter | 30 mm |
| Surface Irregularity (RMSi) | < 0.5 µm |
| Laser Damage Threshold (Coated) | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Coating Type | Broadband AR (600–1050 nm, Rₐᵥg ≤ 0.4%, Rₘₐₓ < 1.0%, AOI = 0°) |
| Compliance | RoHS |
| Brand | asphericon |
|---|---|
| Origin | Germany |
| Model | BAM25-200-B-632 |
| Design Wavelength | 632 nm |
| Expansion Ratio | 2.0× |
| Input Aperture | 10.6 mm |
| Output Aperture | 22.5 mm |
| Thread | M28×0.75 |
| Length | 34.8 mm |
| Coating Type | Broadband AR (600–1050 nm, R<1.0% max, R<0.4% avg at 0° AOI) |
| Laser Damage Threshold | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Surface Irregularity (RMSi) | <0.5 µm |
| Compliance | RoHS |
| Brand | Asphericon |
|---|---|
| Model | CHL Series |
| Material | S-LAH64 High-Refractive-Index Optical Glass |
| Surface Irregularity (RMSi) | ≤ 0.5 µm |
| EFL Tolerance | ≤ ±0.1% |
| Clear Aperture | ≥ 90% |
| Standard Coatings | A (400–600 nm), B (600–1050 nm), C (1000–1600 nm) |
| Laser Damage Threshold | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Conformance | ISO 10110-5 (Surface Form Tolerance) |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | CHL10-08-P |
| Material | S-LAH64 |
| Clear Aperture | 10 × 10 mm |
| Numerical Aperture (NA) | 0.54 |
| Design Wavelength | 780 nm |
| Coating | AR for 780 nm |
| Surface Figure Accuracy (RMS) | < λ/20 @ 633 nm |
| Surface Roughness (Ra) | < 5 Å |
| Focal Length (Tangential) | 8.0 mm |
| Focal Length (Sagittal) | ∞ (Cylindrical Geometry) |
| Damage Threshold | > 5 J/cm² @ 780 nm, 10 ns, 10 Hz |
| Brand | Asphericon (Germany) |
|---|---|
| Origin | Germany |
| Model | CHL15-12-P-U |
| Component Category | Optical Element |
| Surface Figure Error (RMSi) | ≤500 nm |
| Clear Aperture | 15 × 15 mm |
| Effective Focal Length (EFL) | 12 mm |
| Numerical Aperture (NA) | 0.54 |
| f/d Ratio | 0.8 |
| Working Distance (WD) | 9.2 mm |
| Design Wavelength | 780 nm |
| Substrate Material | S-LAH64 |
| Coating Options | AR Coating A (400–600 nm), B (600–1050 nm), or C (1000–1500 nm) |
| Brand | Asphericon (Germany) |
|---|---|
| Origin | Germany |
| Model | CHL30-26-P-U |
| Component Category | Optical Element |
| RMSi Surface Form Error | ≤500 nm |
| Size | 30 × 30 mm |
| Effective Focal Length (EFL) | 26 mm |
| Numerical Aperture (NA) | 0.52 |
| f/d Ratio | 0.87 |
| Working Distance (WD) | 21.5 mm |
| Design Wavelength | 780 nm |
| Substrate Material | S-LAH64 |
| Coating Options | AR Coating A (400–600 nm), B (600–1050 nm), or C (1000–1500 nm) |
| Brand | Asphericon |
|---|---|
| Model | S-LAH64 |
| Material | S-LAH64 optical glass |
| Surface Irregularity (RMSi) | ≤ 0.5 µm |
| EFL Tolerance | ≤ 0.1% |
| Diameter Tolerance | +0/−0.05 mm |
| Center Thickness Tolerance | ±0.05 mm |
| Clear Aperture | ≥90% |
| Standard AR Coatings | A (400–600 nm), B (600–1050 nm), C (1000–1600 nm) |
| Laser Damage Threshold | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | SQM25-10-A-532 |
| Thread | M28×0.75 mm |
| Outer Diameter Mount | 30 mm |
| Length | 17.3 mm |
| Input Beam Diameter @1/e² | 10 mm |
| Output Beam Diameter (FWHM) | 10 mm |
| Design Wavelength | 532 nm |
| Operating Wavelength Range | 500–620 nm |
| Laser Damage Threshold | 12 J/cm², 100 Hz, 6 ns @ 532 nm |
| Brand | Asphericon |
|---|---|
| Model | StockOptics Axicon |
| Type | Precision Fused Silica Axicon (Conical Lens) |
| Material | Fused Silica |
| Surface Figure (RMSi) | ≤ 0.07 µm |
| Surface Quality | 40–20 scratch-dig |
| Diameter Tolerance | +0/−0.1 mm |
| Center Thickness Tolerance | ±0.1 mm |
| Clear Aperture | ≥90% |
| Standard AR Coatings | A (400–600 nm), B (600–1050 nm), C (1000–1600 nm), X (240–380 nm) |
| Laser Damage Threshold | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Brand | asphericon |
|---|---|
| Origin | Germany |
| Model | UAM25-28-C-MII |
| Thread Type | Female/Female M28×0.75 |
| Length | 10.3 mm |
| Outer Diameter | 30 mm |
| Clear Aperture | 24.5 mm |
| Component Category | Optical Mounting Adapter |
| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | XFL25-005-U |
| Material | Fused Silica |
| Design Wavelength | 780 nm |
| Apex Angle | 0.5° |
| Component Type | Optical Element |
| Coating | AR-Coated for 780 nm (Standard) |
| Surface Quality | 20–10 Scratch-Dig |
| Wavefront Error | λ/10 @ 633 nm (typ.) |
| Clear Aperture | ≥90% of Diameter |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ASTN-D1-W150 |
| Component Category | Broadband Tunable Light Source |
| Light Source Configuration | Single 30 W Deep-UV Deuterium Lamp + 150 W Halogen Lamp |
| Typical Deuterium Lamp Lifetime | 1,000 h (min. 500 h) |
| Typical Halogen Lamp Lifetime | 50–2,000 h |
| Monochromator | CM110, f/3.9 |
| Grating Capacity | Dual pre-installed gratings |
| Interface | RS-232 Serial |
| Scan Modes | Bidirectional |
| Scan Units | nm, Å, cm⁻¹, eV |
| Optional IR Extension | SiC Thermal Source (1–16 µm) |
| Fiber Coupling Options | SMA, FC, CS Ferrule (AFCM-L-XX series, sold separately) |
| Filter Mount | AB202 |
| Filter Series | AB3XXX |
| Brand | ART Photonics |
|---|---|
| Origin | Germany |
| Model | newopto |
| Fiber Type | Chalcogenide (CIR) / Polycrystalline (PIR) |
| Transmission Range | 6500–1700 cm⁻¹ (CIR) / 3600–600 cm⁻¹ (PIR) |
| Max. Temp. | ≤90°C (CIR) / ≤100°C (PIR) |
| Total Length | 1 m (standard) |
| Shaft Length | 120 mm |
| Shaft Diameter | 10 mm |
| Shaft Material | PEEK |
| Protective Tube Material | PEEK |
| Connector | Long SMA (custom options available) |
| Detachable Loop Configuration | Single-loop, double-loop, triple-loop, and multi-loop variants |
| Brand | attocube Systems AG |
|---|---|
| Origin | Germany |
| Product Type | Motorized Translation Stage |
| Model | oPOSITIONING |
| Operating Temperature Range | 10 mK to 373 K |
| Magnetic Field Compatibility | Up to 31 T |
| Vacuum Compatibility | Down to 5×10⁻¹¹ mbar |
| Closed-Loop Positioning Resolution | 1 nm |
| Maximum Travel Range | 50 mm |
| Minimum Stage Footprint | 11 × 11 mm |
| Load Capacity | Up to 2 kg |
| Typical Step Size | 50 nm at 300 K, 10 nm at 4 K (linear actuators) |
| Control Options | Open-loop, RES (resistive sensor), or NUM (optical encoder) feedback |
| Brand | Attocube Systems AG |
|---|---|
| Origin | Germany |
| Model | ANR101/RES |
| Product Type | Motorized Translation Stage |
| Operating Temperature Range | 10 mK – 373 K |
| Magnetic Field Compatibility | 0 – 31 T |
| Vacuum Compatibility | Ambient – 5×10⁻¹¹ mbar |
| Closed-Loop Positioning Resolution | 1 nm |
| Maximum Travel Range | 50 mm |
| Minimum Stage Footprint | 11 × 11 mm |
| Load Capacity | Up to 2 kg |
| Actuation Voltage | 60 V or 150 V (low-voltage compatible) |
| Material | Beryllium Copper (BeCu) |
| Compliance | Designed for GLP/GMP-aligned quantum transport & optical spectroscopy workflows requiring traceable positioning under cryogenic, ultra-high vacuum, and high-field conditions |
| Brand | Attocube Systems AG |
|---|---|
| Origin | Germany |
| Product Type | Motorized Translation & Rotation Stage |
| Model | atto3DR |
| Sample Mounting Area | 4.9 mm × 4.9 mm × 1.2 mm |
| Electrical Contacts | 20-pin Chip Carrier Interface |
| Angular Range | ±90° per axis (mechanical reserve: ±10°) |
| Minimum Step Size | 1 m° @ 300 K |
| Max. Rotation Speed | ~30°/s @ 300 K |
| Feedback Sensor | Resistive Encoder |
| Encoder Resolution | ~6 m° |
| Repeatability | ~50 m° |
| Linearity Error | ~1% |
| Compatible Cryostat Environment | Dilution Refrigerators (down to <20 mK), He atmosphere |
| Plug-and-Play Integration | Yes |
| Control Interface | GUI & LabVIEW API |
| Brand | attocube Systems AG |
|---|---|
| Origin | Germany |
| Product Type | Motorized Translation Stage |
| Model | attoECS |
| Travel Range | up to 50 mm |
| Minimum Step Size | 50 nm (open-loop), 10 nm (closed-loop with optical encoder) |
| Repeatability | ±200 nm |
| Accuracy | <0.01% of full scale |
| Load Capacity | up to 240 N (24 kg) |
| Operating Environment | Ambient air, dry nitrogen, or ultra-high vacuum (UHV) compatible |
| Drive Voltage | <45 V |
| Encoder Resolution (optional) | 1 nm |
| Dimensions (min) | 30 × 30 × 9.5 mm³ |
| Compliance | ISO 9001 certified manufacturing |
| Brand | AULTT |
|---|---|
| Model | AULTT-P |
| Type | Compact USB-Powered CCD Spectrometer with UV-VIS-NIR Coverage |
| Origin | Beijing, China |
| Manufacturer | Zhongjiaojinyuan (CNI) |
| Component Category | Light Source–Integrated Spectral Measurement System |
| Key Specifications | 185–1100 nm spectral range (model-dependent), 0.03 nm optical resolution, <0.3 nm wavelength repeatability, 30 µm slit, 600 lines/mm grating (optimized for UV or VIS), 2048- or 3648-pixel linear silicon CCD detector, USB 2.0 bus-powered operation |
| Software | Win7-compatible spectral acquisition & analysis suite with multi-instrument support, real-time exposure control, spectral video capture, and export to CSV, TXT, PDF, BMP |
| Compliance | Designed for laboratory-grade optical metrology in R&D, QA/QC, and educational environments |
| supports ASTM E308, CIE 15 | 2018, ISO/CIE 11664, and GLP-aligned data traceability (audit trail enabled in software log) |