Other Physical Property Testing Instruments
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| Brand | 3i |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | HEMS & LT-AC/DC |
| Pricing | Upon Request |
| Brand | 3i |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LT-AFM/MFM |
| Price | Upon Request |
| Operating Temperature Range | 20 mK – 300 K |
| Magnetic Field Capability | Up to 16 T |
| Displacement Noise Floor | 15 fm/√Hz (fiber interferometer, standard configuration) |
| Magnetic Resolution | 10 nm at 4 K |
| Interferometer Wavelength | 1310 nm |
| Fabry–Pérot Interferometer Noise Floor | 1 fm/√Hz (4–300 K) |
| Theoretical Shot-Noise Limit | 0.51 fm/√Hz |
| Scan Head Z-Range | 10 mm (stick-slip piezo stage) |
| XY Travel | Ø3 mm |
| Positioning Sensitivity | 50 nm |
| Scan Area Options (X×Y×Z @ Temp) | Ultra-Large: 200×200×7.2 µm @ 300 K, 50×50×4.8 µm @ 77 K, 30×30×2.4 µm @ 4.2 K |
| Large | 150×150×7 µm @ 300 K, 36×36×1.8 µm @ 77 K, 18×18×0.8 µm @ 4.2 K |
| Standard | 52×52×4.8 µm @ 300 K, 14×14×1.2 µm @ 77 K, 6×6×0.5 µm @ 4.2 K |
| Cantilever Alignment | Tri-point alignment chip (compatible with commercial cantilevers, no optical alignment required) |
| Scanner Architecture | Dual concentric piezotubes — inner tube for scanning, outer tube for coarse sample positioning |
| Scanner Electrodes | Quadrant electrodes + integrated excitation piezo for cantilever actuation |
| Signal Output | Analog BNC outputs (deflection, error, Z-feedback), LEMO interface to microscope control unit |
| Brand | 3i |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LT-APO OBJECTIVES |
| Price | Upon Request |
| Clear Aperture (CA) | 4.7 mm |
| Focal Length (FL) | 2.8–2.9 mm |
| Numerical Aperture (NA) | 0.82 |
| Working Distance (WD) | 0.95 mm (up to 1.45 mm depending on configuration) |
| Transmission Coating | Broadband AR coating (>80% average transmission) |
| Spectral Range (Visible-NIR) | 400–1000 nm |
| Apochromatic Correction Range (Df < ±1 D) | 540–780 nm (visible), 650–970 nm (NIR), and 930–1365 nm (IR) |
| Environmental Rating | Designed for cryogenic temperatures, high magnetic fields (≥16 T), and ultra-high vacuum (UHV, ≤10⁻⁹ mbar) |
| Physical Dimensions | Ø24 mm × 49 mm L |
| Mass | 46 g |
| Mount Thread | RMS (0.80″ × 36 TPI, 3 mm engagement depth) |
| Brand | 3i |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LT-SHPM/STM |
| Price | Upon Request |
| Max Applied Magnetic Field | ~16 T |
| Operating Temperature Range | 10 mK to 300 K |
| Hall Probe Resolution | ~1 µm |
| STM Resolution | Atomic-scale |
| Scan Ranges (XYZ @ Temp) | 200×200×7.2 µm @ 300 K |
| Brand | 3i |
|---|---|
| Origin | Germany |
| Model | MK-CONFOCAL/RAMAN MICROSCOPE (MK-CFM/RAMAN) |
| Objective | 0.82 NA, 0.95 mm working distance, cryo-compatible APO objective |
| Temperature Range | 10 mK to 300 K |
| Magnetic Field Compatibility | Up to 31 T |
| Scan Range | 50 × 50 × 25 µm @ 300 K / 30 × 30 × 15 µm @ 4 K |
| Sample Approach Range | XYZ ±6 × ±6 × ±12 mm, step size 50–700 nm |
| Closed-Loop Positioning | Resistive encoder, 200 nm resolution |
| Fine Scan Range | 7.5 µm @ 300 K / 1 µm @ 4.2 K |
| Max Sample Dimensions | 10 × 10 × 5 mm |
| Sample Holder | 8-pin electrical interface |
| Brand | 3i |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PIEZO ROTATOR |
| Price | Upon Request |
| Dimensions (L×W×H) | 35 mm × 35 mm × 11.5 mm |
| Weight | 65 g |
| Clear Aperture | 13 mm |
| Body Material | Titanium Alloy & Beryllium Copper (or Beryllium Copper Only for mK Operation) |
| Actuator | PZT Piezoceramic |
| Cabling | Insulated Twisted Pair — Copper for PZT, Phosphor Bronze for Resistive Sensor |
| Coarse Travel Range (Stepping Mode) | 360° Continuous |
| Max. Drive Speed (300 K) | ~32°/s |
| Input Voltage Range (PZT) | 0–60 V |
| Fine Angular Positioning Range (300 K) | 40 m° |
| Fine Angular Positioning Range (4 K) | 6 m° |
| Fine Positioning Resolution | µ° |
| DC Input Voltage Range (Sensor) | 0–100 V (300 K), 0–150 V (4 K) |
| Encoder Type | Cermet Resistive Sensor |
| Encoder Travel Range | 315° |
| Encoder Resolution | ~5 m° |
| Encoder Power Consumption (Active) | 10–100 µW |
| Repeatability (Unidirectional) | ±45 m° |
| Max. Static Load (RT) | 200 g |
| Max. Dynamic Torque about Axis | 2 N·cm |
| Environmental Compatibility | Ambient Temperature, Cryogenic (Down to 4 K), Ultra-High Vacuum (UHV), Bakeable to 100 °C |
| Brand | 3i |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NV-CENTRE CONFOCAL MICROSCOPY |
| Price | Upon Request |
| Objective NA | 0.82 |
| Working Distance | 0.95 mm @ 532 nm |
| Laser Source | SLM-stabilized 10 mW @ 532 nm |
| Scan Range | 30 × 30 × 15 µm at 4 K |
| Outer Diameter | 49 mm |
| Temperature Range | 10 mK – 300 K |
| Detector | Avalanche Photodiode (APD) |
| Sample Stage | XYZ Nanopositioning Platform, 6 × 6 × 12 mm travel |
| NV/QTF Sensor Stage | XYZ Nanopositioning Platform, 4 × 4 × 6 mm travel |
| Position Sensor Resolution | 200 nm |
| Controller | Ultra-low-noise FPGA-based AFM controller with high-speed USB interface |
| Real-time Processor | 32-bit, 128 MB DDR SDRAM |
| ADC | Dual-channel, 16-bit / 100 MHz |
| DAC | Dual-channel, 16-bit / 100 MHz |
| PID Loops | Seven digital PID controllers implemented on FPGA |
| Piezo Controller Channels | 19-channel |
| High-resolution ADC | 16-channel, 24-bit / 175 kHz |
| Scan Signal DAC | 24-bit XYZ output |
| High-voltage Amplifier | Low-noise design |
| Brand | 3nh |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | OEM/ODM Manufacturer |
| Country of Origin | China |
| Model | NQ-10-100A (Standard ISO 12233, 1×) / NE-10-100A (Enhanced ISO 12233, 1×) |
| Material | High-resolution photographic paper, semi-matte surface finish |
| Active Area Dimensions | 200 mm × 356 mm |
| Contrast | Normative (ISO 12233-compliant 4:1 luminance ratio) |
| Compliance | ISO 12233:2017 “Photography — Electronic still picture imaging — Resolution and spatial frequency responses” |
| Brand | A2PS / A2 Photonic Sensors |
|---|---|
| Origin | France |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | B-POP |
| Pricing | Available Upon Request |
| Brand | ABET Technologies |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | QE Measurement Systems |
| Pricing | Available Upon Request |
| Light Source | LED-based monochromatic source (DC to high-frequency modulation, no mechanical chopper required) |
| Focal Length | 250 mm |
| Monochromator Drive | Direct-drive grating mechanism |
| Spectral Range | 300–1800 nm |
| Output Coupling | Fiber-coupled, uniform beam profile |
| Detection | Dual-channel lock-in amplifier |
| Device Compatibility | Single-junction and multi-junction photovoltaic devices |
| Measurable Parameters | External Quantum Efficiency (EQE), Incident Photon-to-Current Efficiency (IPCE), Internal Quantum Efficiency (IQE) |
| Bias Voltage Range | ±10 V |
| Current Measurement Range | Up to 100 mA (I–V characterization) |
| Auxiliary Light Source | Optional broadband (white) or custom spectral source |
| Control & Processing | Integrated Windows OS with embedded DSP-based lock-in amplifier |
| Software | Photor™ — full-featured quantum efficiency analysis suite |
| Brand | ACM |
|---|---|
| Origin | Austria |
| Model | LAB.N2 |
| Measurement Range | 0–3 bar |
| Accuracy | ±0.05 bar |
| Repeatability | ±0.02 bar |
| Measurement Time | ≤60 s |
| Data Interface | ACM QUATROL System Integration |
| Power Supply | 24 VDC, 1.5 A |
| Dimensions | Ø32 cm × H56 cm |
| Weight | 8.20 kg |
| Brand | AD Systems |
|---|---|
| Origin | France |
| Model | ST10 |
| Compliance | ASTM D4740 |
| Operating Temperature | Filter Paper 100 °C ±0.2 °C, Fuel Sample 93 °C ±0.2 °C |
| Display | 7-inch capacitive touchscreen |
| Data Storage | Up to 100,000 test records with full image metadata |
| Connectivity | RJ45 Ethernet port, 4× USB 2.0 ports |
| Dimensions (W×D×H) | 420 × 350 × 222 mm |
| Weight | 9 kg |
| Power Supply | 230 V AC, 2 A, 50 Hz |
| Sample Handling | Manual droplet deposition via supplied micro-pipette |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | F-PEM |
| Operating Atmosphere | Ambient Air |
| Temperature Range | Room Temperature to 600 °C (Heating Zone) |
| Sample Size | Square, 40 mm × 40 mm × (5–30) mm Thickness |
| Power Supply | AC200V, 5 kW (Main Unit) |
| Dimensions | W600 × D600 × H1700 mm |
| Weight | ~120 kg |
| Contact Force | Up to 160 kgf (via Constant-Pressure Spring Mechanism) |
| Measured Parameters | Maximum Output Power (P<sub>max</sub>), Heat Flow Rate (Q), Thermoelectric Conversion Efficiency (η) |
| Brand | Advance Riko |
|---|---|
| Origin | Japan |
| Model | Mini-PEM |
| Operating Temperature Range (Hot Side) | 50–500 °C |
| Sample Dimensions | 2–10 mm × 1–20 mm (square/rectangular bulk) |
| Atmosphere | Vacuum-compatible |
| Measured Parameters | Thermoelectric conversion efficiency (η), electrical power output, heat flux |
| Measurement Principle | Simultaneous four-probe electrical characterization + calibrated heat flux sensor (thermopile-based) |
| Compliance | Designed for ASTM E3049–22 (Standard Practice for Measuring Thermoelectric Module Efficiency) and ISO 14405-1:2016 (Geometrical product specifications) alignment |
| Brand | Advance Riko |
|---|---|
| Origin | Japan |
| Model | Peltier Evaluation System |
| Measurement Atmosphere | Vacuum |
| Temperature Range | 27–80 °C |
| Sample Dimensions | Square, 10–25 mm side length, thickness ≤ 3 mm |
| Measured Parameters | ΔTₘₐₓ (maximum temperature difference), Qc,ₘₐₓ (maximum cooling power), COP (coefficient of performance) |
| Compliance | Designed for thermoelectric module characterization per ISO 14405-1 and ASTM D5470 practices |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | PEM-2 |
| Maximum Temperature Gradient | 500 °C (up to 800 °C heating surface) |
| Sample Geometry | Square, 20/30/40 mm × 5–30 mm thickness |
| Contact Pressure | 2 MPa (at 30 mm square sample) |
| Atmosphere | Inert gas compatible |
| Measurement Method | One-dimensional heat flux input method |
| Measured Parameters | Thermoelectric conversion efficiency (η), electrical power output (P), thermal input flux (Q) |
| Heating System | High-precision infrared gold-mirror furnace |
| Cooling System | Integrated water-cooled lower stage |
| Load Control | Automated variable resistive load adjustment |
| Software | Fully integrated control with thermal stability detection, real-time data logging, and automated test sequencing |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | WET-1200 |
| Temperature Range (Static Drop) | Ambient to 1500 °C |
| Temperature Range (Extrusion Drop, optional) | Ambient to 1200 °C |
| Sample Substrate | Ø10 mm × 2 mm |
| Measurement Atmospheres | Vacuum, Controlled Gas Flow, Ambient Air |
| Measurement Methods | Static Drop Method, Optional Extrusion Drop Method |
| Application Scope | High-temperature wettability analysis of molten metals, alloys, glasses, and ceramics against solid substrates |
| Brand | Advance Riko |
|---|---|
| Origin | Japan |
| Model | ZEM-3 |
| Temperature Range | 50–800 °C (ZEM-3M8) / 50–1000 °C (ZEM-3M10) |
| Sample Geometry | Square (2–4 mm × 6–22 mm L) or Circular (Ø2–4 mm × 6–22 mm L) |
| Heating Method | Infrared gold-coated furnace with micro-heater for ΔT control |
| Max. Sample ΔT | 50 °C |
| Atmosphere | Ultra-high-purity helium (99.999%) |
| Automation | Fully computer-controlled measurement with background EMF compensation |
| Contact Verification | Real-time V–I curve analysis for ohmic contact validation |
| Optional Accessories | Thin-film adapter, cryogenic module (−100 to 200 °C), high-resistivity kit (up to 10 MΩ) |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | ZEM-d |
| Temperature Range | Up to 200 °C (sample surface) |
| Sample Cross-Section | Ø20 mm (max) |
| Sample Thickness | 10 µm – 20 mm |
| Measured Properties | Seebeck coefficient (S), electrical resistivity (ρ) |
| Atmosphere | Air or inert gas (N₂, Ar) |
| Measurement Orientation | Through-thickness (z-direction) |
| Brand | Aerospace |
|---|---|
| Model | ZST-212 |
| Origin | Beijing, China |
| Category | Physical Property Testing Instrument |
| Price Range | USD 2,800 – 7,000 |
| Measurement Principle | Guarded DC Voltage Method (Three-Electrode System) |
| Compliance | ASTM D257, IEC 60093, GB/T 1410 |
| Resistance Range | 10⁴ Ω·m to 10¹⁶ Ω·m |
| Test Voltage | 10 V – 1000 V DC (adjustable in 10 V steps) |
| Environmental Control | Supports optional temperature/humidity chamber integration (23 °C ± 1 °C, 50 % RH ± 3 % RH) |
| Brand | Akrometrix |
|---|---|
| Origin | USA |
| Model | TTSM |
| Measurement Principle | Non-contact shadow moiré interferometry |
| Temperature Range | Ambient to 300 °C (optional -50 °C to 300 °C) |
| Z-axis Resolution | ≤1.25 µm (AKM600P variant) |
| Field of View | Up to 600 mm × 600 mm (AKM600P), 48 mm × 64 mm (DFP), 70 mm circular (CRE) |
| Data Acquisition Speed | <2 s per full-field measurement (up to 1.4 million data points) |
| Compliance | JEDEC JESD22-B112, JEITA ED-7306, IPC TM-650 2.4.22 (Bow & Twist), IPC-9641, ASTM E2923 |
| Brand | AMAE |
|---|---|
| Model | MI-200 |
| Flow Table Diameter | 254 mm ± 2.5 mm |
| Flow Table Thickness | 8 mm ± 0.1 mm |
| Drop Height | 12.5 mm ± 0.13 mm |
| Vibration Frequency | 25 Hz |
| Stroke Count Range | 1–9999 cycles (programmable) |
| Material | Brass flow table (Rockwell hardness ≥ HRB 25) |
| Compliance | ASTM C230-68, IMSBC Code Annex 1 (Moisture Content Testing for Flow Potential Assessment) |
| Sample Size Range | 1 mm ≤ particle size ≤ 7 mm |
| Environmental Requirement | Controlled temperature & humidity chamber, draft-free operation |
| Brand | AMAE |
|---|---|
| Model | MI-600 |
| Origin | Guangdong, China |
| Drive System | Hydraulic Accumulator |
| Tilt Range | 0–50° |
| Tilt Speed | Adjustable ≤ 0.3°/s |
| Angular Resolution | ≤ 0.5° |
| Test Chamber Dimensions | 600 × 400 × 200 mm (L×W×H) |
| Hydraulic Accumulator Dimensions | 500 × 500 × 450 mm (L×W×H) |
| Weight | 150 kg |
| Max Hydraulic Pressure | < 50 kPa/cm² |
| Sample Type | Non-cohesive granular solids ≤ 10 mm particle size |
| Brand | Analysis Tech |
|---|---|
| Origin | USA |
| Model | 128-105 |
| Channel Capacity | 128 independent DC resistance monitoring channels |
| Minimum Event Duration | 0.1 / 0.5 / 1.0 µs (field-replaceable clock modules support additional durations) |
| Threshold Resistance Range | 0.1–2000 Ω |
| Sensing Current Options | 1, 5, 10, 20, 50, 100 mA |
| Max Compliance Voltage | 2.5 V |
| Threshold Tolerance | ±5% |
| Event Detection Sensitivity | 100 ns |
| Operating Temperature | ≤35 °C |
| Power Supply | 120 VAC, 60 Hz, 6 A |
| Dimensions | 11.5" H × 18" W × 15.5" D |
| Weight | 51 lb |
| Interface | USB or RS-232C |
| Software | WinDatalog v5.x for data acquisition, event logging, and statistical analysis |
| Compliance | Designed for GLP/GMP-aligned test environments |
| Brand | Analysis Tech |
|---|---|
| Origin | USA |
| Model | 32-106 |
| Channel Capacity | 32 |
| Minimum Event Duration | 0.1 / 0.5 / 1.0 µs (field-replaceable clock module supports other durations) |
| Threshold Resistance Range | 0.1–2000 Ω |
| Channel Test Current | 1, 5, 10, 20, 50, 100 mA |
| Compliance Voltage | ≤2.5 V |
| Threshold Tolerance | ±5% |
| Interface | USB & RS-232C |
| Software | WinDatalog v5.x |
| Operating Temperature | ≤35 °C |
| Power Supply | 120 VAC, 60 Hz, 3 A |
| Dimensions (H×W×D) | 7.5″ × 18″ × 16.5″ |
| Weight | 26 lb |
| Warranty | 1 year parts and labor |
| Brand | Analysis Tech |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | STD Event Detectors |
| Pricing | Upon Request |
| Brand | Analysis Tech |
|---|---|
| Origin | USA |
| Model | STD Event Detectors Accessories |
| Type | Field-Upgradeable Hardware Modules and Interconnect Solutions for Electrical Continuity Interruption Testing |
| Compliance | Designed for use with ASTM F1978, IPC-TM-650 2.6.23, MIL-STD-883H Method 2014, and IEC 60068-2 environmental test correlation workflows |
| Brand | Anton Paar |
|---|---|
| Origin | Austria |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | Modulyzer |
| Pricing | Upon Request |
| Brand | Aolong |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Manufacturer |
| Region Category | Domestic |
| Model | CHIRAD165 |
| Pricing | Upon Request |
| Max. X-ray Tube Voltage | 160 kV |
| Beam Angle | 40° |
| Max. System Power | 6000 W |
| Focal Spot Size | 5.5 mm |
| SSD (Source-to-Sample Distance) | OEM-defined |
| Dose Rate Range | >600 Gy/min |
| Real-time Dosimetry | Yes (dose rate, cumulative dose, irradiation time) |
| Cooling System | Integrated closed-loop heat exchanger |
| Stage | Motorized wafer stage with XYZ motion and ±45° rotation |
| Control System | PLC-based |
| Safety Interlocks | Door interlock + warning light |
| Chuck | Coaxial high-temperature vacuum chuck (OEM) |
| Microscope | PSM1000 stereomicroscope with 2-MP HDMI CCD (optional) |
| Microscope Stage | 2″ × 2″ XY travel |
| Vibration-Isolation Table | 900 mm × 800 mm (final dimensions subject to integration) |
| Probe Interface | 3-axis coaxial probe holder |
| Auxiliary Equipment | Air compressor included |
| Optional Accessories | Low/high-temperature coaxial chucks, semi-automated probe station, dry-air purge system |
| Brand | Applied NanoFluorescence |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | Nano Spectralyzer NS3 |
| Pricing | Available Upon Request |