Other Semiconductor Inspection Instruments
Filter
Showing 1–30 of 68 results
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | AD3000T-PLUS |
| Pricing | Upon Request |
| Brand | Accretech |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | ChaMP-211 / ChaMP-232 / ChaMP-332 |
| Wafer Sizes Supported | 100 mm, 150 mm, 200 mm, and 300 mm |
| Head Configurations | 2–8 inch carrier compatibility |
| Footprint | Compact design optimized for R&D, pilot-line, and high-mix production environments |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Netherlands |
| Model | ChaMP-211 |
| Wafer Sizes Supported | 100 mm, 150 mm, 200 mm |
| Polishing Head Configurations | 2–8 inch |
| Automation Options | Optional auto-loader integration |
| Cleaning System | Integrated post-polish cleaning module |
| Endpoint Detection | Optional optical endpoint monitoring |
| Air-bearing Carrier Design | Yes |
| Edge Control | Ring-type independent pressure zones |
| Quick-change Retainer/Retaining Ring | <60-second swap time |
| Footprint | Compact design for R&D and pilot-line integration |
| Compliance | Designed to meet semiconductor cleanroom requirements (ISO Class 5 compatible), supports GLP/GMP-aligned process documentation workflows |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | ChaMP-232 |
| Wafer Compatibility | Φ100 mm, Φ150 mm, Φ200 mm |
| Polishing Head Type | Pneumatic Floating Head with Zonal Pressure Control |
| Endpoint Detection | Integrated Optical End-Point Monitoring System |
| Cleaning Module | Integrated ChaMP Wet Cleaning System |
| Compliance | Designed for Semiconductor Front-End Manufacturing Environments |
| Vendor Status | Authorized Distributor (Non-OEM) |
| Import Category | Imported Equipment |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Semiconductor CMP Equipment |
| Model | ChaMP-332 |
| Wafer Compatibility | Φ300 mm and Φ200 mm |
| Polishing Head Type | Pneumatic Floating Carrier with Zonal Pressure Control |
| Endpoint Detection | Integrated Optical End-Point Monitoring System |
| Cleaning System | Integrated ChaMP Wet-Cleaning Module |
| Edge Exclusion | ≤1.0 mm |
| Carrier Change Time | <60 seconds (ring-only replacement) |
| Compliance | Designed for ISO 14644-1 Class 5 cleanroom integration |
| Software Architecture | Windows-based control with audit trail and user access levels |
| Brand | ACCRETECH (Tokyo Seimitsu) |
|---|---|
| Origin | Netherlands |
| Model | Fortia |
| Wafer Size Support | Φ200 mm |
| Application Focus | DC High-Current/High-Voltage, Avalanche (L-Load), and Wide-Temperature Range Characterization of Power Devices |
| Temperature Range | -65 °C to +300 °C (configurable) |
| Probe Card Compatibility | Up to 330 mm² PLP (Probe Landing Pad) |
| Interface Standards | GEM/SECS-II, TCP/IP, GB-IB, VegaNet |
| Motion Control | Integrated ATi Unit (ACCRETECH TESEC Interface) with DARUMA Stage and Pressurized Chuck |
| Safety Features | Fast Path Interruption during Avalanche Testing, Fault-Triggered Electrical Isolation |
| Brand | Accretech |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Semiconductor Processing Equipment |
| Model | HRG3000RMX |
| Pricing | Available Upon Request |
| Brand | Acculogic |
|---|---|
| Origin | Canada |
| Model | FLS980 |
| Configuration | Dual-Sided, Closed-Loop, Up to 22 Probes |
| Minimum Step Resolution | 1 µm |
| Positioning Repeatability | ±10 µm |
| Programmable Probe Tilt | ±6° |
| Max PCB Size | 813 × 965 mm (32″ × 38″) |
| Max Component Height | 85 mm |
| Max Probe Tip Radius | 50–500 µm |
| Analog Measurement Speed | Up to 1000 measurements/sec |
| 4-Wire Capability | Full per probe |
| Test Channel Count | Up to 128 non-multiplexed channels |
| Warpage Compensation | LaserScan + High-Resolution Vision |
| Compliance | Supports GLP/GMP audit trails, ASTM F2622 (for electronic assembly test systems), ISO/IEC 17025 traceability frameworks |
| Brand | Acculogic |
|---|---|
| Origin | Canada |
| Model | Acculogic FLS980 |
| Type | Flying Probe Tester for PCBs |
| Positioning Repeatability | ±10 µm |
| Minimum Step Resolution | 1 µm |
| Programmable Probe Angle | ±6° |
| Max. Configurable Probes | 22 (dual-side) |
| Max. PCB Size | 813 × 965 mm (32″ × 38″) |
| Max. Component Height | 85 mm |
| Max. Probe Tip Radius Range | 50–500 µm |
| Measurement Speed | Up to 1000 measurements/sec |
| Electrical Test Capability | Analog, Digital, Mixed-Signal, Boundary Scan (JTAG), Powered Functional Test up to GHz range |
| Compliance | Supports GLP/GMP audit trails, ASTM F2413-18 (PCB test methodology reference), ISO/IEC 17025 traceability framework (via software logging) |
| Brand | Acculogic |
|---|---|
| Origin | Canada |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | ACCULOGIC FLS980 Series |
| Pricing | Upon Request |
| Brand | Acculogic |
|---|---|
| Origin | Canada |
| Model | FLS980 Series |
| Configuration | Dual-Sided, Closed-Loop System |
| Maximum Probe Modules | 22 (top + bottom) |
| Minimum Step Resolution | 1 µm |
| Positioning Repeatability | ±10 µm |
| Programmable Probe Angle | ±6° |
| Max PCB Size | 813 × 965 mm (32″ × 38″) |
| Max Component Height | 85 mm |
| Max Probe Tip Height | 45 mm |
| Tip Radius Range | 50–500 µm |
| Tip Profiles | Needle, Cup, Dome |
| Measurement Speed | Up to 1000 measurements/sec |
| Analog Test Capability | 4-wire per probe |
| Supported Test Modes | 2-wire, 4-wire, Quasi-4-wire, Powered Functional Test, Boundary Scan (JTAG), NetScan™ |
| Laser-Based Board Warpage Compensation | Yes |
| Vision System | High-Resolution Reference Camera with Advanced Image Processing |
| Motion Architecture | Frictionless Air-Gap Linear Shuttles |
| Compliance Framework | Supports GLP/GMP audit trails, ISO/IEC 17025 traceability workflows, and FDA 21 CFR Part 11–ready software logging (via Integrator™) |
| Brand | Acculogic |
|---|---|
| Origin | Canada |
| Model | FLS980 Series III |
| Positioning Repeatability | ±10 µm |
| Minimum Step Resolution | 1 µm |
| Maximum PCB Size | 813 × 965 mm (32" × 38") |
| Programmable Probe Angle | ±6° |
| Max. Probe Count (Top + Bottom) | 22 |
| Measurement Speed | Up to 1000 measurements/sec |
| Electrical Test Capabilities | Analog, Digital, Mixed-Signal, Boundary Scan (JTAG), Powered Functional Test (up to GHz range) |
| Warpage Compensation | LaserScan-enabled Z-axis mapping |
| Vision System | High-resolution fiducial camera with advanced image processing |
| Compliance Support | ASTM F2413-18 (for test system validation), ISO/IEC 17025 traceability framework, GLP/GMP-aligned audit trail in Integrator™ software |
| Brand | Acculogic |
|---|---|
| Origin | Canada |
| Model | FLS980 Series III |
| Positioning Repeatability | ±10 µm |
| Minimum Step Resolution | 1 µm |
| Max. Configurable Probes | 22 (dual-sided) |
| Programmable Probe Tilt Angle | ±6° |
| Max. PCB Size | 813 × 965 mm (32″ × 38″) |
| Max. Component Height | 85 mm |
| Max. Probe Tip Radius Range | 50–500 µm |
| Analog Measurement Speed | up to 1000 measurements/sec |
| Test Channel Count (non-multiplexed) | up to 128 |
| Laser-Based Board Warpage Compensation | Yes |
| Vision System | High-resolution fiducial camera with advanced image processing |
| Compliance | Designed for GLP/GMP-aligned test environments |
| Brand | Acculogic |
|---|---|
| Origin | Canada |
| Model | FLS980Dxi |
| Motion Control | Closed-loop linear motor shuttles |
| Minimum Step Resolution | 1 µm |
| Positioning Repeatability | ±10 µm |
| Maximum Probes | 22 (top + bottom) |
| Programmable Probe Tilt | ±6° |
| PCB Max Size | 813 × 965 mm (32″ × 38″) |
| Max Component Height | 85 mm |
| Max Probe Height | 45 mm |
| Tip Radius Range | 50–500 µm |
| Tip Geometry Options | Needle, Cup, Dome |
| Analog Measurement Speed | Up to 1000 measurements/sec |
| Measurement Modes | 2-wire, 4-wire, quasi-4-wire |
| Stimulus/Measurement Resources | Dual independent channels |
| Supported Test Types | Analog, Digital, Mixed-Signal, Boundary Scan (JTAG), NetScan™ |
| Warpage Compensation | Integrated LaserScan™ and high-res fiducial camera |
| Software Platform | Integrator™ with motion control & measurement algorithms |
| Compliance Framework | Supports GLP/GMP audit trails, ASTM F2627 (for PCB test system validation), ISO/IEC 17025 traceability workflows |
| Brand | Acculogic |
|---|---|
| Origin | Canada |
| Model | SCORPION FiS 640 |
| Maximum Test Points | 1024 |
| Board Size Capacity | 350 mm × 400 mm |
| Fixture Change Time | < 60 s |
| Operating System | Windows-based |
| Embedded Network Analyzer | Yes |
| Software Compatibility | Compatible with Acculogic Flying Probe Test (FPT) platforms |
| Footprint | 1050 mm × 1050 mm |
| Fixture Reusability | Supports legacy SCORPION iCT7000 fixtures |
| Programmable Power Supply Integration | Up to 4 external iTH 7000-grade units (optional) |
| Brand | Acculogic |
|---|---|
| Origin | Canada |
| Model | SCORPION iCT7000 |
| Maximum Test Points | 8192 |
| Board Size Capacity | 350 mm × 400 mm |
| Fixture Change Time | < 60 s |
| Operating System | Windows-based |
| Embedded Network Analyzer | Yes |
| Software Compatibility | Flying Probe Tester (FPT) software formats |
| Power Integration | Up to 4 external high-performance programmable power supplies |
| Compliance | Designed for IPC-A-610, IPC-J-STD-001, and ISO 9001-aligned manufacturing environments |
| Interface Protocol | SMEMA-compatible (via optional iTH7000 handler integration) |
| Brand | Aisida |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | TDR-200 Series |
| Pricing | Available Upon Request |
| Impedance Range | 20–150 Ω |
| Measurement Accuracy | ±1% at 50 Ω |
| Measurement Length | 0.09–2.0 m |
| Horizontal Resolution | 0.2 mm |
| Vertical Resolution | 0.05 Ω |
| Test Method | Time-Domain Reflectometry (TDR) |
| Standards Compliance | IPC-TM-650 2.5.1, IPC-2141A |
| Channel Options | 2-, 4-, or 8-channel configurations |
| Interface | Windows-based GUI with integrated test file editor |
| Brand | aixACCT Systems GmbH |
|---|---|
| Model | ESPY31 |
| Origin | Germany |
| Core Principle | Direct quasi-static force–charge transduction under controlled mechanical loading |
| Measurement Standards | Traceable to PTB (Physikalisch-Technische Bundesanstalt) calibration protocols |
| Key Specifications | d₃₁/d₃₂ range: 0.05–2000 pC/N |
| Force resolution | 0.1 mN (static/dynamic) |
| Current resolution | 100 fA |
| Charge accuracy | sub-pC |
| Repeatability (PVDF) | < 0.03 pC/N (1σ) |
| Reproducibility (PVDF) | < 0.1 pC/N |
| Frequency range | 0.1–500 Hz |
| Static preload | 0.1–5 N |
| Dynamic load | 0–1000 mN |
| Sample dimensions | 4.5 mm × 2 mm, thickness 10 µm–1 mm |
| Environmental operation | −20 °C to +80 °C, 10–85 % RH |
| Compliance | ASTM D790, ISO 6722, IEC 62047-23, USP <1051>, GLP-compliant data audit trail |
| Brand | aixACCT |
|---|---|
| Origin | Germany |
| Model | TF Analyzer 1000 |
| Voltage Range | ±12 V (expandable to ±10 kV) |
| Frequency Range | 0.01 Hz – 1 kHz |
| Fatigue Test Frequency | up to 50 kHz |
| Minimum Pulse Width | 20 µs |
| Output Impedance | 50 Ω |
| Max Capacitive Load | 100 nF |
| Output Current | ±50 mA |
| Current Amplification Range | 1 nA – 1 A |
| Brand | aixACCT |
|---|---|
| Origin | Germany |
| Model | TF Analyzer 1000 |
| Voltage Range | ±12 V (expandable to ±10 kV) |
| Frequency Range | 0.01 Hz – 1 kHz |
| Fatigue Test Frequency | up to 50 kHz |
| Minimum Pulse Width | 20 µs |
| Output Impedance | 50 Ω |
| Max Capacitive Load | 100 nF |
| Output Current | ±50 mA |
| Current Amplification Range | 1 nA – 1 A |
| Brand | aixACCT |
|---|---|
| Origin | Germany |
| Model | TF Analyzer 2000E |
| Voltage Range | ±25 V (extendable to ±10 kV) |
| Hysteresis Frequency | 0.001 Hz – 5 kHz |
| Minimum Pulse Width | 2 µs |
| Minimum Rise Time | 1 µs |
| Current Measurement Range | 1 pA – 1 A |
| Maximum Load Capacitance | 1 µF |
| Peak Output Current | ±1 A |
| Module Options | FE (Ferroelectric), MR (Magnetoresistive), RX (Relaxation Current), DR (Dielectric Retention) |
| Channel Capacity | 256-channel automated testing |
| Brand | aixACCT |
|---|---|
| Origin | Germany |
| Model | TF Analyzer 2000E |
| Voltage Range | ±25 V (extendable to ±10 kV) |
| Hysteresis Frequency | 0.001 Hz – 5 kHz |
| Minimum Pulse Width | 2 µs |
| Rise Time | ≤1 µs |
| Current Measurement Range | 1 pA – 1 A |
| Max Capacitive Load | 1 µF |
| Peak Output Current | ±1 A |
| Module Options | FE (Ferroelectric), MR (Magnetoresistive), RX (Relaxation Current), DR (Dielectric Retention) |
| Channel Count | 256-channel automated testing capability |
| Operating System | Windows 7 embedded |
| Brand | aixACCT |
|---|---|
| Origin | Germany |
| Model | TF Analyzer 3000E |
| Voltage Range | ±25 V (extendable to ±10 kV) |
| Hysteresis Frequency | up to 1 MHz (High-Speed FE Module) |
| Minimum Pulse Width | 50 ns |
| Minimum Rise Time | 10 ns |
| Maximum Fatigue Frequency | 16 MHz |
| Current Amplification Range | 1 pA to 1 A |
| Max Load Capacitance | 1 nF |
| Peak Output Current | ±1 A |
| Software Platform | aixPlorer v5.x (Windows 7/10 compatible) |
| Compliance | ASTM D991, IEC 62047-18, ISO/IEC 17025-ready architecture |
| Modularity | FE, MR, RX, DR modules |
| Brand | aixACCT |
|---|---|
| Origin | Germany |
| Model | TF Analyzer 3000E |
| Voltage Range | ±25 V (extendable to ±10 kV) |
| Hysteresis Frequency | up to 1 MHz (high-speed FE module) |
| Minimum Pulse Width | 50 ns |
| Minimum Rise Time | 10 ns |
| Fatigue Test Frequency | up to 16 MHz |
| Current Measurement Range | 1 pA – 1 A |
| Maximum Load Capacitance | 1 nF |
| Output Current Peak | ±1 A |
| Software Platform | aixPlorer v7.x (Windows 7-based) |
| Compliance | GLP/GMP-ready architecture, ASTM E2941-22 compatible, supports 21 CFR Part 11 audit trails (with optional software license) |
| Brand | aixACCT |
|---|---|
| Origin | Germany |
| Model | TF Analyzer 3000E |
| Voltage Range | ±25 V (extendable to ±10 kV) |
| Dynamic Hysteresis Frequency | up to 1 MHz (High-Speed FE Module) |
| Minimum Pulse Width | 50 ns |
| Minimum Rise Time | 10 ns |
| Maximum Fatigue Frequency | 16 MHz |
| Current Amplification Range | 1 pA – 1 A |
| Max Capacitive Load | 1 nF |
| Output Current Peak | ±1 A |
| Software Platform | aixPlorer v7.x (Windows 7-based) |
| Compliance | ASTM D991, IEC 62047-18, ISO/IEC 17025-ready architecture |
| Channel Count | 256-channel automated testing capability |
| Brand | aixACCT |
|---|---|
| Origin | Germany |
| Model | TF Analyzer 3000E |
| Voltage Range | ±25 V (extendable to ±10 kV) |
| Hysteresis Frequency | up to 1 MHz (High-Speed FE Module) |
| Minimum Pulse Width | 50 ns |
| Minimum Rise Time | 10 ns |
| Maximum Fatigue Frequency | 16 MHz |
| Current Amplification Range | 1 pA to 1 A |
| Max Load Capacitance | 1 nF |
| Peak Output Current | ±1 A |
| Software Platform | aixPlorer v5.x (Windows 7/10 compatible) |
| Compliance | ASTM D991, IEC 62047-18, ISO/IEC 17025-ready architecture |
| Modularity | FE, MR, RX, DR modules |
| Brand | Allresist |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Semiconductor Process Chemicals |
| Model Range | AR Series |
| Pricing | Upon Request |
| Brand | Allresist |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | AR-N 4400 |
| Pricing | Available Upon Request |
| Brand | Allresist |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | AR-N 4600 (Atlas 46) |
| Pricing | Available Upon Request |
| Brand | Allresist |
|---|---|
| Origin | Germany |
| Model | AR-N7700 |
| Type | Chemically Amplified Negative Tone Resist |
| Exposure Modalities | Electron Beam (e-beam), Deep Ultraviolet (248 nm) |
| UV Transparency Range | 248–265 nm & 290–330 nm |
| Etch Resistance | High (Compatible with CF₄, CHF₃, O₂-based Plasma Etching) |
| Packaging | 100 mL amber glass bottles under nitrogen purge |