Acculogic FLS980 Series Flying Probe Tester
| Brand | Acculogic |
|---|---|
| Origin | Canada |
| Model | FLS980 Series |
| Configuration | Dual-Sided, Closed-Loop System |
| Maximum Probe Modules | 22 (top + bottom) |
| Minimum Step Resolution | 1 µm |
| Positioning Repeatability | ±10 µm |
| Programmable Probe Angle | ±6° |
| Max PCB Size | 813 × 965 mm (32″ × 38″) |
| Max Component Height | 85 mm |
| Max Probe Tip Height | 45 mm |
| Tip Radius Range | 50–500 µm |
| Tip Profiles | Needle, Cup, Dome |
| Measurement Speed | Up to 1000 measurements/sec |
| Analog Test Capability | 4-wire per probe |
| Supported Test Modes | 2-wire, 4-wire, Quasi-4-wire, Powered Functional Test, Boundary Scan (JTAG), NetScan™ |
| Laser-Based Board Warpage Compensation | Yes |
| Vision System | High-Resolution Reference Camera with Advanced Image Processing |
| Motion Architecture | Frictionless Air-Gap Linear Shuttles |
| Compliance Framework | Supports GLP/GMP audit trails, ISO/IEC 17025 traceability workflows, and FDA 21 CFR Part 11–ready software logging (via Integrator™) |
Overview
The Acculogic FLS980 Series Flying Probe Tester is a dual-sided, closed-loop automated test system engineered for high-precision electrical validation of modern printed circuit assemblies—particularly those featuring ultra-fine-pitch components (e.g., 01005, 008004), chip-scale packages (CSP), and board-level integration where traditional bed-of-nails fixtures are impractical or obsolete. Operating on the principle of dynamically reconfigurable physical probing, the FLS980 employs frictionless air-gap linear shuttles and independently programmable probe modules to achieve sub-10 µm positional repeatability across X, Y, and Z axes. Its core measurement architecture integrates synchronized motion control, real-time vision-guided alignment, laser-based warpage mapping, and high-speed analog/digital stimulus-response acquisition—all coordinated through the Integrator™ platform. Unlike open-loop flying probe systems, the FLS980’s fully closed-loop servo architecture eliminates mechanical hysteresis and thermal drift, enabling reliable contact on targets as small as 100 µm while maintaining metrological integrity under production-floor environmental conditions.
Key Features
- Dual-sided probing with up to 22 independently controlled flying probe modules—11 per side—enabling single-pass, full-board coverage without manual repositioning.
- AccuFast™ closed-loop linear shuttle system with 1 µm minimum step resolution and ±10 µm positioning repeatability; shuttles operate with 20 µm air gap—zero mechanical contact, zero wear, no lubrication required.
- Programmable probe angle from –6° to +6° per module, allowing adaptive tip orientation to compensate for PCB warpage and optimize normal-force contact on densely populated or warped boards.
- Integrated high-resolution reference camera with calibrated lighting and sub-pixel image processing for fiducial detection, board registration, and real-time offset compensation.
- LaserScan™ warpage profiling subsystem measures Z-axis deviation across the entire PCB surface (up to 813 × 965 mm), feeding correction vectors directly into motion planning algorithms.
- Modular probe head options: APM 800 (fully programmable angle), BPM 700 (fixed +6°), and VPM 600 (0° vertical)—supporting mixed configurations to balance coverage, speed, and accessibility.
- 4-wire Kelvin measurement capability on all probes, supporting low-resistance (100 MΩ), and mixed-signal component testing with <0.1% basic accuracy.
Sample Compatibility & Compliance
The FLS980 accommodates PCBs up to 813 × 965 mm with component heights up to 85 mm and probe-accessible features as low as 100 µm in pitch. It supports rigid, flex, and rigid-flex assemblies—including those with embedded passives, HDI structures, and stacked die packages. The system complies with industry-standard test methodology frameworks: boundary scan execution adheres to IEEE 1149.1 (JTAG) and 1149.6 (AC-extractable); analog test routines align with IPC-A-610 and IPC-J-STD-001 verification criteria. Software audit logs, user access controls, electronic signatures, and measurement traceability meet requirements for ISO/IEC 17025 accredited labs and FDA 21 CFR Part 11–regulated environments when deployed with validated Integrator™ configuration.
Software & Data Management
Integrator™ serves as the unified control and analysis environment for the FLS980. It provides deterministic real-time motion scheduling, synchronized multi-probe stimulus sequencing, and hierarchical test program structuring (from netlist-driven to functional test sequences). All measurements are timestamped, tagged with probe ID, position coordinates, and environmental metadata (e.g., ambient temperature, camera exposure settings). Raw data exports support CSV, XML, and industry-standard STDF formats. Version-controlled test programs, role-based permissions, and configurable report templates (including SPC-ready statistical summaries) facilitate integration into MES and QMS platforms. Optional API extensions allow bidirectional communication with PLM and ERP systems via RESTful endpoints.
Applications
- High-mix, low-volume NPI validation where fixtureless test agility is critical—especially for automotive ADAS modules, medical PCBs, and aerospace avionics with long-lifecycle support requirements.
- Post-reflow solder joint integrity verification on leadless packages (QFN, DFN, LGA) and fine-pitch BGAs where X-ray inspection alone cannot confirm electrical continuity.
- Reverse engineering support via automated net identification, component footprint mapping, and schematic reconstruction using NetScan™ topology analysis.
- Functional power-up testing of voltage regulators, op-amps, and mixed-signal ICs under load, including parametric margining and thermal derating analysis.
- Failure analysis correlation—overlaying electrical fault locations with optical/microscope images and cross-referencing against CAD netlists and BOM revisions.
FAQ
What is the smallest target pitch the FLS980 can reliably contact?
The system achieves repeatable contact on targets down to 100 µm pitch, enabled by closed-loop motion control, programmable probe angles, and vision-guided dynamic compensation for board warpage.
Does the FLS980 support powered functional testing?
Yes—it integrates programmable voltage/current sources and high-impedance measurement channels capable of powering and validating active circuits up to GHz-range signal integrity, including DC biasing of RF front-ends and clock domain validation.
How does the system handle PCB warpage during probing?
LaserScan™ performs full-surface Z-profile mapping prior to test execution; this data is fused with real-time camera-based fiducial tracking to adjust probe trajectory in all three axes—ensuring orthogonal contact force regardless of local board curvature.
Can test programs be imported from CAD or simulation tools?
Yes—Integrator™ accepts IPC-D-356 netlists, ODB++, Gerber RS-274X, and SPICE-compatible stimulus definitions; it also supports direct import of boundary scan BSDL files and JAM/STAPL vectors.
Is remote diagnostics and software update supported?
The system includes secure TLS-encrypted remote access capabilities for technical support, firmware updates, and predictive maintenance analytics—configured per customer IT security policies.

