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Arradiance GEMStar-8 XT Atomic Layer Deposition System

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Brand Arradiance
Origin USA
Model GEMStar-8 XT
Substrate Size 8-inch (200 mm)
Process Temperature Up to 500 °C
Precursor Channels 8
System Weight 150 kg
Thickness Uniformity ≤1.5% (across 8-inch wafer)
Dimensions 78 × 56 × 28 cm
Thermal Wall 300 °C aluminum heated chamber
Precursor Bottle Temp up to 175 °C
Transport Line Temp up to 200 °C
Plasma Option ICP-based, 13.56 MHz, 300 W, air-cooled
MFC-Controlled Gas Lines 4 (3 process gases + 1 carrier)
Vacuum Interface Standard CF-40 flanges
Compatible With In-situ metrology modules, powder deposition kits, load-lock, QCM thickness monitoring, ozone generator

Overview

The Arradiance GEMStar-8 XT is a benchtop, thermal atomic layer deposition (ALD) system engineered for high-precision, conformal thin-film synthesis on planar and three-dimensional substrates. Operating on the fundamental principle of self-limiting surface reactions, ALD sequentially introduces gaseous precursors into a reaction chamber under controlled vacuum conditions. Each precursor pulse chemisorbs onto reactive surface sites until saturation, followed by a purge step to remove physisorbed species and reaction byproducts. A second precursor pulse then reacts with the adsorbed monolayer, forming one atomic layer per cycle. This digital, layer-by-layer growth mechanism enables sub-nanometer thickness control, exceptional conformality (>99% step coverage), and reproducible film stoichiometry—critical for advanced semiconductor, MEMS, battery, and catalytic applications.

Key Features

  • Compact benchtop architecture (78 × 56 × 28 cm) with integrated thermal management: 300 °C heated aluminum chamber wall and independently controlled precursor delivery lines (up to 200 °C) ensure minimal thermal gradients and high process repeatability.
  • Optimized gas dynamics via lateral showerhead injector design, reducing airflow-induced temperature fluctuations to <0.03%—enabling uniform deposition across 8-inch wafers with ≤1.5% thickness variation (1σ).
  • Eight independent precursor channels with CF-40 vacuum-compatible ports, supporting complex multi-step processes including oxide, nitride, sulfide, and metallic film synthesis (e.g., Al₂O₃, TiN, HfO₂, ZnO, Ru).
  • Scalable plasma enhancement option: Integrated 13.56 MHz inductively coupled plasma (ICP) source (300 W, air-cooled) enables low-temperature PE-ALD for thermally sensitive substrates and refractory materials.
  • Modular expansion capability: Supports optional in-situ quartz crystal microbalance (QCM), load-lock vacuum transfer, ozone generation, heated sample stage (up to 500 °C), and dedicated powder deposition trays for nanoparticle functionalization.
  • Robust mechanical design with stainless-steel construction, all-metal seals, and ISO-KF/CF-40 standardized interfaces—compatible with Class 100 cleanroom environments and GLP-compliant lab infrastructure.

Sample Compatibility & Compliance

The GEMStar-8 XT accommodates substrates up to 200 mm (8-inch) in diameter and up to 32 mm in thickness, including silicon wafers, glass slides, ceramic membranes, porous anodized alumina (AAO), metal foams, and free-standing powders. Its high-conformality performance has been validated on structures with aspect ratios exceeding 1500:1—making it suitable for deep trench, nanowire, and hierarchical catalyst support coating. The system meets standard vacuum safety requirements (ISO 27462) and supports audit-ready operation through configurable logging of pressure, temperature, valve timing, and MFC flow profiles—facilitating compliance with ISO 9001 quality systems and FDA 21 CFR Part 11 data integrity guidelines when paired with validated software protocols.

Software & Data Management

Control is executed via Arradiance’s proprietary ALD Commander™ software, a Windows-based interface offering deterministic recipe programming, real-time parameter monitoring, and automated sequence execution. All process logs—including timestamps, valve actuation cycles, temperature ramps, and pressure transients—are stored in timestamped, non-editable binary files with SHA-256 hash verification. Export options include CSV and HDF5 formats for integration with LIMS or statistical process control (SPC) platforms. Optional password-protected user roles (operator, engineer, administrator) support multi-user labs operating under ISO/IEC 17025 or GMP-aligned workflows.

Applications

  • Semiconductor front-end-of-line (FEOL) and back-end-of-line (BEOL) processes: high-k gate dielectrics, diffusion barriers (TiN, TaN), and capacitor electrodes.
  • Energy storage: ALD-coated cathode particles (e.g., NMC, LFP) for enhanced cycling stability; solid-state electrolyte interphases on Li-metal anodes.
  • MEMS/NEMS: hermetic encapsulation layers, piezoelectric AlN films, and anti-stiction coatings.
  • Heterogeneous catalysis: conformal metal oxide overlayers on porous supports (SiO₂, TiO₂, carbon) for selective hydrogenation or CO₂ reduction.
  • Biomedical devices: antimicrobial Ag or Cu coatings on titanium implants; hydrophilic/hydrophobic surface functionalization of polymer scaffolds.

FAQ

What substrate sizes does the GEMStar-8 XT support?
It accepts wafers up to 200 mm (8-inch) in diameter and up to 32 mm thick, with downward compatibility for 150 mm (6-inch) and 100 mm (4-inch) substrates using interchangeable sample holders.
Can the system deposit films on powders or porous 3D structures?
Yes—optional powder deposition trays and NanoCUBE-compatible fixtures enable uniform ALD on nanoparticles, aerogels, MOFs, and other high-surface-area materials.
Is plasma-enhanced ALD (PE-ALD) available as a factory-installed option?
The GEMStar-8 XT-P variant includes a fully integrated 13.56 MHz ICP plasma source (300 W, air-cooled); retrofit kits are not offered—plasma capability must be specified at time of order.
How is temperature uniformity maintained across large-area substrates?
Through active thermal wall control (300 °C), heated precursor lines (200 °C), and laminar-flow lateral injection—reducing radial thermal deviation to <±0.5 °C across an 8-inch wafer.
Does the system comply with regulatory data integrity standards?
When operated with ALD Commander™ in audit mode, it generates immutable logs with electronic signatures, time stamps, and change tracking—supporting alignment with 21 CFR Part 11 and EU Annex 11 requirements for regulated R&D environments.

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