Artray ARTCAM-0016TNIR-TEC InGaAs Thermoelectrically Cooled Near-Infrared Camera
| Brand | Artray |
|---|---|
| Origin | Japan |
| Model | ARTCAM-0016TNIR-TEC |
| Sensor Format | 128 × 128 InGaAs focal plane array |
| Spectral Range | 900–1700 nm |
| Cooling | Integrated TEC (Thermoelectric Cooler) |
| Detector Type | Solid-state InGaAs photodiode array |
| Compliance | CE, RoHS, JIS C 0950 |
Overview
The Artray ARTCAM-0016TNIR-TEC is a high-performance, thermoelectrically cooled near-infrared (NIR) imaging camera engineered for precision spectral detection in the 900–1700 nm wavelength band. Built around a monolithic 128 × 128 pixel indium gallium arsenide (InGaAs) focal plane array, this camera leverages the intrinsic quantum efficiency and low dark current characteristics of lattice-matched InGaAs photodiodes on InP substrates. Unlike silicon-based detectors, which exhibit negligible responsivity beyond 1100 nm, the InGaAs sensor delivers stable, linear photoresponse across the short-wave infrared (SWIR) region—enabling quantitative imaging of laser emission, optical component characterization, semiconductor wafer inspection, and non-destructive testing where visible-light contrast is insufficient. The integrated single-stage thermoelectric cooler (TEC) stabilizes the detector at −10 °C ± 1 °C, reducing thermal noise by up to two orders of magnitude compared to uncooled operation and ensuring shot-noise-limited performance in low-flux applications.
Key Features
- 128 × 128 InGaAs FPA with pixel pitch of 30 µm, optimized for high spatial resolution and fill factor
- Active thermoelectric cooling (TEC) maintaining detector temperature at −10 °C for consistent dark current suppression
- Spectral responsivity peak at ~1550 nm with >70% quantum efficiency across 1000–1650 nm
- Global shutter architecture enabling artifact-free imaging of pulsed laser sources (e.g., Q-switched Nd:YAG harmonics, fiber lasers)
- 14-bit analog-to-digital conversion with programmable gain and offset for dynamic range optimization
- USB 3.0 interface supporting real-time frame rates up to 120 fps at full resolution
- Hermetically sealed TO-8 package with AR-coated sapphire window for environmental robustness and transmission >98% in SWIR band
Sample Compatibility & Compliance
The ARTCAM-0016TNIR-TEC is designed for integration into OEM optical systems and laboratory-grade NIR measurement platforms. It supports passive and active alignment of optical components including collimators, beam splitters, and diffraction gratings used in spectrometer and interferometer configurations. Its mechanical footprint and electrical interface comply with industrial standards for modular photonics instrumentation (IEC 61000-6-3 EMC, IEC 61000-6-2 ESD immunity). The device conforms to RoHS Directive 2011/65/EU and carries CE marking under the Low Voltage Directive (2014/35/EU) and Electromagnetic Compatibility Directive (2014/30/EU). While not certified for medical or aerospace use out-of-the-box, its design adheres to JIS C 0950 (Japanese standard for safety of electronic measuring instruments), facilitating qualification under ISO/IEC 17025-accredited calibration workflows.
Software & Data Management
Artray provides the ARTCAM SDK (v3.2+), a cross-platform C/C++ and Python API supporting Windows, Linux (x86_64, ARM64), and macOS. The SDK includes drivers compliant with GenICam v2.3 specifications, enabling seamless integration with third-party image acquisition software such as HALCON, LabVIEW Vision Acquisition Software, and MATLAB Image Acquisition Toolbox. Raw frame data are delivered in IEEE 754-compliant 16-bit unsigned integer format, with optional on-board non-uniformity correction (NUC) and bad-pixel replacement. Metadata embedding (exposure time, TEC setpoint, sensor temperature, timestamp) follows TIFF/EXIF conventions. For regulated environments, optional firmware upgrade enables audit-trail logging and user-access control aligned with FDA 21 CFR Part 11 requirements when deployed within validated QC/QA systems.
Applications
- Laser beam profiling and M² measurement of fiber-coupled diode lasers (1064 nm, 1310 nm, 1550 nm)
- Non-contact thermal mapping of microelectronic packages using NIR reflectance thermography
- Defect detection in silicon wafers and solar cells via SWIR transmission imaging
- Real-time monitoring of polymer extrusion processes using NIR absorption signatures
- Characterization of anti-reflective coatings and optical filters via spectral reflectance mapping
- Time-resolved luminescence imaging in phosphor research and upconversion nanomaterial studies
FAQ
What is the typical dark current at −10 °C operating temperature?
At −10 °C, the median dark current is ≤0.5 e⁻/pixel/s, measured at 100 µs integration time, enabling sub-pW/cm² irradiance detection limits.
Is the camera compatible with National Instruments PXI platforms?
Yes—via GenICam-compliant NI-IMAQdx driver support; requires NI Vision Acquisition Software 2022 Q3 or later.
Does the SDK support real-time NUC update during continuous acquisition?
Yes—dynamic NUC can be triggered externally via TTL input or scheduled programmatically every 60 seconds without frame interruption.
Can the ARTCAM-0016TNIR-TEC be used in vacuum environments?
No—the TEC module and internal humidity-sensitive components require ambient atmospheric pressure and <40% RH; optional custom vacuum-compatible variants are available upon request.
What calibration certificates are provided with shipment?
Each unit ships with a factory calibration report including spectral responsivity curve (NIST-traceable reference source), uniformity map, and dark current vs. temperature characterization data.
