Auniontech IXION SLM 266 nm Diode-Pumped Solid-State Single-Longitudinal-Mode Pulsed UV Laser
| Brand | Auniontech |
|---|---|
| Manufacturer | Xiton Photonics (Germany) |
| Wavelength | 266 nm |
| Average Power | 500 mW |
| Pulse Duration | 8–10 ns (typ.) |
| Pulse Energy | 50 µJ |
| Repetition Rate | 1–15 kHz |
| Beam Quality (M²) | < 1.7 |
| Spectral Bandwidth | < 80 MHz |
| Coherence Length | > 1.8 m |
Overview
The Auniontech IXION SLM 266 nm diode-pumped solid-state (DPSS) pulsed laser is a high-stability, single-longitudinal-mode (SLM) ultraviolet source engineered for precision optical metrology and deep-UV applications. Based on intracavity frequency quadrupling of a Nd:YAG fundamental at 1064 nm—via sequential second-harmonic generation (SHG) and sum-frequency generation (SFG)—this laser delivers transform-limited spectral purity with near-Fourier-limited bandwidth (1.8 m coherence length) and sub-picosecond pulse-to-pulse timing stability. Designed and manufactured by Xiton Photonics in Germany—a specialist in DPSS lasers and nonlinear optics with over two decades of deep-UV system development—the IXION SLM 266 meets stringent requirements for interferometric calibration, lithographic alignment, and high-resolution spectroscopic excitation where spectral fidelity and beam propagation integrity are non-negotiable.
Key Features
- True single-longitudinal-mode output at 266 nm with spectral bandwidth < 80 MHz, supporting high-fidelity interference and narrow-linewidth excitation
- Diffration-limited beam quality (M² < 1.7), enabling tight focusing and efficient coupling into single-mode fibers or waveguides
- Stable pulse parameters: pulse duration 8–10 ns (FWHM), repetition rate continuously adjustable from 1 to 15 kHz, and pulse energy up to 50 µJ
- High average power output of up to 500 mW at 266 nm—optimized for throughput-sensitive applications such as wafer inspection and Raman signal enhancement
- Robust thermal and mechanical architecture with active temperature stabilization of nonlinear crystals and laser cavity, ensuring long-term power stability (< ±1.5% RMS over 8 h)
- Integrated Q-switching control with TTL-compatible trigger input and programmable delay synchronization for time-resolved experiments
Sample Compatibility & Compliance
The IXION SLM 266 is compatible with standard UV-grade fused silica optics, reflective beam delivery systems, and vacuum-compatible optical tables. Its 266 nm output is suitable for photochemical activation, UV fluorescence excitation, and ablation of wide-bandgap materials including SiC, GaN, and quartz. The system complies with IEC 60825-1:2014 Class 4 laser safety standards and includes interlock-ready connectors for integration into ISO 14644-classified cleanrooms or GMP-compliant fabrication environments. While not certified for medical device use per FDA 21 CFR Part 820, its stable output and traceable calibration protocols support GLP-aligned data acquisition in analytical laboratories adhering to ASTM E2912 (Standard Practice for Calibration of UV-Vis Spectrophotometers) and ISO/IEC 17025 requirements for measurement uncertainty reporting.
Software & Data Management
Laser operation is managed via RS232/USB interface using vendor-provided Windows-based control software, supporting real-time monitoring of output power, pulse energy, repetition rate, and internal temperature diagnostics. All operational parameters—including user-defined burst modes and external trigger latency compensation—are stored with timestamped metadata in CSV format for audit-trail compliance. The software architecture supports SCPI command set compatibility, enabling seamless integration into LabVIEW, Python (PyVISA), or MATLAB automation frameworks. For regulated environments, optional firmware upgrades provide 21 CFR Part 11-compliant electronic signatures, audit logs, and role-based access control—facilitating qualification under pharmaceutical QC workflows or semiconductor process validation protocols.
Applications
- Optical metrology: Interferometric calibration of UV imaging systems, phase-shifting interferometers, and Fizeau cavity references
- Lithography support: Bandwidth narrowing and seeding of ArF excimer lasers (193 nm) via injection locking or spectral filtering
- Semiconductor inspection: High-resolution wafer defect mapping using UV scattering contrast and deep-UV photoluminescence lifetime imaging
- Advanced spectroscopy: Resonant Raman excitation of wide-bandgap semiconductors, time-resolved photoluminescence decay analysis, and cavity-enhanced absorption spectroscopy
- Holography & optical testing: Generation of stable reference beams for digital holographic microscopy and null-test interferometry of EUV optics substrates
- Ultrafast pump-probe prep: Synchronization with Ti:sapphire amplifier systems for UV-pump/IR-probe experiments in condensed matter physics
FAQ
Is the IXION SLM 266 suitable for continuous-wave (CW) operation?
No—this is a Q-switched pulsed laser system. It does not support CW output; minimum pulse repetition rate is 1 kHz.
What cooling method is required?
The system uses integrated thermoelectric coolers (TECs) with conductive heat sinking; no external chiller or water cooling is needed.
Can the laser be fiber-coupled?
Yes—when equipped with an optional UV-grade single-mode fiber coupling module (FC/PC or FC/APC connector), achieving >65% coupling efficiency into 4 µm core fiber.
Does it include beam pointing stability specifications?
Yes—beam pointing drift is specified as < 3 µrad/°C over 15–30 °C ambient range, measured over 4 hours with active thermal regulation.
Is remote monitoring of internal diagnostics available?
Yes—real-time readouts of crystal temperature, pump diode current, cavity alignment status, and pulse energy deviation are accessible via serial command query.
