Czitek SurveyIR-2 Infrared Microscope

Overview

The Czitek SurveyIR-2 Infrared Microscope is a compact, modular accessory engineered to convert standard benchtop Fourier Transform Infrared (FTIR) spectrometers into fully functional micro-FTIR systems. Designed for integration directly into the sample compartment of compatible FTIR instruments—without optical realignment or external beam routing—the SurveyIR-2 enables spatially resolved infrared spectroscopic analysis at micron-scale resolution. Its core architecture leverages a reflective Cassegrain optical design with high-numerical-aperture diamond-turned mirrors, optimized for minimal signal loss across the mid-IR range (typically 4000–400 cm⁻¹). Unlike conventional IR microscopes requiring dedicated microscope bases and complex alignment procedures, the SurveyIR-2 maintains full compatibility with existing FTIR interferometers and detectors (e.g., DTGS or MCT), preserving instrument throughput and signal-to-noise ratio while adding microscopic capability.

Key Features

• Modular drop-in installation: Fits standard FTIR sample compartments without mechanical modification or beam path interruption.
• Diamond-turned reflective optics: Eliminates chromatic aberration and ensures consistent performance from near- to mid-IR wavelengths.
• Integrated high-resolution CCD imaging system: Replaces ocular viewing with real-time digital visualization on a host PC; supports 1280 × 1024 pixel resolution at 30 fps.
• eSpot™ acquisition and annotation software: Provides live image overlay with spectral acquisition coordinates, region-of-interest (ROI) definition, distance/area measurement tools, and metadata-tagged image export (TIFF, PNG, BMP).
• Triple-mode sampling interface: Supports transmission, reflection (including specular and diffuse), and Attenuated Total Reflection (ATR) configurations via interchangeable objective modules and ATR crystal mounts.
• Diamond objective lens assembly: Features a monolithic, chemically inert diamond front element rated for hardness >70 GPa—resistant to scratching, thermal shock, and chemical corrosion during routine contact-mode ATR or micro-sampling.

Sample Compatibility & Compliance

The SurveyIR-2 accommodates solid, liquid, and thin-film specimens ranging from 5 µm to several millimeters in lateral dimension. It is routinely deployed for forensic fiber analysis, polymer layer identification, pharmaceutical tablet coating characterization, micro-contaminant mapping, and failure analysis of electronic encapsulants. The system complies with ISO 17025 requirements for test method validation when used with accredited FTIR platforms. Spectral data acquisition workflows support audit-trail generation per FDA 21 CFR Part 11 when paired with validated eSpot™ software configurations. All optical components meet RoHS Directive 2011/65/EU material restrictions, and mechanical housing conforms to IEC 61010-1 safety standards for laboratory equipment.

Software & Data Management

eSpot™ is a Windows-based application developed exclusively for the SurveyIR platform. It operates as a standalone imaging controller and synchronizes bidirectionally with major FTIR spectrometer control software (e.g., OMNIC, OPUS, Spectrum). Image capture, spectral mapping (point-and-shoot or automated grid), and spectral library searching (via integrated NIST or custom libraries) occur within a single GUI. Raw interferograms and processed spectra are stored in ASTM E1947-compliant JCAMP-DX format. Project files include embedded calibration metadata (pixel-to-micron scaling, objective magnification, aperture settings), enabling traceable reprocessing and inter-laboratory comparability. Export options include CSV (for multivariate analysis), SPC, and PDF reports with embedded spectra and annotated images.

Applications

• Micro-domain identification in multi-layer polymer films and laminates.
• In situ chemical mapping of corrosion products on metal substrates.
• Identification of sub-10 µm particulate contaminants in semiconductor wafers or medical device packaging.
• Quantitative thickness profiling of pharmaceutical film coatings using ATR-FTIR depth profiling algorithms.
• Forensic analysis of trace paint chips, ink layers, or textile fibers with spatial correlation between morphology and chemistry.
• Quality control of printed electronics—verification of conductive ink composition and uniformity across printed features.

FAQ

Does the SurveyIR-2 require recalibration of my existing FTIR spectrometer?
No. The SurveyIR-2 is optically decoupled from the interferometer’s internal alignment; it functions as a beam-defining accessory and does not alter the spectrometer’s inherent wavelength accuracy or photometric calibration.
Can I use the SurveyIR-2 with liquid nitrogen-cooled MCT detectors?
Yes—provided the detector housing allows unobstructed access to the focal plane and the cold shield aperture is ≥12 mm in diameter. Standard MCT detector mounts on Thermo, Bruker, and PerkinElmer FTIR systems are compatible.
Is eSpot™ software validated for regulated environments (e.g., pharmaceutical QC)?
eSpot™ supports 21 CFR Part 11 compliance when installed on validated Windows OS platforms and configured with electronic signatures, audit trails, and role-based user permissions—subject to site-specific IQ/OQ protocols.
What is the minimum resolvable feature size under transmission mode?
At 15× objective magnification and 8 cm⁻¹ spectral resolution, the practical diffraction-limited spatial resolution is approximately 15–20 µm, consistent with Rayleigh criteria for mid-IR wavelengths (~5–10 µm).
Are replacement diamond objectives available separately?
Yes—Czitek offers certified replacement objectives with documented surface flatness (<λ/10 @ 633 nm), numerical aperture (0.65), and broadband AR coating (3–12 µm), supplied with NIST-traceable calibration certificates.