Konica Minolta CS-200 Color and Luminance Meter
| Brand | Konica Minolta |
|---|---|
| Origin | Japan |
| Model | CS-200 |
| Type | Color and Luminance Meter |
| Measurement Principle | Spectral Matching Method (CIE 1931 2° Standard Observer) |
| Photodetector | Silicon Photodiode |
| Luminance Range | 0.01 to 20,000,000 cd/m² (at 0.1° field of view) |
| Illuminance Range | 0.1 to 99,990 lx |
| Chromaticity Accuracy (xy) | ±0.002 (Std. Illuminant A, 800 lx) |
| Repeatability (xy) | ±0.0005 |
| Temporal Stability | 2 measurements/sec (continuous) |
| Output Interface | RS-232C |
| Display | 4-digit LCD with backlight |
| Power | Four AA alkaline batteries (≈72 h continuous use) or AC adapter AC-A10 |
| Dimensions | 69 × 174 × 35 mm |
| Weight | 215 g (body only) |
| Compliance | JIS C 1609-1993 Class AA (fs ≤ 8%), ISO/CIE traceable calibration protocols |
Overview
The Konica Minolta CS-200 is a portable, high-precision color and luminance meter engineered for objective photometric and colorimetric evaluation of emissive and reflective light sources. It employs a spectral matching method—calibrated against the CIE 1931 2° standard observer—to deliver measurement fidelity comparable to that of benchtop spectroradiometers, without requiring complex optical alignment or thermal stabilization. Unlike tristimulus meters relying on broad-band filter approximations, the CS-200 uses optimized silicon photodiode response curves mathematically weighted to closely emulate the CIE y(λ), x(λ), and z(λ) spectral sensitivity functions. This enables accurate determination of luminance (Ev), chromaticity coordinates (x, y and u′, v′), correlated color temperature (Tcp), and Δuv deviation—critical parameters in display manufacturing, lighting R&D, and quality assurance workflows. Its extended dynamic range—from 0.01 cd/m² to 20,000,000 cd/m² at 0.1° field of view—supports characterization of ultra-low-brightness OLED subpixels and high-luminance automotive headlamps within a single instrument.
Key Features
- High-fidelity spectral matching architecture compliant with JIS C 1609-1993 Class AA (fs ≤ 8%) and aligned with CIE 1931 2° standard observer definitions
- Wide luminance range spanning seven orders of magnitude: 0.01–20,000,000 cd/m² (field-of-view dependent), enabling single-instrument validation across microLED, OLED, LCD, PDP, FED, and general illumination
- Simultaneous acquisition of photometric (Ev), colorimetric (x,y; u′,v′), and thermal (Tcp, Δuv) metrics at 2 Hz sampling rate for real-time stability assessment
- Integrated correction algorithms compensating for temperature-induced drift (±0.003 xy over –10°C to +40°C) and humidity effects (±0.003 xy at ≤85% RH)
- Modular design supporting up to 30 remote sensor heads via optional T-A20/T-A21 interface adapters for spatial uniformity mapping and multi-point QA testing
- RS-232C serial interface compatible with automated test benches and legacy industrial control systems; supports ASCII command protocol for integration into custom LabVIEW or Python-based measurement suites
Sample Compatibility & Compliance
The CS-200 is validated for use across emissive technologies including organic light-emitting diodes (OLED), quantum-dot LED (QLED), microLED displays, and traditional fluorescent and incandescent lighting. Its angular adaptability (via optional aperture accessories) allows precise targeting of small-area emitters such as individual subpixels or LED die. All factory calibrations are traceable to NMIJ/AIST (Japan) standards, and measurement uncertainty budgets conform to ISO/IEC 17025 requirements for accredited photometry laboratories. The device meets IEC 61000-6-3 (EMC emissions) and IEC 61000-6-2 (immunity) for industrial environments. While not inherently 21 CFR Part 11 compliant, its data export functionality supports audit-ready documentation when paired with CL-S1w software configured under GLP/GMP-controlled IT infrastructure.
Software & Data Management
The optional CL-S1w data management software (sold separately) provides full remote control, batch measurement logging, statistical analysis (Cpk, ΔE₀₀, spatial uniformity heatmaps), and report generation in PDF/CSV formats. When deployed on validated Windows platforms, CL-S1w supports user access controls, electronic signatures, and audit trail recording—enabling alignment with FDA-regulated documentation practices where required. Raw measurement values—including XYZ tristimulus outputs, Ev, xy, u′v′, Tcp, and Δuv—are timestamped and stored with metadata (operator ID, calibration date, ambient conditions). Exported datasets retain full precision (e.g., xy to 0.0001 resolution) and are compatible with MATLAB, JMP, and Minitab for advanced spectral modeling and process capability studies.
Applications
- Display manufacturing: Pixel-level luminance uniformity verification, white point tuning, aging degradation tracking (Δuv drift), and gamut boundary mapping for sRGB, DCI-P3, and Rec.2020 compliance
- Automotive lighting: Headlamp beam pattern certification, DRL chromaticity consistency, and interior ambient lighting homogeneity testing per SAE J1383 and ECE R149
- Medical device displays: Verification of DICOM GSDF conformance and low-luminance readability thresholds in operating room environments
- AR/VR optics: Near-eye display brightness calibration, micro-display MTF estimation via controlled luminance step-response, and eyebox uniformity profiling
- Lighting design: Spatial CCT distribution analysis for tunable-white fixtures and spectral power distribution (SPD) proxy validation using multi-angle luminance interpolation
FAQ
Does the CS-200 require annual recalibration?
Yes. Konica Minolta recommends traceable recalibration every 12 months against NMIJ/AIST reference standards to maintain stated accuracy specifications, particularly for regulatory submissions or ISO 9001-certified production lines.
Can the CS-200 measure pulsed or PWM-driven LEDs?
It supports continuous-wave and quasi-static DC measurements. For fast-modulated sources (e.g., >1 kHz PWM), synchronization requires external triggering via third-party hardware; native capture assumes stable emission during the 500-ms integration window.
Is the RS-232C interface optically isolated?
No. The interface lacks galvanic isolation; users deploying in electrically noisy factory environments should implement shielded cabling and ferrite chokes to suppress common-mode noise.
What is the minimum measurable area at 0.1° field of view?
At 100 mm working distance, the spot size is approximately 0.175 mm diameter—sufficient for evaluating individual RGB subpixels on high-PPI AMOLED panels.
Does CL-S1w support automated pass/fail thresholding per IEC 62341-6-3?
Yes. Users may define luminance and chromaticity tolerances per zone; the software flags deviations in real time and exports annotated summary reports compliant with IEC 62341-6-3 Annex B documentation requirements.
