LabCompanion TC-1000-70-10 Rapid Temperature Cycling (Thermal-Humidity) Chamber
| Brand | LabCompanion |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | TC-1000-70-10 |
| Instrument Type | Upright Vertical Chamber |
| Temperature Range | −70 °C to +150 °C |
| Humidity Range | 20–98 %RH |
| Temperature Uniformity | ±1 % |
| Temperature Stability | ±0.5 °C |
| Humidity Uniformity | ±3 %RH |
| Humidity Stability | ±1 %RH |
| Heating Rate | 1–25 °C/min (linear or non-linear ramping) |
| Interior Dimensions | Customizable |
Overview
The LabCompanion TC-1000-70-10 is a high-performance rapid temperature cycling chamber engineered for precise, repeatable thermal-humidity stress testing in R&D, quality assurance, and reliability validation environments. It operates on a dual-system refrigeration architecture with independent humidity control—utilizing a combination of direct-expansion cooling, electric heating, and steam-based humidification—to achieve simultaneous, programmable regulation of temperature and relative humidity across an extended operational envelope. Designed for accelerated life testing, HALT/HASS pre-screening, and environmental qualification per IEC 60068-2, MIL-STD-810, and JEDEC JESD22-A104/A110 standards, the TC-1000-70-10 delivers deterministic thermal transients and stable steady-state conditions required for evaluating material integrity, solder joint fatigue, polymer aging, and hermetic seal performance under cyclic thermo-mechanical load.
Key Features
- Wide operating range: −70 °C to +150 °C temperature, 20–98 %RH humidity—enabling full-spectrum environmental simulation from sub-zero condensation to high-temperature drying
- Programmable heating rate up to 25 °C/min with selectable linear or non-linear ramp profiles—supporting both standardized test cycles and custom thermal shock protocols
- Independent PID-controlled humidity system with steam generator and dehumidification bypass—ensuring low-drift RH stability (±1 %RH) even during rapid temperature transitions
- High-precision sensor network: Pt100 Class A temperature sensors and capacitive RH transducers calibrated traceably to NIST standards
- Robust stainless-steel inner chamber with insulated double-wall construction, anti-condensation heating strips, and seamless welded corners for long-term corrosion resistance
- Integrated safety architecture: over-temperature cutoff, compressor high-pressure protection, humidity overflow prevention, and door interlock with emergency power-off
Sample Compatibility & Compliance
The TC-1000-70-10 accommodates diverse sample geometries via customizable internal dimensions and optional mounting fixtures—including PCB carriers, component trays, and fixture plates compatible with MIL-STD-202 and IPC-TM-650 test boards. Its environmental profile meets the physical and metrological requirements of ISO/IEC 17025-accredited laboratories. The chamber’s control software supports audit-ready data logging compliant with FDA 21 CFR Part 11 (electronic records and signatures), GLP, and GMP documentation workflows. Validation reports—including IQ/OQ/PQ templates—can be generated for regulatory submissions in medical device, automotive electronics (ISO/TS 16949), and aerospace (AS9100) applications.
Software & Data Management
Equipped with LabCompanion’s proprietary WinTest Pro v4.2 control platform, the TC-1000-70-10 enables multi-segment program creation, real-time parameter monitoring, and automated report generation in PDF/CSV formats. The system supports Ethernet/IP and RS-485 interfaces for integration into centralized lab management systems (LIMS) or MES environments. All measurement data—including timestamped temperature/humidity traces, alarm logs, and calibration history—are stored with cryptographic hash integrity verification. Optional remote access module allows secure web-based supervision via TLS 1.2-encrypted connections, with role-based user permissions aligned with ISO 27001 information security guidelines.
Applications
- Thermal cycling validation of semiconductor packages (e.g., QFN, BGA, SiP) per JEDEC JESD22-A104D
- Humidity resistance testing of conformal coatings and encapsulants under combined thermal-humidity stress (e.g., 85 °C/85 %RH)
- Reliability screening of lithium-ion battery cells and modules under dynamic charge-discharge-environment coupling
- Material compatibility assessment for aerospace composites exposed to tropical and arctic operational envelopes
- Accelerated corrosion testing of automotive ECUs using alternating dry/wet cycles per ISO 16750-4
- Stability studies of pharmaceutical packaging under climatic zone IVb (30 °C/75 %RH) per ICH Q1A(R2)
FAQ
What is the standard calibration interval recommended for this chamber?
Annual calibration against certified reference standards is recommended; however, intervals may be adjusted based on usage frequency, criticality of application, and internal QA policy—per ISO/IEC 17025 Clause 6.6.
Can the TC-1000-70-10 perform temperature-only cycles without humidity control?
Yes—the chamber supports standalone temperature cycling mode with humidity subsystem disabled, maintaining full accuracy within the specified temperature range and stability specifications.
Is third-party validation support available for IQ/OQ/PQ documentation?
LabCompanion provides factory-validated IQ/OQ protocols and on-site PQ execution support through ISO 17025-accredited partners in North America, Europe, and APAC regions.
Does the system comply with energy efficiency directives such as EU Ecodesign?
The TC-1000-70-10 incorporates variable-speed compressors, intelligent defrost logic, and heat recovery loops—achieving ErP Lot 11 compliance for laboratory climate equipment when configured with optional eco-mode firmware.
What materials are used in the chamber’s interior construction to prevent outgassing in cleanroom-sensitive applications?
Standard interior surfaces use electropolished 316L stainless steel; optional ultra-low-outgassing coating (per ASTM E595 TML & CVCM <1.0%) is available upon request for semiconductor fab and space-grade testing environments.




