METTLER TOLEDO EasyViewer100 In-line Image-Based Particle Size and Shape Analyzer

Overview

The METTLER TOLEDO EasyViewer100 is an in-line, probe-based image analysis system engineered for real-time, non-invasive characterization of particles and droplets in process streams. Operating on the principle of high-resolution optical imaging coupled with automated digital morphological analysis, the EasyViewer100 enables continuous, in-situ monitoring of particle size distribution (PSD), count, and shape descriptors—including equivalent spherical diameter, chord length, aspect ratio, length, and width—without requiring offline sampling or sample preparation. Designed for integration into reactors, crystallizers, mixers, and pipelines, it delivers quantitative visual data under representative process conditions, including temperatures from −20 °C to 135 °C and pressures up to 10 bar. Its compact, corrosion-resistant Hastelloy® C-22 probe housing ensures compatibility with aggressive chemical environments common in pharmaceutical, fine chemical, and bioprocess applications.

Key Features

• In-line, probe-mounted architecture with plug-and-play USB connectivity and intelligent auto-focus control for stable long-term operation
• Optimized for high-solid-content suspensions and opaque media—no dilution or filtration required
• Real-time acquisition at native process concentrations across solid–liquid, liquid–liquid, and solid–gas systems
• Simultaneous multi-parameter output: particle count per user-defined size bin, chord-length distribution, aspect ratio histogram, and equivalent diameter statistics
• Hastelloy C-22 probe construction providing resistance to acids, alkalis, and oxidizing agents per ASTM G48 and NACE MR0175/ISO 15156 standards
• Standard 3 m fiber-optic cable (extendable to 13 m with active USB extension) enabling flexible installation in confined or hazardous locations
• Low thermal mass probe design minimizing local process disturbance and supporting rapid response to dynamic changes

Sample Compatibility & Compliance

The EasyViewer100 supports direct in-process measurement across a broad range of particulate systems, including crystallization slurries, emulsions, precipitates, flocs, and aerosol-laden gas streams. It operates without calibration transfer between systems and requires no refractive index input—a key advantage over light-scattering techniques. The system complies with industry-relevant regulatory expectations for process analytical technology (PAT): raw image capture and metadata logging support audit trails aligned with FDA 21 CFR Part 11 requirements when used with validated iC-Vision software configurations. Data integrity is maintained through time-stamped image archives, user-access logs, and configurable retention policies consistent with ICH Q5A and Q9 principles. System validation documentation—including IQ/OQ protocols and traceable metrology reports—is available per client-specific GMP/GLP implementation needs.

Software & Data Management

The EasyViewer100 integrates exclusively with METTLER TOLEDO’s iC-Vision software—a dedicated image analysis platform built for pharmaceutical process development and manufacturing. iC-Vision provides automated particle detection using adaptive thresholding and edge-enhancement algorithms optimized for low-contrast, overlapping, or agglomerated particles. It supports batch-wise and continuous trend visualization of >20 morphological descriptors, customizable size binning, and statistical reporting compliant with ISO 13322-1 (Image Analysis). All images and derived metrics are stored in a structured SQLite database with embedded metadata (timestamp, temperature, pressure, user ID, instrument ID). Export formats include CSV, PDF reports, and OPC UA-compatible tags for integration into DCS/SCADA or MES platforms. Software validation packages—including installation qualification (IQ), operational qualification (OQ), and performance qualification (PQ)—are provided to support regulated environments.

Applications

The EasyViewer100 is routinely deployed in crystallization endpoint determination, antisolvent addition control, polymorph screening, emulsion stability assessment, and flocculation kinetics studies. In API manufacturing, it quantifies nucleation onset, growth rate shifts, and agglomeration events during cooling or anti-solvent crystallization—enabling model-based control strategies. In formulation development, it characterizes droplet coalescence in nanoemulsions and particle breakage in wet-milled suspensions. Academic users leverage its real-time capability for fundamental studies of Ostwald ripening, crystal habit evolution, and interfacial adsorption effects. Case studies published in Organic Process Research & Development and Journal of Pharmaceutical Sciences demonstrate its utility in reducing development timelines by 30–50% compared to offline microscopy + sieve analysis workflows.

FAQ

Can the EasyViewer100 be used in pressurized stainless-steel reactors?
Yes—the probe is rated for continuous operation up to 10 bar and features a welded Hastelloy C-22 body compatible with ASME B16.5 flange mounting and standard sanitary fittings.
Does it require periodic recalibration?
No—system resolution is fixed by optical magnification and pixel geometry; verification is performed via NIST-traceable stage micrometers during annual PQ testing.
How does it handle highly turbid or opaque slurries?
Unlike laser diffraction or dynamic light scattering, EasyViewer100 relies on direct illumination and contrast-based segmentation, making it robust for high-absorbance, high-scatter media where other optical methods fail.
Is iC-Vision qualified for use in GMP manufacturing?
Yes—when installed and configured per METTLER TOLEDO’s validated software release package, iC-Vision meets ALCOA+ data integrity criteria and supports electronic signatures per 21 CFR Part 11.
Can it distinguish between crystals and amorphous aggregates?
Yes—shape descriptors such as convexity, solidity, and Fourier descriptors enable classification of crystalline vs. irregular morphology in post-acquisition analysis, supported by supervised machine learning modules in iC-Vision v3.2+.