Nanjing Dazhan DZ5001 Dielectric Constant Analyzer
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Model | DZ5001 |
| Signal Source Frequency Range | 10 kHz – 100 MHz |
| Frequency Accuracy | ±3×10⁻⁵ (6-digit resolution) |
| Sampling Resolution | 12-bit ADC |
| Q Factor Range | 1–1000 |
| Q Resolution | 0.1 (4-digit effective) |
| Q Measurement Error | <5% |
| Inductance Range | 1 nH – 140 mH |
| Inductance Resolution | 0.1 nH |
| Inductance Error | <3% |
| Main Tuning Capacitance | 17–240 pF (monolithic silver-plated construction) |
| Capacitance Auto-Search | Yes (stepper motor driven) |
| Direct Capacitance Measurement Range | 1 pF – 25 nF |
| Capacitance Accuracy | ±1 pF or <1% |
| Capacitance Resolution | 0.1 pF |
| Resonance Point Search | Automatic sweep |
| Q Pass/Fail Threshold | User-configurable (5–1000) |
| Displayed Parameters | F, L, C, Q, Lt, Ct, εᵣ, Tn, residual inductance, lead inductance compensation |
Overview
The Nanjing Dazhan DZ5001 Dielectric Constant Analyzer is a precision impedance resonance-based instrument engineered for the quantitative determination of relative permittivity (εr) and dielectric loss tangent (tan δ) of solid and liquid dielectric materials. It operates on the principle of series-resonant cavity perturbation, where a sample’s insertion into a calibrated high-Q LC resonator alters the system’s natural resonant frequency (F), quality factor (Q), and effective capacitance (Ct). By measuring these shifts under controlled excitation across a broad 10 kHz–100 MHz frequency band—generated via direct digital synthesis (DDS)—the analyzer computes εr using standardized cavity perturbation models compliant with ASTM D150 and IEC 60250 methodologies. Its architecture integrates a monolithic silver-plated tuning capacitor (17–240 pF), stepper-motor-driven automatic capacitance search, and real-time residual inductance compensation—ensuring measurement integrity across diverse sample geometries and mounting configurations.
Key Features
- Wide-frequency DDS signal source (10 kHz–100 MHz) with 6-digit frequency resolution and ±3×10−5 absolute accuracy, enabling dispersion analysis across multiple dielectric relaxation regimes.
- High-stability 12-bit analog-to-digital sampling system, minimizing quantization noise and ensuring Q-factor reproducibility—critical for low-loss materials (tan δ < 10−4).
- Automated resonance tracking with stepper-motor-controlled variable capacitor (0.1 pF resolution), eliminating manual tuning drift and reducing operator-induced variability.
- Comprehensive parameter display including resonant frequency (F), series inductance (L), tuning capacitance (C), Q-factor, loaded/unloaded inductance (Lt), compensated capacitance (Ct), calculated εr, temperature-normalized value (Tn), and real-time residual/lead inductance correction terms.
- User-definable Q pass/fail threshold (5–1000) with audible and visual alert feedback—supporting rapid QC screening in production environments.
- Embedded calibration routines for open/short/load compensation, traceable to NIST-traceable reference standards for impedance and capacitance.
Sample Compatibility & Compliance
The DZ5001 supports planar, cylindrical, and irregular solid samples (e.g., polymer films, ceramic substrates, ferrite cores) as well as low-conductivity liquids (e.g., transformer oils, silicone gels). Sample holders are designed to minimize fringing field distortion and ensure repeatable electrode contact per ASTM D2520. The instrument meets electromagnetic compatibility requirements per EN 61326-1 (industrial environment) and conforms to safety standards IEC 61010-1. While not FDA-certified, its data logging architecture—including timestamped parameter records, user ID tagging, and non-volatile memory retention—supports GLP/GMP-aligned documentation practices. Full audit trail functionality (user actions, calibration events, measurement history) can be exported in CSV format for internal QA review or regulatory submission preparation.
Software & Data Management
The DZ5001 operates autonomously via its integrated LCD interface but also supports optional PC-based control through RS-232 or USB virtual COM port. A dedicated Windows application enables batch measurement scripting, multi-frequency sweep sequencing, εr vs. frequency plotting, and statistical reporting (mean, SD, Cp/Cpk). All raw and processed data are stored with embedded metadata (operator ID, date/time, environmental temperature, calibration status). Export formats include CSV and XML, compatible with LIMS integration and third-party analysis tools such as MATLAB or Python-based SciPy workflows. No proprietary binary formats are used—ensuring long-term data accessibility and interoperability.
Applications
- Quality assurance of high-frequency PCB laminates (e.g., Rogers RO4000®, Taconic RF-35) where εr stability over 1–10 GHz bandwidth dictates signal integrity.
- R&D characterization of ferroelectric thin films and relaxor ceramics for tunable microwave components.
- Moisture content estimation in hygroscopic polymers via dielectric dispersion shift at sub-MHz frequencies.
- Batch consistency verification of encapsulation resins and potting compounds in power electronics manufacturing.
- Educational use in materials science laboratories for teaching fundamental relationships between polarization mechanisms, relaxation time, and complex permittivity spectra.
FAQ
What sample preparation is required for accurate εr measurement?
Standardized disk-shaped specimens (diameter ≥3× thickness) are recommended; surface flatness ≤1 µm Ra and parallelism ≤0.02 mm ensure minimal air-gap error. Liquid samples require temperature-controlled cells with guarded electrodes.
Does the DZ5001 support temperature-dependent measurements?
The base unit does not integrate environmental chambers, but its Tn (temperature-normalized) output parameter allows post-acquisition correction when external temperature readings are logged alongside measurements.
How is calibration traceability maintained?
Factory calibration uses certified NIST-traceable LCR standards (100 Hz–1 MHz); users perform daily open/short/load compensation before measurement sessions.
Can the instrument measure conductivity or resistivity?
No—it is optimized for low-loss dielectrics; DC or low-frequency conductivity requires separate four-point probe or impedance spectroscopy systems.
Is firmware upgrade supported?
Yes—field-upgradable via USB stick; version history and release notes are published on the manufacturer’s technical support portal.
