X-Rite Ci64UV Portable Spectrophotometer
| Brand | X-Rite |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ci64UV |
| Pricing | Upon Request |
| Aperture Options | 4 mm measurement / 6.5 mm target window OR 8 mm measurement / 14 mm target window |
| Light Source | Tungsten Halogen Lamp + Adjustable UV LED |
| Inter-instrument Agreement (8 mm/14 mm, SCI) | Avg. 0.13 ΔE*ab (BCRA Series II, 12 tiles), Max 0.25 ΔE*ab (any planar surface) |
| Inter-instrument Agreement (4 mm/6.5 mm, SCI) | Avg. 0.20 ΔE*ab (BCRA Series II, 12 tiles), Max 0.40 ΔE*ab (any planar surface) |
| Short-term Repeatability | 0.04 ΔE*ab (on white tile) |
| Data Interfaces | USB 2.0, Bluetooth v4.2 |
| Standard Accessories | Black trap, white & green calibration tiles, UV calibration standard, user manual, AC adapter, NetProfiler software, sample holder, bench stand, spare battery, dual-bay charger |
| Operating Modes | QA, Comparison, Opacity, Strength, Project & Job |
Overview
The X-Rite Ci64UV Portable Spectrophotometer is a high-precision, field-deployable spectrophotometric instrument engineered for spectral color measurement under both visible and controlled ultraviolet illumination. It operates on the principle of diffuse d/8° geometry with specular component included (SCI), compliant with ISO 7724-1, CIE No. 15, and ASTM E308 standards. Its dual-light-source architecture—comprising a stabilized tungsten halogen lamp for visible spectrum stability and an independently adjustable UV LED—enables accurate assessment of optical brightening agents (OBAs), fluorescent pigments, and UV-reactive substrates across diverse industrial surfaces. Designed for metrological integrity in non-laboratory environments, the Ci64UV delivers traceable, repeatable spectral data (360–740 nm, 10 nm resolution) essential for closed-loop color control in manufacturing settings where lighting conditions, operator variability, and substrate heterogeneity challenge conventional color verification methods.
Key Features
- Switchable aperture configurations: 4 mm measurement spot with 6.5 mm targeting window for fine-detail or textured surfaces; 8 mm measurement spot with 14 mm targeting window for improved averaging on non-uniform or coarse materials.
- UV-adjustable illumination system calibrated to NIST-traceable UV intensity standards, supporting quantitative OBA evaluation per ISO 105-J03 and AATCC Test Method 183.
- Inter-instrument agreement validated against BCRA Series II ceramic tile set (12 tiles), meeting stringent tolerances: ≤0.13 ΔE*ab average (8 mm/14 mm, SCI) and ≤0.20 ΔE*ab average (4 mm/6.5 mm, SCI), ensuring measurement consistency across multi-site production networks.
- Robust mechanical design certified to IP54 ingress protection rating, enabling reliable operation in factory-floor environments with ambient dust, humidity, and temperature fluctuations (10–40 °C).
- Integrated Bluetooth 4.2 and USB 2.0 connectivity support secure, low-latency data transfer to enterprise quality management systems (QMS) and cloud-based color databases without requiring intermediary hardware.
Sample Compatibility & Compliance
The Ci64UV accommodates a broad range of non-destructive sample types—including painted metal panels, injection-molded thermoplastics, woven and knitted textiles, coated paper, and automotive interior trim—without requiring sample preparation or contact pressure calibration. Its d/8° sphere geometry with integrated UV compensation satisfies regulatory requirements for color measurement in industries governed by ISO 9001, IATF 16949, and ISO 17025-accredited laboratories. Instrument validation workflows align with FDA 21 CFR Part 11 electronic record and signature requirements when used with X-Rite’s NetProfiler software, supporting audit-ready calibration logs, user access controls, and change history tracking for GLP/GMP-compliant operations.
Software & Data Management
NetProfiler software (included) provides full spectral data acquisition, instrument profiling, and inter-device matching—critical for maintaining color consistency across global manufacturing footprints. It supports automated pass/fail reporting against user-defined tolerances (ΔE*ab, ΔL*a*b*, CMC, DE2000), generates ASME Y14.5-compliant color deviation reports, and exports structured CSV, XML, and industry-standard .qtx files for integration into SAP QM, Oracle Quality, or custom MES platforms. All measurement sessions are timestamped, geotagged (via paired mobile device), and stored with full metadata—including aperture selection, UV intensity setting, operator ID, and environmental sensor readings (optional external hygrothermograph).
Applications
- Automotive: In-line paint booth verification, interior trim batch release, and cross-shift gloss/color drift monitoring.
- Plastics & Polymers: Validation of masterbatch dispersion, recycled resin color consistency, and thermal degradation effects during extrusion.
- Textiles & Apparel: Shade matching across dye lots, OBA quantification in bleached cotton, and fluorescence-corrected color approval for retail packaging.
- Printing & Packaging: Spot color verification on flexographic and offset substrates, including metallized films and UV-curable inks.
- Consumer Electronics: Anodized aluminum housing color certification, display bezel finish matching, and tactile button coating uniformity assessment.
FAQ
Does the Ci64UV comply with ISO 17025 requirements for accredited testing laboratories?
Yes—when operated with documented calibration procedures, traceable standards (NIST SRM 2021, BCRA tiles), and NetProfiler’s audit trail functionality, the Ci64UV supports compliance with ISO/IEC 17025:2017 clause 6.4 (Equipment) and clause 7.7 (Ensuring validity of results).
Can the Ci64UV measure opacity or translucency of thin films?
It does not provide direct opacity calculation (e.g., contrast ratio), but its dual-aperture design and SCI mode enable robust relative opacity comparison via backside reflectance differential analysis when used with standardized black/white backing substrates.
Is UV calibration required before each measurement session?
No—UV output is factory-stabilized and verified during annual recalibration; however, daily verification using the included UV calibration standard is recommended for critical OBA-sensitive applications per ISO 13655.
What spectral data formats does the Ci64UV export for third-party analysis?
Reflectance spectra (360–740 nm at 10 nm intervals), CIE XYZ, CIELAB, CIELCH, and custom color difference metrics are exportable as ASCII text, CSV, or XML, compatible with MATLAB, Python (NumPy/Pandas), and commercial color science toolkits such as ColorThink Pro and ChromaChecker.
How is instrument-to-instrument agreement maintained across a fleet of Ci64UV units?
X-Rite’s NetProfiler enables centralized characterization of inter-unit variance; users can apply matrix-based correction profiles to harmonize measurements across devices, with documented uncertainty budgets traceable to NIST reference materials and ISO 13655:2017 Annex B guidance.
